CN110988774A - Calibration method and system of electromagnetic pulse electric field probe - Google Patents
Calibration method and system of electromagnetic pulse electric field probeDownload PDFInfo
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- CN110988774A CN110988774ACN201911334395.8ACN201911334395ACN110988774ACN 110988774 ACN110988774 ACN 110988774ACN 201911334395 ACN201911334395 ACN 201911334395ACN 110988774 ACN110988774 ACN 110988774A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
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Abstract
Description
Technical Field
The invention relates to the field of instrument calibration, in particular to a method and a system for calibrating an electromagnetic pulse electric field probe.
Background
The electromagnetic pulse electric field probe is used for measuring the electromagnetic pulse field intensity and is mainly used in a transient electromagnetic field radiation sensitivity test. The electromagnetic pulse electric field probe is a basic device for measuring the electromagnetic pulse electric field, and forms an electromagnetic pulse electric field measuring system together with a receiving device, wherein the accuracy of the probe coefficient is the basis of the accuracy of the measuring result of the electromagnetic pulse electric field, and the accurate calibration of the probe coefficient is particularly important.
In the aspect of probe calibration, field intensity standards are established by some organizations at home and abroad in sequence and are used for antenna or field probe calibration. In the nineties of the last century, research and establishment of high-frequency electric field standards were carried out, and subsequently, field strength standards of field strength generating apparatuses using TEM cells as cores were established. In recent years, a microwave field intensity standard is established by taking a darkroom and a microwave antenna as core field intensity generating devices, the frequency range is from 10kHz to 40GHz, and the field intensity range is from 1V/m to 200V/m. However, these standards are all field strength standard systems for continuous waves and are not applicable to electromagnetic pulse field strengths. The electromagnetic pulse sensor is used for realizing time domain full waveform measurement of a high-intensity electromagnetic pulse signal, and a calibration method of a frequency domain in the prior art cannot accurately reflect the metering characteristics of a probe when the time domain waveform is measured.
In view of the above, the present invention provides a calibration method and system for an electromagnetic pulse electric field probe to alleviate the problems of the prior art.
Disclosure of Invention
In a first aspect, the present invention provides a calibration method for an electromagnetic pulse electric field probe, including: the high-voltage pulse source is connected with the TEM cell, the TEM cell is connected with the oscilloscope 1 through the attenuator, the electric field probe is connected with the oscilloscope 2 through the integrator, and the oscilloscope 1 and the oscilloscope 2 are connected with the computer; setting output parameters of the high-voltage pulse source so that the high-voltage pulse source outputs double-exponential pulses; placing the electric field probe near a polar plate of the TEM cell, and setting the polarization direction of the electric field probe to be consistent with the electric field direction; setting a high-voltage pulse source to generate a single pulse, acquiring a pulse waveform 1 by an oscilloscope 1, acquiring a pulse waveform 2 by an oscilloscope 2, and sending test data of the pulse waveform 1 and the pulse waveform 2 to a computer; reconstructing an electric field time domain waveform according to the test data of the pulse waveform 1, the attenuation coefficient of the attenuator and the height of the TEM cell; and calculating the conversion coefficient of the electric field probe according to the test data of the electric field time domain waveform and the pulse waveform 2, wherein the conversion coefficient is the ratio of the maximum value of the electric field intensity to the maximum value of the output signal of the electric field probe.
In a second aspect, the present invention further provides a calibration system for an electromagnetic pulse electric field probe, comprising: the high-voltage pulse source is connected with the TEM cell, the TEM cell is connected with the oscilloscope 1 through the attenuator, the electric field probe is connected with the oscilloscope 2 through the integrator, and the oscilloscope 1 and the oscilloscope 2 are connected with the computer; the high-voltage pulse source outputs double-exponential type pulses according to the set output parameters; the TEM cell is a deformed coaxial line; the electric field probe is arranged near a polar plate of the TEM cell, and the polarization direction of the electric field probe is consistent with the electric field direction; when a high-voltage pulse source generates a single pulse, the oscilloscope 1 acquires a pulse waveform 1 output by the TEM cell, the oscilloscope 2 acquires a pulse waveform 2 after the electric field probe passes through the integrator, and test data of the pulse waveform 1 and the pulse waveform 2 are sent to the computer; the computer reconstructs an electric field time domain waveform according to the test data of the pulse waveform 1, the attenuation coefficient of the attenuator and the height of the TEM cell; and calculating the conversion coefficient of the electric field probe according to the test data of the electric field time domain waveform and the pulse waveform 2, wherein the conversion coefficient is the ratio of the maximum value of the electric field intensity to the maximum value of the output signal of the electric field probe.
The invention has the following beneficial effects:
the technical scheme provided by the invention can have the following beneficial effects: the technical scheme provided by the invention establishes a time domain calibration method by using pulse signals as standard signals aiming at the characteristics of wide frequency band, low sensitivity and the like of the electromagnetic pulse electric field probe, and can obtain the conversion coefficient of the electric field probe under time domain measurement, thereby ensuring the accuracy of high-strength electromagnetic pulse field intensity measurement. In addition, the calibration system provided by the invention comprises a high-voltage pulse source, a TEM cell, an oscilloscope, an attenuator and other test equipment, wherein a clearly known electromagnetic pulse field is generated by the high-voltage pulse source and the TEM cell and is used as a standard field for calibrating the electromagnetic pulse electric field probe. The field intensity can be calculated according to the output voltage on the output line of the high-voltage pulse source and the size of the TEM cell. The conversion coefficient of the electromagnetic pulse electric field probe can be obtained by calculating the ratio of the field intensity to the actual measurement value of the electric field probe.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are one embodiment of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a schematic flow chart of a calibration method for an electromagnetic pulse electric field probe according to a first embodiment of the present invention;
FIG. 2 is a schematic diagram of a dual-exponential pulse calibration method for an electromagnetic pulse electric field probe according to a first embodiment of the present invention;
fig. 3 is a schematic structural diagram of a calibration system of an electromagnetic pulse electric field probe according to a second embodiment of the present invention.
Detailed Description
To make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and the described embodiments are some, but not all embodiments of the present invention.
The first embodiment is as follows:
fig. 1 is a schematic flowchart of a calibration method of an electromagnetic pulse electric field probe according to a first embodiment of the present invention, and as shown in fig. 1, the method includes the following six steps.
Step S101: and connecting the quasi-test equipment. Specifically, a high-voltage pulse source is connected with a TEM cell, the TEM cell is connected with an oscilloscope 1 through an attenuator, an electric field probe is connected with an oscilloscope 2 through an integrator, and the oscilloscope 1 and the oscilloscope 2 are connected with a computer.
It should be noted that the high voltage pulse source uses a Marx generator to generate a high voltage pulse signal, a pulsed electromagnetic field is generated in a TEM cell, and a field strength measurement standard is established using the TEM cell. The TEM cell is a deformed coaxial line that internally creates a transverse electromagnetic field resembling a plane wave when electromagnetic energy is fed into the TEM cell. In the TEM cell, the electric field intensity at the central position between the core plate and the upper and lower top plates can be obtained by a formula, and the oscilloscope is used for measuring pulse voltage. Cable attenuation at the input of the TEM cell is not considered because the voltage measurement is performed at the output.
Step S102: and setting output parameters of the high-voltage pulse source. Specifically, the output parameters of the high voltage pulse source are set so that the high voltage pulse source outputs a double exponential type pulse.
The output pulse waveform of the high-voltage pulse source is a double-exponential pulse required in the RS105 item in the GJB 151B-2013. As shown in FIG. 2, the rise time (10% -90%) of the time domain parameter of the waveform is 2.47ns, the pulse width (50% -50%) is 22.9789ns, the peak field strength is 50kV/m, and the maximum peak time is 4.8358 ns. By performing spectrum analysis on the pulse waveform, it can be obtained that the frequency spectrum of the pulse waveform is mainly distributed in the frequency band range of 200 MHz.
Step S103: the position of the electric field probe is set. Specifically, the electric field probe is placed near the polar plate of the TEM cell, and the polarization direction of the electric field probe is set to be consistent with the electric field direction.
It should be noted that, when the electric field probe is calibrated, the electric field probe should be placed in the middle of the TEM cell to match the field polarization mode, and if the electric field probe is a ground probe, it should be well electrically connected to the ground. In the operating frequency range, the radiation loss of the TEM cell is negligible and is considered equal to the voltage at the output.
Step S104: pulse waveform 1 and pulse waveform 2 are generated. Specifically, a high-voltage pulse source is arranged to generate a single pulse, an oscilloscope 1 acquires a pulse waveform 1, an oscilloscope 2 acquires a pulse waveform 2, and test data of the pulse waveform 1 and the pulse waveform 2 are sent to a computer.
Step S105: and reconstructing an electric field time domain waveform. Specifically, the electric field time domain waveform is reconstructed according to the test data of the pulse waveform 1, the attenuation coefficient of the attenuator and the height of the TEM cell.
Step S106: and calculating the conversion coefficient of the electric field probe. Specifically, the conversion coefficient of the electric field probe is calculated according to the test data of the electric field time domain waveform and the pulse waveform 2, and the conversion coefficient is the ratio of the maximum value of the electric field intensity to the maximum value of the output signal of the electric field probe.
It should be noted that a well-known electromagnetic pulse field is generated by the high voltage pulse source and the TEM cell as a standard field for the calibration of the electromagnetic pulse electric field probe. The field intensity can be calculated according to the output voltage on the output line of the high-voltage pulse source and the size of the TEM cell. The conversion coefficient of the electromagnetic pulse electric field probe can be obtained by calculating the ratio of the field intensity to the actual measurement value of the electric field probe. The conversion coefficient K of the calibration probe is calculated by the formula
U1(t) is the output voltage on the output line of the high voltage pulse source, D is the size of the TEM cell, U2Is the actual measurement value of the electric field probe.
Example two:
the embodiment of the present invention provides a calibration system for an electromagnetic pulse electric field probe, which is mainly used for executing the calibration method for an electromagnetic pulse electric field probe provided in the above-mentioned content of the embodiment of the present invention, and the following describes the calibration system for an electromagnetic pulse electric field probe provided in the embodiment of the present invention in detail.
Fig. 3 is a schematic structural diagram of a calibration system of an electromagnetic pulse electric field probe according to a second embodiment of the present invention. As shown in fig. 3, a calibration system for an electromagnetic pulse electric field probe comprises a high-voltage pulse source, a TEM cell, an attenuator, an oscilloscope 1, an electric field probe, an integrator, an oscilloscope 2 and a computer, wherein the high-voltage pulse source is connected with the TEM cell, the TEM cell is connected with the oscilloscope 1 through the attenuator, the electric field probe is connected with the oscilloscope 2 through the integrator, and the oscilloscope 1 and the oscilloscope 2 are connected with the computer.
And the high-voltage pulse source outputs double-exponential type pulses according to the set output parameters.
The TEM cell is a deformed coaxial line; the electric field probe is arranged near the polar plate of the TEM cell, and the polarization direction of the electric field probe is consistent with the electric field direction.
When a high-voltage pulse source generates a single pulse, the oscilloscope 1 acquires a pulse waveform 1 output by the TEM cell, the oscilloscope 2 acquires a pulse waveform 2 after the electric field probe passes through the integrator, and test data of the pulse waveform 1 and the pulse waveform 2 are sent to the computer.
The computer reconstructs an electric field time domain waveform according to the test data of the pulse waveform 1, the attenuation coefficient of the attenuator and the height of the TEM cell; and calculating the conversion coefficient of the electric field probe according to the test data of the electric field time domain waveform and the pulse waveform 2, wherein the conversion coefficient is the ratio of the maximum value of the electric field intensity to the maximum value of the output signal of the electric field probe.
Finally, it should be noted that: the above-mentioned embodiments are only specific embodiments of the present invention, which are used for illustrating the technical solutions of the present invention and not for limiting the same, and the protection scope of the present invention is not limited thereto, although the present invention is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the embodiments of the present invention, and they should be construed as being included therein. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (2)
1. A calibration method of an electromagnetic pulse electric field probe is characterized by comprising the following steps:
the high-voltage pulse source is connected with the TEM cell, the TEM cell is connected with the oscilloscope 1 through the attenuator, the electric field probe is connected with the oscilloscope 2 through the integrator, and the oscilloscope 1 and the oscilloscope 2 are connected with the computer;
setting output parameters of the high-voltage pulse source so that the high-voltage pulse source outputs double-exponential pulses;
placing the electric field probe near a polar plate of the TEM cell, and setting the polarization direction of the electric field probe to be consistent with the electric field direction;
setting the high-voltage pulse source to generate a single pulse, acquiring a pulse waveform 1 by the oscilloscope 1, acquiring a pulse waveform 2 by the oscilloscope 2, and sending test data of the pulse waveform 1 and the pulse waveform 2 to a computer;
reconstructing an electric field time domain waveform according to the test data of the pulse waveform 1, the attenuation coefficient of the attenuator and the height of the TEM cell;
and calculating a conversion coefficient of the electric field probe according to the test data of the electric field time domain waveform and the pulse waveform 2, wherein the conversion coefficient is the ratio of the maximum value of the electric field intensity to the maximum value of the output signal of the electric field probe.
2. A system for calibrating an electromagnetic pulse electric field probe, comprising:
the high-voltage pulse source is connected with the TEM cell, the TEM cell is connected with the oscilloscope 1 through the attenuator, the electric field probe is connected with the oscilloscope 2 through the integrator, and the oscilloscope 1 and the oscilloscope 2 are connected with the computer;
the high-voltage pulse source outputs double-exponential pulses according to the set output parameters;
the TEM cell is a deformed coaxial line; the electric field probe is placed near a polar plate of the TEM cell, and the polarization direction of the electric field probe is consistent with the electric field direction;
when the high-voltage pulse source generates a single pulse, the oscilloscope 1 acquires a pulse waveform 1 output by the TEM cell, the oscilloscope 2 acquires a pulse waveform 2 obtained by passing the electric field probe through the integrator, and test data of the pulse waveform 1 and the pulse waveform 2 are sent to the computer;
the computer reconstructs an electric field time domain waveform according to the test data of the pulse waveform 1, the attenuation coefficient of the attenuator and the height of the TEM cell; and calculating a conversion coefficient of the electric field probe according to the test data of the electric field time domain waveform and the pulse waveform 2, wherein the conversion coefficient is the ratio of the maximum value of the electric field intensity to the maximum value of the output signal of the electric field probe.
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111624542A (en)* | 2020-05-29 | 2020-09-04 | 南京理工大学 | Frequency response calibration method of pulsed magnetic field measurement system |
| CN112284431A (en)* | 2020-09-30 | 2021-01-29 | 北京航空航天大学 | Method for improving polarization efficiency of NV color center of diamond |
| CN112834843A (en)* | 2020-12-31 | 2021-05-25 | 江苏南高智能装备创新中心有限公司 | Radio frequency integrated circuit near field electromagnetic compatibility test management method and system |
| CN113203472A (en)* | 2021-05-13 | 2021-08-03 | 深圳市鼎阳科技股份有限公司 | Microphone probe sensitivity compensation method and system for oscilloscope |
| CN113900058A (en)* | 2021-09-14 | 2022-01-07 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Near-field probe calibration method, device, system, equipment and storage medium |
| CN114966512A (en)* | 2022-05-26 | 2022-08-30 | 西安交通大学 | Ultra-wideband electromagnetic pulse sensor calibration system and method based on standard TEM horn antenna |
| CN115792764A (en)* | 2022-11-30 | 2023-03-14 | 西北核技术研究所 | An Analytical Method for Measuring Electromagnetic Pulse System Error by Transmission Coefficient Method |
| CN116299110A (en)* | 2022-11-30 | 2023-06-23 | 西北核技术研究所 | A Time-Domain Calibration Method for Electromagnetic Pulse Measurement in Double Exponential Wave Form |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105093147A (en)* | 2014-05-20 | 2015-11-25 | 中国人民解放军63973部队 | Time-domain calibration method for electromagnetic pulse magnetic-field probe |
| CN105093148A (en)* | 2014-05-20 | 2015-11-25 | 中国人民解放军63973部队 | Time-domain calibration method for electromagnetic pulse magnetic-field probe |
| CN105388367A (en)* | 2015-10-16 | 2016-03-09 | 北京宇航系统工程研究所 | Method for characterizing and acquiring electromagnetic environment in narrow and small bay section |
| US20170067985A1 (en)* | 2013-03-14 | 2017-03-09 | Apparate International C.V. | Lidar scanner |
| CN108020802A (en)* | 2017-11-17 | 2018-05-11 | 北京无线电计量测试研究所 | A kind of electric field probe calibration method and device |
| CN108982978A (en)* | 2018-08-02 | 2018-12-11 | 卢小丽 | Impulse electric field detector and application method with sensitivity coefficient self calibration and power management function |
- 2019
- 2019-12-23CNCN201911334395.8Apatent/CN110988774A/enactivePending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20170067985A1 (en)* | 2013-03-14 | 2017-03-09 | Apparate International C.V. | Lidar scanner |
| CN105093147A (en)* | 2014-05-20 | 2015-11-25 | 中国人民解放军63973部队 | Time-domain calibration method for electromagnetic pulse magnetic-field probe |
| CN105093148A (en)* | 2014-05-20 | 2015-11-25 | 中国人民解放军63973部队 | Time-domain calibration method for electromagnetic pulse magnetic-field probe |
| CN105388367A (en)* | 2015-10-16 | 2016-03-09 | 北京宇航系统工程研究所 | Method for characterizing and acquiring electromagnetic environment in narrow and small bay section |
| CN108020802A (en)* | 2017-11-17 | 2018-05-11 | 北京无线电计量测试研究所 | A kind of electric field probe calibration method and device |
| CN108982978A (en)* | 2018-08-02 | 2018-12-11 | 卢小丽 | Impulse electric field detector and application method with sensitivity coefficient self calibration and power management function |
Non-Patent Citations (3)
| Title |
|---|
| 何洋: "《常规兵器电磁兼容性试验》", 31 December 2016, 国防工业出版社* |
| 刘阳 等: "电磁脉冲电场探头转换系数的校准", 《宇航计测技术》* |
| 李欣 等: "电磁脉冲电场探头校准装置及不确定度评定", 《核电子学与探测技术》* |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111624542A (en)* | 2020-05-29 | 2020-09-04 | 南京理工大学 | Frequency response calibration method of pulsed magnetic field measurement system |
| CN111624542B (en)* | 2020-05-29 | 2022-05-27 | 南京理工大学 | A Frequency Response Calibration Method of Pulse Magnetic Field Measurement System |
| CN112284431A (en)* | 2020-09-30 | 2021-01-29 | 北京航空航天大学 | Method for improving polarization efficiency of NV color center of diamond |
| CN112284431B (en)* | 2020-09-30 | 2022-01-07 | 北京航空航天大学 | A kind of method to improve the polarization efficiency of diamond NV color center |
| CN112834843A (en)* | 2020-12-31 | 2021-05-25 | 江苏南高智能装备创新中心有限公司 | Radio frequency integrated circuit near field electromagnetic compatibility test management method and system |
| CN112834843B (en)* | 2020-12-31 | 2023-12-19 | 江苏南高智能装备创新中心有限公司 | Near-field electromagnetic compatibility test management method and system for radio frequency integrated circuit |
| CN113203472A (en)* | 2021-05-13 | 2021-08-03 | 深圳市鼎阳科技股份有限公司 | Microphone probe sensitivity compensation method and system for oscilloscope |
| CN113900058A (en)* | 2021-09-14 | 2022-01-07 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Near-field probe calibration method, device, system, equipment and storage medium |
| CN114966512A (en)* | 2022-05-26 | 2022-08-30 | 西安交通大学 | Ultra-wideband electromagnetic pulse sensor calibration system and method based on standard TEM horn antenna |
| CN115792764A (en)* | 2022-11-30 | 2023-03-14 | 西北核技术研究所 | An Analytical Method for Measuring Electromagnetic Pulse System Error by Transmission Coefficient Method |
| CN116299110A (en)* | 2022-11-30 | 2023-06-23 | 西北核技术研究所 | A Time-Domain Calibration Method for Electromagnetic Pulse Measurement in Double Exponential Wave Form |
| CN116299110B (en)* | 2022-11-30 | 2025-08-15 | 西北核技术研究所 | Time domain calibration method for double-exponential waveform electromagnetic pulse measurement |
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