Movatterモバイル変換


[0]ホーム

URL:


CN109716303A - Time series fault detection, fault classification and transition analysis using K-nearest neighbor and logistic regression methods - Google Patents

Time series fault detection, fault classification and transition analysis using K-nearest neighbor and logistic regression methods
Download PDF

Info

Publication number
CN109716303A
CN109716303ACN201780057453.XACN201780057453ACN109716303ACN 109716303 ACN109716303 ACN 109716303ACN 201780057453 ACN201780057453 ACN 201780057453ACN 109716303 ACN109716303 ACN 109716303A
Authority
CN
China
Prior art keywords
data
time series
distance
randomized
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201780057453.XA
Other languages
Chinese (zh)
Other versions
CN109716303B (en
Inventor
德莫特·坎特维尔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials IncfiledCriticalApplied Materials Inc
Priority to CN202311355038.6ApriorityCriticalpatent/CN117540242A/en
Publication of CN109716303ApublicationCriticalpatent/CN109716303A/en
Application grantedgrantedCritical
Publication of CN109716303BpublicationCriticalpatent/CN109716303B/en
Activelegal-statusCriticalCurrent
Anticipated expirationlegal-statusCritical

Links

Classifications

Landscapes

Abstract

Methods and systems for time series temporal analysis of data are disclosed herein. One method comprises the steps of: receiving time series data; generating a training data set comprising randomized data points; generating a randomized combination of data points using the set of randomized data points over a time window; calculating a distance value based on the randomized data point combinations; generating a classifier based on the plurality of calculated distance values; and determining a probability that new time series data generated during a new execution of the process matches the time series data using the classifier. A system for performing the method is also disclosed.

Description

Use time series fault detection, the failure modes of K arest neighbors and logistic regression methodAnd Transformation Analysis
Technical field
More specifically present disclosure is about the time series event for analysis system about artificial neural networkBarrier detection, failure modes and Transformation Analysis.
Background technique
The technique of for example, semiconductor processes includes multiple steps in certain time section.Technique may include fromFirst step is converted to second step.Time series data is the collected data in this time interval, including the transformation (exampleAs time series changes).In general, statistical method (such as statistical Process Control (Statistical ProcessControl, SPC)) it is used to the sensing data that analysis is used for semiconductor fabrication process.However, its of SPC and monitoring processingHis statistical method can not monitoring period sequence transformation.Statistical method can not detect migrate over time it is received from sensorThe signal disturbance of short time in data.Statistical method also provide wrong report (such as entire signal and mismatch echo signal, becauseBe located at except guard band (guard band) for the least part of signal) and do not allow for adjustment abnormality detection susceptibility.
Detailed description of the invention
Present disclosure is illustrated in a manner of exemplary in the figure in annexed drawings, and not in a restricted wayTo illustrate.
Fig. 1 is painted an embodiment of the network architecture.
Fig. 2 is painted an embodiment of the method for time series Transformation Analysis.
Fig. 3 is painted another embodiment of the method for time series Transformation Analysis.
Fig. 4 is painted the time series data for time series Transformation Analysis.
Fig. 5 A is painted the combination of randomization data point and time window for time series Transformation Analysis.
Fig. 5 B is painted the distance between the randomization data point for time series Transformation Analysis.
Fig. 6 is painted the distance away from the training set for time series Transformation Analysis.
Fig. 7 A-7B is painted the distance away from the training set for time series Transformation Analysis.
Fig. 8 is painted the logistic regression for time series Transformation Analysis.
Fig. 9 is painted the effect of the θ on the logistic regression for time series Transformation Analysis.
Figure 10 A-10B is painted the probability of the match time sequence data for time series Transformation Analysis.
Figure 11 A-11D is painted the probability of the match time sequence data for time series Transformation Analysis.
Figure 12 A is painted the time series data for time series Transformation Analysis.
Figure 12 B is painted the distance away from the training set for time series Transformation Analysis.
Figure 12 C is painted the logistic regression for time series Transformation Analysis.
Figure 13 A-13D is painted the probability of the match time sequence data for time series Transformation Analysis.
Figure 14 is painted the time series data of multiple inputs for time series Transformation Analysis.
Figure 15 A-15D is painted the general of the match time sequence data for multiple inputs for time series Transformation AnalysisRate.
Figure 16 is painted exemplary computer system.
Specific embodiment
The embodiment of present disclosure is directed to the method and system of the time series Transformation Analysis for data.For example,Data sample can be the sensing data from semiconductor processing device.In one embodiment, this method and system can be examinedSurvey the probability that new time series data matches previous time series data.It can be by using the k arest neighbors in embodiment(k-Nearest Neighbor, kNN) analysis and logistic regression (logistic regression, LR) Lai Zhihang time seriesTransformation Analysis.The embodiment of present disclosure is extensible in terms of the susceptibility of adjustable time series Transformation Analysis's.
As technique (such as manufacturing process) includes the steps that shorter and shorter time, smaller and smaller component, increasingly tighterTolerance of lattice etc., transformation (such as how to be become more and more important in a manufacturing process from step A to step B).If technique turnsBecome overshoot (overshoot) or less stress (undershoot) and (such as too fast 20 degree is converted to from 10 degree, too slowly from 10 degree turnsChange to 20 degree etc.), then problem may occur.Repeatable performance includes consistent transformation.Traditional monitoring method (such asSPC instantaneous time sequence) can not be monitored and can not be detected and migrated over time from the received data of sensor (referred to herein asSensor time sequence data) in short time signal disturbance.These short exceptions may cause defect (such as on chip lackFall into) or reduction yield.
Time series Transformation Analysis provides the ability of monitoring period sequence transitions.Time series Transformation Analysis is detectable notCan be detected by conventional method rare, strange and/or not expected sequence (such as time series data (is directed toThe value that sample is drawn) the shape of curve, numerical value, position etc.;Referring to Fig. 4).In one embodiment, by from going throughHistory time series data estimates expected transitional locus and by the track of new time series data and historical time sequence dataTrack be compared, Lai Zhihang time series transformation monitoring.Time series Transformation Analysis also can detect short exception and mentionThe accuracy carried out sensitization for tuner parameters or sensitization is gone to detect.Time series Transformation Analysis can also overcome the mistake of conventional methodReport rate.For example, guard band analysis may provide wrong report, the wrong report is that entire signal is protected because the least part of signal is located atProtect frequency band except without being matched with echo signal, and time series Transformation Analysis provide Signal Matching echo signal probability andWrong report is not provided.In another embodiment, time series Transformation Analysis can be used to detect short time signal disturbance and (such as captureDisturbance mark (such as search for similarity)) to search all examples of FDC.
The fault detection classification (fault detection classification, FDC) of time series data can monitorData from single-sensor, the data may make classification inaccurate.Can by monitor at any time one change it is moreA signal come extract more information (such as before pressure spike valve location variation may indicate that asking on pressure control logicThe problem of topic, the pressure spike before valve location variation may indicate that pressure sensor etc.).Technology disclosed hereinHandle a coupled signal to change at any time.
Time series Transformation Analysis can be by k arest neighbors (kNN) method (such as kNN algorithm) and logistic regression (LR) binary pointClass device combines the monitoring to realize time series.The combination of kNN and LR can be used specific inclined on detection time sequence dataFrom (excursion).Time series Transformation Analysis can be used kNN by every time window (such as 1 on 100 seconds time intervalsSecond time slip-window) short period sequence transitions be simplified to single dimension to determine the distance away from anticipatory behavior.Time sequenceLR can be used to establish binary classifier in column Transformation Analysis, and the binary classifier, which is used to generate new time series data, to be hadOr without target pattern (pattern) probability (such as new time series data whether by kNN method determined away fromFrom except).
Time series Transformation Analysis can be used to based on turn between the set point change in time series data characterization processesBecome, and detects the deviation relative to expected transitional locus in new time series data.Expected transitional locus can by whenBetween sequence data defined.
Fig. 1 is painted the network architecture 100 according to an embodiment.Originally, time series Transformation Analysis system 102 identifiesData source 106A-N (such as sensor), data source 106A-N define system and/or are used to monitoring system (such as entity handles systemSystem is 104).Entity handles system 104 can be semiconductor processing device, such as chamber, deposition chambers for etch reactor etc.Deng.User can via client machine 110 from the various data sources in data source 106A-N (such as via graphical user interface(GUI)) time series data (such as sample) is selected.Time series Transformation Analysis system 102 generates training dataset and is based onTraining dataset and time series data calculate distance value.
In one embodiment, user can also select deviation 108 (that is, anomalous system behavior via client machine 110Defined parameter), and deviate and 108 can be stored in permanent storage unit 112 by time series Transformation Analysis system 102.
For example, entity handles system 104 may include manufacture tool or by directly or via network (such as local area network(LAN)) it is connected to manufacture tool.The example of manufacture tool includes the semiconductor manufacturing tool for manufacturing electronic equipment, such asEtcher, chemical vapor deposition stove etc..The step of manufacturing such equipment may include being related to the number of different types of manufacturing processTen manufacturing steps, these steps can be described as being formulated.
Entity handles system 104 may include any kind of calculating equipment (including desktop computer, laptop computer,Programmable logic controller (PLC) (PLC), handheld computer or similar calculating equipment) carry out control system.Data source 106 (such asSensor) can for entity handles system 104 and/or manufacture tool a part, or may be connected to entity handles system 104 and/Or manufacture tool (such as via network).
Client machine 110 can be any kind of calculating equipment, including desktop computer, laptop computer, movementCommunication equipment, mobile phone, smart phone, handheld computer or similar calculating equipment.
In one embodiment, entity handles system 104, data source 106, permanent storage unit 112 and client machinesDevice 110 is connected to time series Transformation Analysis system 102, can be and is directly connected to or via hardware interface (not shown) or warpIt is indirectly connected with by what network (not shown) carried out.Network can be local area network (LAN) (such as internal network in company), wirelessNetwork, mobile communications network or wide area network (WAN) (such as internet or similar communication system).Network may include any quantityNetworking and calculate equipment, such as wired and wireless device.
Function division presented above is only through exemplary mode to carry out.In other embodiments, describedFunction is combined into monolithic element or is subdivided into any component combination.For example, client machine 110 and time sequence transitionsAnalysis system 102 can be hosted in single computer system, in individual computer system or combinations thereof on.
Fig. 2 is painted an embodiment of the method 200 for time series Transformation Analysis.It can be held by processing logicRow method 200, the processing logic may include hardware (such as circuit, special logic, programmable logic, microcode etc.), softPart (such as run instruction) on a processing device or combinations thereof.In one embodiment, method 200 is the time by Fig. 1Sequence transitions analysis system 102 is performed.
At the square 202 of Fig. 2, the processing logic receiving time sequence data 402 of time series Transformation Analysis system 102(such as echo signal), as shown in Figure 4.One or more sensors can generate the time during technique (such as manufacturing process)Sequence data 402.Time series data 402 may include a data point more than first.A data point may include time series more than firstData point at the sample of data 402.For example, as shown in Figure 4, can at n=25 and n+1=50 intercepted samples.Time sequenceThe value of column data 402 may include the t (n) and t (n+1) about at [0,4].
Fig. 2 is returned to, at square 204, it includes randomization number that the processing logic of time series Transformation Analysis system 102, which generates,The training dataset at strong point 502 (such as random sample), as shown in Figure 5 A.Randomization data point 502 may include for oppositeIn one or more desired extent distributions deviateed of time series data 402.The distribution can be normal distribution or another pointCloth.In one embodiment, 100 random samples are generated, wherein each random sample is indicated relative to time series numberAccording to deviation.As shown in the example in Fig. 5 A, randomization data point 502 includes each (such as n and n+1) in data pointThe deviation at place.For example, data point is had accumulated around [0,4] at n=25 and n=50.When randomization data point 502 can be used asBetween sequence data 402 pattern training set.When each randomization data point in randomization data point 502 can correspond to come fromBetween sequence data 402 one of more than first a data points.
Fig. 2 is returned to, at square 206, the processing logic use of time series Transformation Analysis system 102 is in time window 506The interior set of randomization data point 502 combines to generate randomization data point, as shown in Figure 5 A.For example, randomization data pointCombination may include one of randomization data point 502a in the example of the time window 506 of from 0 to n (such as 25) and from n to nOne of randomization data point 502b in the example of the time window 506 of+1 (such as 25 to 50).In one embodiment,Randomization data point can be generated in the end of time window 506 by handling logic (referring for example to Fig. 5 A).In another embodiment,Randomization data point can be generated in the midpoint of time window 506 by handling logic.In another embodiment, processing logic can whenBetween window 506 beginning generate randomization data point.
Time window 506 can be time slip-window, and technique can occur in the certain time section for being greater than time slip-window.Time slip-window can be for from currently in time toward the period stretched in the past.For example, two seconds sliding windows may include having occurredAny sample or data point in past two seconds.In an embodiment of time slip-window, the first example can be 0-25, theTwo examples can be 25-50 etc..Therefore, window was slided with 25 seconds.In another embodiment of time slip-window, firstExample can also be 0-25, and the second example can be 1-26, then 2-27 etc..Therefore, time window was with 1 second (or other times unit)It is slided.
The generation of randomization data point combination can be executed for each in multiple examples of time slip-window 506.It is describedEach example in multiple examples may span across the different periods in time interval (for example, the combination of randomization data point includes from nFirst data point at place and the sample of the second data point at n+1).
Fig. 2 is returned to, at square 208, the processing logic of time series Transformation Analysis system 102 is based on randomization data pointCombination is to calculate distance value.First distance value can be calculated for the combination of the first randomization data point.First distance value can indicate moreFirst subset of the set of a randomization data point is away from the combined distance of the first subset of more than first a data points.It can be for slidingEach in multiple examples of time window executes the calculating of distance value.
As shown in Figure 5 B, randomization data point can be combined to provide randomization data point combination 507, randomization dataPoint combination 507 respectively includes the first randomization data point from t (n) and the second randomization data point from t (n+1).ThisA little randomization data point combinations 507 can be used to calculate distance value using k nearest neighbor algorithm.
K arest neighbors (kNN) algorithm can be used to be directed to each example calculation distance threshold of time window 506 in processing logic.For example, first distance threshold value can be generated for the time window 506 at time t=25 (for example, using the data at time 0-25Point), second distance threshold value (for example, using the data point at time 1-26) can be generated for the time window 506 at time t=26Etc..The calculating of distance threshold may include calculating the randomization data for each in multiple randomization data points combination 507Point combines the Euclidean distance between 507 and each remaining randomization data point combination 507 from training dataset (referring to figure5B).The calculating of distance threshold may include identifying the smallest Euclidean distance from the Euclidean distance being computed.The smallest Euclidean distance canFor distance threshold.
Using the algorithm of kNN type, training dataset can be used to estimate bias sample and training data itBetween distance.For each training sample for including the combination of randomization data point, can calculate all in this sample and training setEuclidean distance between other samples, and k-th of minimum value can be stored.It is by equation d for sample jj=smallk(xj-X distance) is calculated, wherein X is the matrix of n × m.The quantity (such as 100 random samples) of value n expression training sample.The value of mThe quantity of time samples or data point can be indicated (for example, at two of n=25 and n+1=50 depicted in the example of Fig. 4-6Between sample).Variable xjFor m element vector (such as [0,4]) and it can indicate j-th in X column.For all in training setSample repeats this processing and generates the neighborhood or limit vector L with n element.Neighborhood or limit vector L can be used to generate goodThe training set separated well trains simple classifier.The random sample of self-training collection can be elected to calculate for each sampleknn=smallk(xj-X).The random sample for being not from training set can be selected and in order to which visual purpose calculates knnValue.
As shown in Figure 6, random sample (sample class 602a) is had selected from deviation pattern, and has estimated knnMeasurement.ChoosingGo out the random sample (sample class 602b) for showing non-deviation behavior, and has estimated knnMeasurement.Sample class 602a is shownAway from training set compared with the smaller distance of sample class 602b.In Fig. 6,2D signal by simplifying for seem can linear separation oneDimension amount.
It has been directed to the above-mentioned processing of the pattern representation including two data points.However, this identical processing can be expandedTo various dimensions simplifying multidimensional input for single measurement (such as k-th of distance between sample and training data).It is being directed toWhen all probable values examine Fig. 6, a minimum value is at the about from deviating from the position of [0,4].Fig. 7 A-7B is painted multiple input patternsKNN measurement and the minimum value being presented at about [0,4] is shown.
Fig. 2 is returned to, at square 210, the processing logic of time series Transformation Analysis system 102 is based on the distance being computedIt is worth next life constituent class device.Handling logic can be by based on multiple range estimation distance threshold next life constituent class device being computed.It canThe generation of classifier is executed for each in multiple examples of time slip-window 506.Logistic regression next life constituent class can be usedDevice.
802 (logistic fits (logit fit) can be returned from training data decision logic by handling logic;As shown in Figure 8)(for example, generating the logistic fit 802 for being directed to training data, the probability of Signal Matching deviation will be generated).Training data can wrapInclude primordial time series data and the combination of randomization data point and their distance value being computed.Equation p (y | X)=1/ (1+e-β*X) it can be used to decision logic recurrence 802.Training data is used to estimate β.As shown in Figure 8, logistic regression 802 may include fromOne position of the transformation pattern of the first data point (sample class 602a) to the second data point (sample class 602b).Transformation figureCase can reflect near the reflection point 804 being centrally positioned on transformation pattern.Time series data 402 can be detected as having and closeThe jump function (such as scalariform deposition of short step) of key transformation.Time series Transformation Analysis can be used to overcome via boundaryIt is reported by mistake caused by method.
Time series transient analysis can utilize tuner parameters.The controllable sample pair beyond specification of time series Transformation AnalysisHow many contributed apart from.The contribution for increasing the sample beyond specification will be so that system be more sensitive.Increase reflection point 804 and makes systemIt is less sensitive.The slope of adjustment logistic regression 802 changes the probability of the sample close to reflection 804.Logistic regression 802 can haveIt reflects the limit (for example, vertical line), and can be considered as mismatching expected behavior more than any sample of the reflection limit.At oneIn embodiment, compared to shallower or less shallow transformation pattern may be needed for transformation pattern shown in fig. 8.θ is availableIt will change as tuner parameters and be adjusted to shallower or less shallow.
Fig. 9 depicts the logistic regression 802 with the θ 902 for being adjusted to generate shallower transformation.Turn using shallowerIn the case where change, all input t can be directed tonAnd tn+1Estimated probability.In the case where being estimated using β, probability can be in Fig. 7 A-7BIt is maximized at middle determined minimum value.
Processing logic can receive the first parameter (such as θ 902) to adjust the susceptibility of the judgement of probability.For example, θ 902a canWith one value, θ 902b can have two value, and θ 902c can have five value.Handling logic can be adjusted based on the first parameter 902The either shallow of the whole transformation pattern around reflection point 804.Tuning knob can be used to variation θ 902 and tuning be set as muting sensitive senseDegree, high sensitive etc..
Fig. 2 is returned to, at square 212, the processing logic of time series Transformation Analysis system 102 is determined using classifierThe probability of new time series data matching primordial time series data.Processing logic can receive new time series data and meterThe second distance value between new time series in primordial time series data in evaluation time window 506 and time window 506.PlaceWhether reason logic classifier the can be used new time series data to determine in time window 506 has the more than distance thresholdTwo distance values, and in response to the new time series data in time window 506 be more than distance threshold judgement and generate failure orNotice.
Figure 10 A-10B is directed to all values [tn,tn+1] show input to the probability of match time sequence data 402 (for example,There is maximum value at [0,4]).
Figure 11 A-11D is painted various new time series data 1002 in the case where using time series Transformation AnalysisProbability with time series data 402.In Figure 11 A, new time series data 1102a has substantive match time sequence numberAccording to the pattern of 402 pattern, and cause about 1 probability.New time series data in Figure 11 B, at n=251102b, which is greater than, to be expected, therefore the probability of match time sequence data 402 is about 0.93.In Figure 11 C, new time series numberIt is higher than time series data 402 at n=25 according to 1102c and is lower than time series data 402 at n=50, therefore matches meshThe probability for marking signal is about 0.5.In Figure 11 D, new time series data 1102d is significant higher at n=25 and in n=50Place is significant lower, therefore the probability for matching target is 0.
Fig. 3 is painted an embodiment of the method 300 for time series Transformation Analysis.It can be held by processing logicRow method 300, the processing logic may include hardware (such as circuit, special logic, programmable logic, microcode etc.), softPart (such as run instruction) on a processing device or combinations thereof.In one embodiment, method 300 is the time by Fig. 1Sequence transitions analysis system 102 is performed.
At square 302, processing logic receives the time series data 1102a-d (reference including more than first a data pointsFigure 11 A-11D).Each more than first in a data point can join from different time correlations.It can be given birth to during technique by sensorAt time series data.
At square 304, processing logic is by more than first from time series data 1102a-d in time window 1106First subset of data point and the second subset of more than second a data points from previous time series data 402 are comparedCompared with.Time window 1106 can be in time from current point in time to the time slip-window of former extension specific quantity.Time slip-windowSpecific quantity can be extended from current point in time to later in time.
At square 306, processing logic calculation indicates the first subset of more than first a data points away from more than second a data pointsSecond subset combined distance distance value.
At square 308, whether processing logic decision distance value is more than distance threshold (1A-11D referring to Fig.1).
At square 310, processing logical response is more than the judgement of distance threshold in distance value and exports notice.In a realityIt applies in mode, notice includes the instruction of the probability of new time series data match time sequence data 402 (for example, being directed toThe 0.996 of new time series data 1102a, for the 0.926 of new time series data 1102b, for new time sequenceThe 0.502 of column data 1102c, for the 0 of new time series data 1102d).In one embodiment, notice includesHave which section time window section of new time series data (for example, correspond to) of new time series data it is new whenBetween sequence data match time sequence data 402 probability threshold value (such as 0.5,0.85) instruction below.Implement at oneIn mode, it can show and notify via graphical user interface (such as via figure, chart, text etc.).In an embodimentIn, notice is one or more of the alarm of sound equipment, vision etc..It in one embodiment, is by phone, electronics postalOne or more of part, text etc. notify to send.In one embodiment, notice output so that tool, device,One or more of component, workshop etc. carry out one or more of following behavior: stopping action, pause activity, slow downActivity, shutdown etc..
Time series Transformation Analysis can be used for abnormality detection.In one embodiment, fault detection and classification (FDC) needleSensing data is formulated to known defect and/or abnormal mark automatic searching.User's setup cost may be low, becauseAnticipatory behavior can be inferred to from historical behavior.The database of known defect can be independently of formula set point.Identical database canAct on multiple formulas.Defect database can be developed in enterprises under controlled environment, and by these defect database portionsIt affixes one's name to scene.Known defect can have the corrective action for allowing quickly to solve known defect.Event can be captured for abnormal markBarrier maintenance knowledge (such as emphasize interested track or sensing data to user, user can mark or abnormal classification mark withAnd addition corrective action).General service condition includes examining for the post-processing formulation data of known defect and about failureIt repairs and the knowledge capture of new defect.
Time series Transformation Analysis can be used for time series deviation detection with for cannot by conventional method (such as SPC, markQuasi- failure monitoring method) detection abnormal behaviour search time sequence.User's setup cost may be low, because of expected rowTo be inferred from historical behavior.Algorithm is designed to intrinsic in tolerance other methods (such as the monitoring of simple guard band)Wrong report.Time series deviation can be stored and be used to search historical data or Future Data.Trouble hunting knowledge can be captured.OneAs service condition include that the post-processing formulation data for known defect, the knowledge about trouble hunting and new defect are caughtIt catches, the analysis of instantaneous time sequence and repeatability are analyzed.
Time series Transformation Analysis can be used to identify problem when technique undergoes mistake.For example, chamber may be undergoingIntermittent pressure spike, but find root the reason of and solution may be difficult, because of one of following reasonOr more persons: lack the data derived from the tool institute, or mistake can not be reappeared in enterprises or at the scene.Between when in useIt, can be for the subset of the history loop-around data of deviation behavior search tools in the case that sequence transitions are analyzed.Deviation row can be foundFor (identifying the multiple strokes for mismatching anticipatory behavior for example, deviateing and searching), the spike in tool data can be matched, and canIt is searched again for deviateing.The generation deviateed several times allows efficiently trouble hunting and solves the problems, such as.Problem can be knownNot Wei specific components function (such as specific valve opening and close pump and cause stress reading on fluctuation).
Time series Transformation Analysis can also be used to detection unstability.For example, tool may use the lower function on formulaRate mark.Candidate formula can be continuously recycled on tool.All strokes of manual analysis may be infeasible, it is thus possible to omitThe problem of low probability and/or frequency of interval.It, can be for time using abnormality detection and time series deviation detectionAll strokes of apolegamy side are for all steps analysis power and the power of reflection.Analysis can quickly identify the row of certain percentageSuspicious actions in journey.Observed certain defects may have potential yield effect.It is sent to the anti-of process exploitation teamFeedback can prompt the change of formula and the repetition of technique.Deviation about 5% can be reduced.
Figure 12 A is painted the time series data for time series Transformation Analysis.As shown in Figure 12, time series data402 n sample or data point is intercepted, rather than 2 samples in time window as shown in Figure 4.In an embodiment partyIt is the intercepted samples at [5,10,15...95] in formula, this measure causes 19 samples, and method 200 or 300 is made to become 19 dimensionsThe problem of spending rather than the problem of 2 dimension.Between when in use in the case where sequence transitions analysis (such as method 200, method 300),Echo signal at each sample point generates training set.
As shown in Figure 12B, random sample (classification 602a) is had selected from deviation pattern, and has estimated knnMeasurement.It selectsShow the random sample (classification 602b) of non-deviation behavior, and has estimated knnMeasurement.As shown in figure 12 c, be using θ be 5To generate logistic regression 802.Using logistic regression 802, various input signal match time sequence numbers can be directed toAccording to the probability for estimating various input signals the case where 402, as shown in Figure 13 A-13D.Time series data 402 is for giving birth toAt the pattern of housebroken classifier.New time series data 1302a-d is additional executes and primordial time series data 402The new signal of associated special process.In figure 13a, new time series data 1302a is relative to time series data 402And it deviates, and matching probability is about 0.6.In Figure 13 B, new time series data 1302b at n=0 to n=50 relative toTime series data 402 is higher, and matching probability is about 0.7.
As shown in Figure 14, time series data 402 may include from first sensor the first data 1402 (such as whenBetween sequence data 1402) and the second data 1404 (such as time series data 1404) from second sensor.Handle logicIt can determine that the time relationship between the first data and the second data (for example, capturing temporarily separating for FDC(temporarily-spaced) covariant (covariate) signal).Each time series data can have on each signalDifferent pattern.In Figure 14, the sinking in time series data 1404 can be associated with the increase in time series data 1402(for example, it may be possible to causing the increase in time series data 1402).Time series Transformation Analysis (such as method 200, method 300)It can be used to the relational pattern of detection time sequence data 1402 and 1404.In one embodiment, by time series data1402 and 1404 connect together in the case where generate single training vector the problem of (for example, generate 39 dimension).Using logicIn the case where recurrence and kNN algorithm, it can estimate that the probability of various input signal match time sequence datas 1402 and 1404 is timelyBetween relationship between sequence data 1402 and 1404.Figure 15 A-D is painted input signal 1502 and 1504 match time sequence datas1402 and 1404 probability.
In one embodiment, two training sets (402 1 training sets of each time series data) are generated and are usedTwo-dimentional logistic regression 802.
In an example, time series Transformation Analysis can receive the data measured by three sensors.Data can wrapInclude forward power data, reflection power data and pressure data.Three signals and their covariance from three sensorsIt can indicate the mark of plasma percussion (plasma strike) deviation.Time series Transformation Analysis can determine that be passed by threeThere is abnormal marks in certain time section in the data that sensor measures.It may be main relative to expected deviationIt is in the forward power signal at about 0.4 second of entry time section.Deviation can cause to be higher than normal reflection power simultaneouslyMark.This can indicate that plasma fires problem.Pressure may show correct shape, but deviate about 0.5 second.Pressure spike canThe label when fired for reflection power.The time series Transformation Analysis of data from three sensors, which can recognize, influences oneOr the abnormal mark of other multiple signal datas starts from where, to determine being what causes plasma percussion deviation.
Figure 16 is block diagram, is painted exemplary computer device (or system) 1600.In one embodiment, equipment is calculated(or system) 1600 can be the time series Transformation Analysis system 102 of Fig. 1.Calculating equipment 1600 includes being used for so that calculating equipment1600 execute the instruction set of any one or more of methodology discussed herein.Machine can be in client-serverWith the functional operation of server machine in device network environment.Machine can for personal computer (PC), set-top box (STB), server,Network router, switch or bridge or any machine for being able to carry out instruction set (in order or otherwise), described instructionThe specified movement to be taken by the machine of collection.Further, though being only painted single calculating equipment, term " calculates equipment "Using come include individually or jointly execute one group (or multiple groups) instruction with execute in methodology discussed herein appointThe machine of one or more any series.
Exemplary computer device 1600 include the processing system (processing equipment) 1602 communicated with each other via bus 1608,Main memory 1604 (such as read-only memory (ROM), flash memory, dynamic random access memory (DRAM) (such as synchronous dram(SDRAM)) etc.), static memory 1606 (such as flash memory, static random access memory (SRAM) etc.) and data storageEquipment 1616.
Processing equipment 1602 indicates one or more general service processing equipments, such as microprocessor, central processing unitEtc..More specifically, processing equipment 1602 can be complex instruction set calculation (complex instruction setComputing, CISC) microprocessor, reduced instruction set computing (reduced instruction set computing,RISC), very long instruction word (very long instruction word, VLIW) microprocessor or implement other instruction setProcessor or the processor for implementing instruction set combination.Processing equipment 1602 can also set for the processing of one or more specific usesIt is standby, such as application-specific integrated circuit (ASIC), field programmable gate array (FPGA), digital signal processor (DSP), networkProcessor etc..Processing equipment 1602 is configured as executing operation and step discussed herein.
Network interface device 1622 can be further included by calculating equipment 1600.Calculating equipment 1600 may also comprise video display unit1610 (such as liquid crystal display (LCD) or cathode-ray tubes (CRT)), literary digital input equipment 1612 (such as keyboard), cursorControl equipment 1614 (such as mouse) and signal generating apparatus 1620 (such as loudspeaker).
Data Holding Equipment 1616 may include that one or more instruction set 1626 are stored on the Data Holding EquipmentComputer-readable storage media 1624, these instruction set realize any of methodology or function described hereinOr more persons.In one embodiment, instruction 1626 includes time series Transformation Analysis system 102.Computer-readable storageMedia 1624 can be the non-transitory computer-readable storage media for including instruction, these instructions are executed by computer systemWhen make computer system execute include time series Transformation Analysis (such as method 200, method 300 etc.) one group of operation.Instruction 1626 (completely or at least partially) can also reside in primary storage during executing these instructions by calculating equipment 1600In device 1604 and/or in processing equipment 1602, main memory 1604 and processing equipment 1602 also constitute computer-readable media.Instruction 1626 can further send or receive on network 1628 via network interface device 1622.
Although computer-readable storage media 1624 is illustrated as single medium, word " meter in the exemplary embodimentCalculation machine readable memory media " application is including that the single medium for storing one or more instruction set or multiple media (such as collectChinese style or distributed data base and/or associated cache and server).Word " computer-readable storage media "Using including that can store, encode or realize any media of the instruction set as performed by machine, and described instruction collection makes machineAny one or more of the methodology of device execution present disclosure.Accordingly, term " computer-readable storage media " is answeredFor including but is not limited to solid-state memory, optical media and magnetic media.
Certain parts of detailed description below are with the symbol of the operation on algorithm and data bit in computer storageNumber indicate meaning present.These algorithmic descriptions and expression be from be familiar with the technical staff of technical field of data processing forThe others skilled in the art of the technical field most effectively convey the means of the substantive content of its work.Algorithm is (and general hereFor) it is contemplated to be the self-congruent sequence of steps for leading to certain result.These steps are the physical manipulations for including entity amountThey's step of behavior.Although in general, may not, this tittle using can be stored, transmit, in conjunction with, compare and otherwiseThe form of the electrical or magnetic signal of manipulation.These signals are censured as position, value, element, symbol, character, item, number etc. sometimesSuitably (the reasons why mainly for general service).
However, should keep firmly in mind, all these terms and similar term are associated with entity amount appropriate and onlyIt is the appropriate label applied to this tittle.Unless otherwise specifically recited, otherwise as understood by discussion below, it is to be understood thatBe to be referred to everywhere in this specification using the discussion of the term of such as " judgement ", " identification ", " comparison ", " transmission " etc.Computer system (or similar electronic computing device) by the buffer and memory by computer system entity (such asElectronics) the represented data manipulation of amount and be transformed by computer system memory or buffer or the storage of other this type of information,Transmission or the movement and program of analogously represented other data of entity amount in display equipment.
The embodiment of present disclosure is also about the system for executing operation herein.It can be directed to described hereinPurpose to come this system of special construction or the system may include general service computer, the general service computer is by storing upThe computer program selective actuation that is stored in computer reconfigures.Such computer program can be stored in computerIn (or machine) readable memory media, such as (but not limited to) any kind of disc (including floppy disk, CD, CD-ROM andMagneto-optic disk), read-only memory (ROM), random access memory (RAM), EPROM, EEPROM, magnetically or optically card, flash memory or be suitable forAny type media of stored electrons instruction.
Algorithms and displays presented herein is substantially not about any certain computer or other devices.Can with according toVarious general purpose systems are used together according to the program of introduction herein, or the building device more becomed privileged executes methodStep may be suitable.The structure of various systems for these systems will show from description herein.In addition, not joiningThe embodiment of present disclosure is described according to any specific program language.It will be appreciated that various program languages can be usedTo implement the teaching of disclosure as described herein.
It is to be understood that described above it is intended that illustrative and not restrictive.Read and understand it is described above itAfterwards, it will be appreciated by persons skilled in the art that many other embodiments.Therefore, the protection scope of present disclosure should refer toThe full scope of the equivalent that appended claims and such claim are assigned determines.

Claims (20)

Translated fromChinese
1.一种方法,包括以下步骤:1. A method comprising the steps of:接收时间序列数据,所述时间序列数据已在一工艺期间由一个或多个传感器生成,其中所述时间序列数据包括第一多个数据点;receiving time-series data that has been generated by one or more sensors during a process, wherein the time-series data includes a first plurality of data points;生成训练数据集,所述训练数据集包括多个随机化数据点,其中所述多个随机化数据点中的各个随机化数据点相对应于来自所述时间序列数据的所述第一多个数据点中的一者;generating a training data set comprising a plurality of randomized data points, wherein each randomized data point of the plurality of randomized data points corresponds to the first plurality of data from the time series data one of the data points;使用在时间窗内的所述多个随机化数据点的集合来生成多个随机化数据点组合,其中所述多个随机化数据点组合中的第一随机化数据点组合包括所述多个随机化数据点的所述集合的第一子集;generating a plurality of randomized data point combinations using the set of the plurality of randomized data points within a time window, wherein a first randomized data point combination of the plurality of randomized data point combinations includes the plurality of randomized data point combinations randomizing the first subset of the set of data points;基于所述多个随机化数据点组合来计算多个距离值,其中针对所述第一随机化数据点组合所计算的第一距离值表示所述多个随机化数据点的所述集合的所述第一子集相对于所述第一多个数据点的第一子集的组合距离,所述第一多个数据点的所述第一子集对应于所述多个随机化数据点的所述集合的所述第一子集;A plurality of distance values are calculated based on the plurality of randomized data point combinations, wherein the first distance values calculated for the first randomized data point combination represent all of the set of the plurality of randomized data points combined distance of the first subset relative to a first subset of the first plurality of data points, the first subset of the first plurality of data points corresponding to the the first subset of the set;基于多个经计算的距离值来生成分类器;及generating a classifier based on the plurality of calculated distance values; and使用所述分类器来判定所述工艺的新的执行的期间所生成的新的时间序列数据匹配所述时间序列数据的概率。The classifier is used to determine the probability that new time series data generated during a new execution of the process matches the time series data.2.根据权利要求1所述的方法,其中生成所述分类器的步骤包括基于所述多个经计算的距离来判定距离阈值,所述方法更包括以下步骤:2. The method of claim 1, wherein the step of generating the classifier comprises determining a distance threshold based on the plurality of calculated distances, the method further comprising the steps of:接收所述新的时间序列数据;receiving the new time series data;计算所述时间窗内的所述时间序列数据及所述时间窗内的所述新的时间序列之间的第二距离值;calculating a second distance value between the time series data in the time window and the new time series in the time window;使用所述分类器基于所述第二距离值来判定所述时间窗内的所述新的时间序列数据是否超过所述距离阈值;及using the classifier to determine whether the new time series data within the time window exceeds the distance threshold based on the second distance value; and响应于所述时间窗内的所述新的时间序列数据超过所述距离阈值的判定而生成故障。A fault is generated in response to a determination that the new time series data within the time window exceeds the distance threshold.3.根据权利要求2所述的方法,更包括以下步骤:3. The method according to claim 2, further comprising the steps of:基于所述时间序列数据检测所述工艺中的设定点变化之间的转变;及Detecting transitions between set point changes in the process based on the time series data; and检测所述新的时间序列数据中的相对于预期转变轨迹的偏差,其中所述预期转变轨迹是由所述时间序列数据所界定的。Deviations in the new time series data from an expected transition trajectory defined by the time series data are detected.4.根据权利要求1所述的方法,其中:4. The method of claim 1, wherein:所述时间窗是滑动时间窗;the time window is a sliding time window;所述工艺在大于所述滑动时间窗的时间区间内发生;及the process occurs within a time interval greater than the sliding time window; and生成所述随机化数据点组合的所述步骤、计算所述距离值的所述步骤、及生成所述分类器的所述步骤是针对所述滑动时间窗的多个实例中的各者执行的,其中所述多个实例中的各个实例跨越所述时间区间中的不同的时段。the step of generating the randomized data point combination, the step of calculating the distance value, and the step of generating the classifier are performed for each of a plurality of instances of the sliding time window , wherein each instance of the plurality of instances spans different time periods in the time interval.5.根据权利要求1所述的方法,其中所述分类器是使用逻辑回归来生成的。5. The method of claim 1, wherein the classifier is generated using logistic regression.6.根据权利要求5所述的方法,更包括以下步骤:6. The method according to claim 5, further comprising the steps of:从所述训练数据判定所述逻辑回归,其中所述逻辑回归包括从第一数据点到第二数据点的转变图案的位置,其中所述转变图案在居中定位在所述转变图案上的反射点附近反射;The logistic regression is determined from the training data, wherein the logistic regression includes the location of a transition pattern from a first data point to a second data point, wherein the transition pattern is at a reflection point centered on the transition pattern nearby reflections;接收第一参数以调整判定所述概率的所述步骤的敏感度的;及receiving a first parameter to adjust the sensitivity of the step of determining the probability; and基于所述第一参数调整围绕所述反射点的所述转变图案的浅度。The shallowness of the transition pattern surrounding the reflection point is adjusted based on the first parameter.7.根据权利要求1所述的方法,更包括以下步骤:针对所述时间窗,使用k最近邻(kNN)算法来计算距离阈值,计算所述距离阈值的所述步骤包括:7. The method of claim 1, further comprising the step of: for the time window, using a k-nearest neighbor (kNN) algorithm to calculate a distance threshold, the step of calculating the distance threshold comprising:针对所述多个随机化数据点组合中的各者,计算随机化数据点组合和来自所述训练数据集的各个剩余随机化数据点组合之间的欧式距离;及For each of the plurality of randomized data point combinations, computing an Euclidean distance between the randomized data point combination and each remaining randomized data point combination from the training data set; and从经计算的欧式距离中识别最小欧式距离,其中所述最小欧式距离是所述距离阈值。A minimum Euclidean distance is identified from the calculated Euclidean distances, where the minimum Euclidean distance is the distance threshold.8.根据权利要求1所述的方法,其中所述时间序列数据包括来自第一传感器的第一数据及来自第二传感器的第二数据,所述方法更包括以下步骤:8. The method of claim 1, wherein the time series data includes first data from a first sensor and second data from a second sensor, the method further comprising the steps of:判定所述第一数据及所述第二数据之间的时间关系。A temporal relationship between the first data and the second data is determined.9.一种方法,包括以下步骤:9. A method comprising the steps of:接收时间序列数据,所述时间序列数据已在工艺期间由传感器生成,其中所述时间序列数据包括第一多个数据点,所述第一多个数据点中的各者与不同的时间相关联;receiving time series data, the time series data having been generated by the sensor during the process, wherein the time series data includes a first plurality of data points, each of the first plurality of data points being associated with a different time ;将所述第一多个数据点在时间窗内的第一子集与第二多个数据点的第二子集进行比较;comparing a first subset of the first plurality of data points within a time window with a second subset of the second plurality of data points;计算距离值,所述距离值表示所述第一多个数据点的所述第一子集相对于所述第二多个数据点的所述第二子集的组合距离;calculating a distance value, the distance value representing a combined distance of the first subset of the first plurality of data points relative to the second subset of the second plurality of data points;判定所述距离值是否超过距离阈值;及determining whether the distance value exceeds a distance threshold; and响应于所述距离值超过所述距离阈值的判定,以输出通知。A notification is output in response to a determination that the distance value exceeds the distance threshold.10.根据权利要求9所述的方法,其中所述时间窗是滑动时间窗,所述滑动时间窗在时间上从当前时间点向以前延伸指定量。10. The method of claim 9, wherein the time window is a sliding time window extending in time from a current point in time to the past by a specified amount.11.根据权利要求10所述的方法,更包括以下步骤:11. The method according to claim 10, further comprising the steps of:生成训练数据集,所述训练数据集包括多个随机化数据点,其中所述多个随机化数据点中的各个随机化数据点对应于来自所述时间序列数据的所述第一多个数据点中的一者;generating a training data set comprising a plurality of randomized data points, wherein each randomized data point of the plurality of randomized data points corresponds to the first plurality of data from the time series data one of the points;使用所述多个随机化数据点在所述时间窗内的集合来生成多个随机化数据点组合,其中所述多个随机化数据点组合包括所述第二多个数据点的所述第二子集;Using the set of the plurality of randomized data points within the time window to generate a plurality of randomized data point combinations, wherein the plurality of randomized data point combinations includes the first plurality of the second plurality of data points. two subsets;使用k最近邻(kNN)算法来针对所述时间窗计算距离阈值,计算所述距离阈值的所述步骤包括:A distance threshold is calculated for the time window using a k-nearest neighbor (kNN) algorithm, the step of calculating the distance threshold comprising:针对所述多个随机化数据点组合中的各者,计算随机化数据点组合和来自所述训练数据集的各个剩余随机化数据点组合之间的欧式距离;及For each of the plurality of randomized data point combinations, computing an Euclidean distance between the randomized data point combination and each remaining randomized data point combination from the training data set; and从经计算的欧式距离识别最小欧式距离,其中所述最小欧式距离是所述距离阈值。A minimum Euclidean distance is identified from the calculated Euclidean distance, where the minimum Euclidean distance is the distance threshold.12.根据权利要求9所述的方法,更包括以下步骤:12. The method according to claim 9, further comprising the steps of:使用逻辑回归基于多个经计算的距离值来生成分类器;及generating a classifier based on the plurality of calculated distance values using logistic regression; and使用所述分类器来判定在所述工艺的新的执行的期间所生成的所述第二多个数据点匹配所述时间序列数据的概率。The classifier is used to determine a probability that the second plurality of data points generated during a new execution of the process match the time series data.13.根据权利要求12所述的方法,更包括以下步骤:13. The method according to claim 12, further comprising the steps of:从所述第二多个数据点判定所述逻辑回归,其中所述逻辑回归包括转变图案的位置,其中所述转变图案包括反射点;Determining the logistic regression from the second plurality of data points, wherein the logistic regression includes locations of transition patterns, wherein the transition patterns include reflection points;接收第一参数以调整判定所述距离值超过所述距离阈值的所述步骤的敏感度;及receiving a first parameter to adjust the sensitivity of the step of determining that the distance value exceeds the distance threshold; and基于所述第一参数调整围绕所述反射点的所述转变图案的浅度。The shallowness of the transition pattern surrounding the reflection point is adjusted based on the first parameter.14.一种包括指令的非暂时性计算机可读取储存媒体,所述指令在由计算机系统执行时使得所述计算机系统执行一组操作,所述组操作包括以下步骤:14. A non-transitory computer-readable storage medium comprising instructions that, when executed by a computer system, cause the computer system to perform a set of operations, the set of operations comprising the steps of:接收时间序列数据,所述时间序列数据已在工艺期间由一个或多个传感器生成,其中所述时间序列数据包括第一多个数据点;receiving time-series data that has been generated by one or more sensors during the process, wherein the time-series data includes a first plurality of data points;生成训练数据集,所述训练数据集包括多个随机化数据点,其中所述多个随机化数据点中的各个随机化数据点对应于来自所述时间序列数据的所述第一多个数据点中的一者;generating a training data set comprising a plurality of randomized data points, wherein each randomized data point of the plurality of randomized data points corresponds to the first plurality of data from the time series data one of the points;使用在时间窗内的所述多个随机化数据点的集合来生成多个随机化数据点组合,其中所述多个随机化数据点组合中的第一随机化数据点组合包括所述多个随机化数据点的所述集合的第一子集;generating a plurality of randomized data point combinations using the set of the plurality of randomized data points within a time window, wherein a first randomized data point combination of the plurality of randomized data point combinations includes the plurality of randomized data point combinations randomizing the first subset of the set of data points;基于所述多个随机化数据点组合来计算多个距离值,其中针对所述第一随机化数据点组合所计算的第一距离值表示所述多个随机化数据点的所述集合的所述第一子集相对于所述第一多个数据点的第一子集的组合距离,所述第一多个数据点的所述第一子集对应于所述多个随机化数据点的所述集合的所述第一子集;A plurality of distance values are calculated based on the plurality of randomized data point combinations, wherein the first distance values calculated for the first randomized data point combination represent all of the set of the plurality of randomized data points combined distance of the first subset relative to a first subset of the first plurality of data points, the first subset of the first plurality of data points corresponding to the the first subset of the set;基于多个经计算的距离值来生成分类器;及generating a classifier based on the plurality of calculated distance values; and使用所述分类器来判定所述工艺的新的执行的期间所生成的新的时间序列数据匹配所述时间序列数据的一概率。The classifier is used to determine a probability that new time series data generated during a new execution of the process matches the time series data.15.根据权利要求14所述的非暂时性计算机可读取储存媒体,其中生成所述分类器的步骤包括基于所述多个经计算的距离来判定距离阈值,所述操作更包括以下步骤:15. The non-transitory computer-readable storage medium of claim 14, wherein the step of generating the classifier comprises determining a distance threshold based on the plurality of calculated distances, the operation further comprising the steps of:接收所述新的时间序列数据;receiving the new time series data;计算所述时间窗内的所述时间序列数据及所述时间窗内的所述新的时间序列之间的第二距离值;calculating a second distance value between the time series data in the time window and the new time series in the time window;使用所述分类器基于所述第二距离值来判定所述时间窗内的所述新的时间序列数据是否超过所述距离阈值;及using the classifier to determine whether the new time series data within the time window exceeds the distance threshold based on the second distance value; and响应于所述时间窗内的所述新的时间序列数据超过所述距离阈值的判定而生成故障。A fault is generated in response to a determination that the new time series data within the time window exceeds the distance threshold.16.根据权利要求15所述的非暂时性计算机可读取储存媒体,更包括以下步骤:16. The non-transitory computer-readable storage medium of claim 15, further comprising the steps of:基于所述时间序列数据检测所述工艺中的设定点变化之间的转变;及Detecting transitions between set point changes in the process based on the time series data; and检测相对于所述新的时间序列数据中的预期转变轨迹的偏差,其中所述预期转变轨迹是由所述时间序列数据所界定的。A deviation is detected from an expected transition trajectory in the new time series data, wherein the expected transition trajectory is defined by the time series data.17.根据权利要求14所述的非暂时性计算机可读取储存媒体,其中:17. The non-transitory computer-readable storage medium of claim 14, wherein:所述时间窗是滑动时间窗;the time window is a sliding time window;所述工艺在大于所述滑动时间窗的时间区间内发生;及the process occurs within a time interval greater than the sliding time window; and生成所述随机化数据点组合的所述步骤、计算所述距离值的所述步骤及生成所述分类器的所述步骤是针对所述滑动时间窗的多个实例中的各者执行的,其中所述多个实例中的各个实例跨越所述时间区间中的不同的时段。the step of generating the combination of randomized data points, the step of calculating the distance value, and the step of generating the classifier are performed for each of a plurality of instances of the sliding time window, wherein each instance of the plurality of instances spans different time periods in the time interval.18.根据权利要求14所述的非暂时性计算机可读取储存媒体,其中所述分类器是使用逻辑回归来生成的。18. The non-transitory computer-readable storage medium of claim 14, wherein the classifier is generated using logistic regression.19.根据权利要求18所述的非暂时性计算机可读取储存媒体,更包括以下步骤:19. The non-transitory computer-readable storage medium of claim 18, further comprising the steps of:从所述训练数据判定所述逻辑回归,其中所述逻辑回归包括从第一数据点到第二数据点的转变图案的位置,其中所述转变图案在居中定位在所述转变图案上的反射点附近反射;The logistic regression is determined from the training data, wherein the logistic regression includes the location of a transition pattern from a first data point to a second data point, wherein the transition pattern is at a reflection point centered on the transition pattern nearby reflections;接收第一参数以调整判定所述概率的所述步骤的敏感度;及receiving a first parameter to adjust the sensitivity of the step of determining the probability; and基于所述第一参数调整围绕所述反射点的所述转变图案的浅度。The shallowness of the transition pattern surrounding the reflection point is adjusted based on the first parameter.20.根据权利要求14所述的非暂时性计算机可读取储存媒体,更包括以下步骤:针对所述时间窗,使用k最近邻(kNN)算法来计算距离阈值,计算所述距离阈值的所述步骤包括:20. The non-transitory computer-readable storage medium of claim 14, further comprising the steps of: for the time window, using a k-nearest neighbor (kNN) algorithm to calculate a distance threshold, calculating all of the distance thresholds The above steps include:针对所述多个随机化数据点组合中的各者,计算随机化数据点组合和来自所述训练数据集的各个剩余随机化数据点组合之间的欧式距离;及For each of the plurality of randomized data point combinations, computing an Euclidean distance between the randomized data point combination and each remaining randomized data point combination from the training data set; and从经计算的欧式距离识别最小欧式距离,其中所述最小欧式距离是所述距离阈值。A minimum Euclidean distance is identified from the calculated Euclidean distance, where the minimum Euclidean distance is the distance threshold.
CN201780057453.XA2016-09-192017-09-19Time series fault detection, fault classification and transition analysisActiveCN109716303B (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
CN202311355038.6ACN117540242A (en)2016-09-192017-09-19Time series fault detection, fault classification and transition analysis

Applications Claiming Priority (3)

Application NumberPriority DateFiling DateTitle
US15/269,530US10565513B2 (en)2016-09-192016-09-19Time-series fault detection, fault classification, and transition analysis using a K-nearest-neighbor and logistic regression approach
US15/269,5302016-09-19
PCT/US2017/052334WO2018053536A2 (en)2016-09-192017-09-19Time-series fault detection, fault classification, and transition analysis using a k-nearest-neighbor and logistic regression approach

Related Child Applications (1)

Application NumberTitlePriority DateFiling Date
CN202311355038.6ADivisionCN117540242A (en)2016-09-192017-09-19Time series fault detection, fault classification and transition analysis

Publications (2)

Publication NumberPublication Date
CN109716303Atrue CN109716303A (en)2019-05-03
CN109716303B CN109716303B (en)2023-11-03

Family

ID=61620187

Family Applications (2)

Application NumberTitlePriority DateFiling Date
CN202311355038.6APendingCN117540242A (en)2016-09-192017-09-19Time series fault detection, fault classification and transition analysis
CN201780057453.XAActiveCN109716303B (en)2016-09-192017-09-19Time series fault detection, fault classification and transition analysis

Family Applications Before (1)

Application NumberTitlePriority DateFiling Date
CN202311355038.6APendingCN117540242A (en)2016-09-192017-09-19Time series fault detection, fault classification and transition analysis

Country Status (6)

CountryLink
US (2)US10565513B2 (en)
JP (2)JP6896069B2 (en)
KR (2)KR102239233B1 (en)
CN (2)CN117540242A (en)
TW (2)TWI779584B (en)
WO (1)WO2018053536A2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN110308713A (en)*2019-06-032019-10-08湖州师范学院 A Method for Identification of Industrial Process Fault Variables Based on k-Nearest Neighbor Reconstruction
CN116075824A (en)*2020-07-232023-05-05Pdf决策公司 Automatic window generation for process traces
CN116601576A (en)*2020-12-082023-08-15杰富意钢铁株式会社Trigger condition determining method for time-series signal, abnormality diagnosis method for monitoring target device, and trigger condition determining device for time-series signal

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US10917419B2 (en)*2017-05-052021-02-09Servicenow, Inc.Systems and methods for anomaly detection
US11859846B2 (en)2018-06-152024-01-02Johnson Controls Tyco IP Holdings LLPCost savings from fault prediction and diagnosis
US11604441B2 (en)2018-06-152023-03-14Johnson Controls Tyco IP Holdings LLPAutomatic threshold selection of machine learning/deep learning model for anomaly detection of connected chillers
US20200026985A1 (en)*2018-07-172020-01-23Palo Alto Research Center IncorporatedSystem and method for characterizing an arbitrary-length time series using pre-selected signatures
CN109634802B (en)*2018-11-122023-04-14平安科技(深圳)有限公司Process monitoring method and terminal equipment
US11321633B2 (en)*2018-12-202022-05-03Applied Materials Israel Ltd.Method of classifying defects in a specimen semiconductor examination and system thereof
RU2724710C1 (en)*2018-12-282020-06-25Акционерное общество "Лаборатория Касперского"System and method of classifying objects of computer system
US11133204B2 (en)*2019-01-292021-09-28Applied Materials, Inc.Chamber matching with neural networks in semiconductor equipment tools
US11714397B2 (en)*2019-02-052023-08-01Samsung Display Co., Ltd.System and method for generating machine learning model with trace data
US11042459B2 (en)*2019-05-102021-06-22Silicon Motion Technology (Hong Kong) LimitedMethod and computer storage node of shared storage system for abnormal behavior detection/analysis
EP3772007A1 (en)*2019-07-302021-02-03Continental Teves AG & Co. OHGPhysical execution monitor
CN110543166A (en)*2019-09-182019-12-06河南工学院 A weighted k-nearest neighbor normalization method for multimodal industrial process fault detection
KR102455758B1 (en)2020-01-302022-10-17가부시키가이샤 스크린 홀딩스Data processing method, data processing device, and recording medium
CN111291096B (en)*2020-03-032023-07-28腾讯科技(深圳)有限公司Data set construction method, device, storage medium and abnormal index detection method
US20220011760A1 (en)*2020-07-082022-01-13International Business Machines CorporationModel fidelity monitoring and regeneration for manufacturing process decision support
US12436528B2 (en)*2020-07-302025-10-07Tyco Fire & Security GmbhBuilding management system with supervisory fault detection layer
JP2023551390A (en)*2020-11-102023-12-08グローバルウェーハズ カンパニー リミテッド Systems and methods for improved machine learning using hierarchical prediction and composite thresholds
US12237158B2 (en)2020-11-242025-02-25Applied Materials, Inc.Etch feedback for control of upstream process
US11709477B2 (en)2021-01-062023-07-25Applied Materials, Inc.Autonomous substrate processing system
WO2022198437A1 (en)*2021-03-232022-09-29Qualcomm IncorporatedState change detection for resuming classification of sequential sensor data on embedded systems
JP7672926B2 (en)*2021-09-022025-05-08日立ヴァンタラ株式会社 Outlier detection device and method
US12307389B2 (en)*2021-09-032025-05-20Sap SePredicting events based on time series data
JP7652491B2 (en)*2021-10-112025-03-27東京エレクトロン株式会社 SUBSTRATE PROCESSING SYSTEM, INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING PROGRAM
US20220084119A1 (en)*2021-11-302022-03-17Aaron FrenchMethod, system, and device for predicting stock performance and building an alert model for such estimation
US11656927B1 (en)2021-12-032023-05-23International Business Machines CorporationLocalizing faults in multi-variate time series data
US12164366B2 (en)*2022-12-082024-12-10Dell Products L.P.Disk failure prediction using machine learning
JP2025042981A (en)*2023-09-152025-03-28株式会社東芝 Information processing device, information processing method, and program
US20250172931A1 (en)*2023-11-272025-05-29Applied Materials, Inc.Excursion screening models for improving accuracy of excursion detection within manufacturing systems
CN118033519B (en)*2024-04-112024-08-02太湖能谷(杭州)科技有限公司Energy storage system sensor fault diagnosis method, system, equipment and medium

Citations (11)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN1677874A (en)*2004-03-312005-10-05三洋电机株式会社Method of detecting error location, and error detection circuit, error correction circuit using same
CN101286358A (en)*2007-04-102008-10-15三星电子株式会社 System and device with error detection/correction processing and method of outputting data
JP2010009313A (en)*2008-06-262010-01-14Mitsubishi Electric CorpFault sign detection device
CN101661754A (en)*2003-10-032010-03-03旭化成株式会社Data processing unit, method and control program
CN102156873A (en)*2010-12-312011-08-17北京航空航天大学Chaos-based method for detecting and classifying early single-point faults of mechanical component
US20120022700A1 (en)*2009-06-222012-01-26Johnson Controls Technology CompanyAutomated fault detection and diagnostics in a building management system
US20140189436A1 (en)*2013-01-022014-07-03Tata Consultancy Services LimitedFault detection and localization in data centers
US20150160098A1 (en)*2013-11-012015-06-11Hitachi Power Solutions Co., Ltd.Health management system, fault diagnosis system, health management method, and fault diagnosis method
US20150269050A1 (en)*2014-03-182015-09-24Microsoft CorporationUnsupervised anomaly detection for arbitrary time series
CN105074706A (en)*2013-01-172015-11-18应用材料公司 Deviation Classification Using Radial Basis Function Networks with Hypercubes in Semiconductor Processing Equipment
CN105518654A (en)*2013-08-232016-04-20应用材料公司K-nearest neighbor-based method and system to provide multi-variate analysis on tool process data

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US20040156370A1 (en)*2003-02-072004-08-12Lockheed Martin CorporationSystem for evolutionary adaptation
US7711734B2 (en)2006-04-062010-05-04Sas Institute Inc.Systems and methods for mining transactional and time series data
US7765020B2 (en)*2007-05-042010-07-27Applied Materials, Inc.Graphical user interface for presenting multivariate fault contributions
US8010471B2 (en)*2007-07-132011-08-30Microsoft CorporationMultiple-instance pruning for learning efficient cascade detectors
JPWO2009054474A1 (en)*2007-10-262011-03-10凸版印刷株式会社 Allele determination apparatus and method, and computer program
US8078552B2 (en)*2008-03-082011-12-13Tokyo Electron LimitedAutonomous adaptive system and method for improving semiconductor manufacturing quality
JP5145417B2 (en)2008-05-142013-02-20日東紡音響エンジニアリング株式会社 Signal determination method, signal determination apparatus, program, and signal determination system
US8868985B2 (en)*2009-09-172014-10-21Siemens AktiengesellschaftSupervised fault learning using rule-generated samples for machine condition monitoring
JP2011118777A (en)*2009-12-042011-06-16Sony CorpLearning device, learning method, prediction device, prediction method, and program
CN103077548B (en)*2012-05-142015-08-26中国石油化工股份有限公司The modeling method of fracture and vug carbonate reservoir corrosion hole Reservoir Body distributed model
US9275483B2 (en)*2012-09-072016-03-01Palo Alto Research Center IncorporatedMethod and system for analyzing sequential data based on sparsity and sequential adjacency
US9392463B2 (en)*2012-12-202016-07-12Tarun AnandSystem and method for detecting anomaly in a handheld device
JP6076751B2 (en)*2013-01-222017-02-08株式会社日立製作所 Abnormality diagnosis method and apparatus
KR101560274B1 (en)2013-05-312015-10-14삼성에스디에스 주식회사Apparatus and Method for Analyzing Data
US20140379619A1 (en)2013-06-242014-12-25Cylance Inc.Automated System For Generative Multimodel Multiclass Classification And Similarity Analysis Using Machine Learning
CN104517020B (en)2013-09-302017-10-20日电(中国)有限公司The feature extracting method and device analyzed for cause-effect
US10452458B2 (en)*2014-01-232019-10-22Microsoft Technology Licensing, LlcComputer performance prediction using search technologies
CN103957066B (en)*2014-05-212015-09-09电子科技大学 A Short-term Burst Communication Signal Detection Method Based on Nonparametric Kernel Function
CN105224543A (en)2014-05-302016-01-06国际商业机器公司For the treatment of seasonal effect in time series method and apparatus
JP5943357B2 (en)*2014-09-172016-07-05インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Machines Corporation Detection apparatus, detection method, and program
JP6436440B2 (en)*2014-12-192018-12-12インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Machines Corporation Generating apparatus, generating method, and program
WO2016122591A1 (en)2015-01-302016-08-04Hewlett Packard Enterprise Development LpPerformance testing based on variable length segmentation and clustering of time series data
EP3112959B1 (en)*2015-06-292021-12-22SUEZ GroupeMethod for detecting anomalies in a water distribution system

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN101661754A (en)*2003-10-032010-03-03旭化成株式会社Data processing unit, method and control program
CN1677874A (en)*2004-03-312005-10-05三洋电机株式会社Method of detecting error location, and error detection circuit, error correction circuit using same
CN101286358A (en)*2007-04-102008-10-15三星电子株式会社 System and device with error detection/correction processing and method of outputting data
JP2010009313A (en)*2008-06-262010-01-14Mitsubishi Electric CorpFault sign detection device
US20120022700A1 (en)*2009-06-222012-01-26Johnson Controls Technology CompanyAutomated fault detection and diagnostics in a building management system
CN102156873A (en)*2010-12-312011-08-17北京航空航天大学Chaos-based method for detecting and classifying early single-point faults of mechanical component
US20140189436A1 (en)*2013-01-022014-07-03Tata Consultancy Services LimitedFault detection and localization in data centers
CN105074706A (en)*2013-01-172015-11-18应用材料公司 Deviation Classification Using Radial Basis Function Networks with Hypercubes in Semiconductor Processing Equipment
CN105518654A (en)*2013-08-232016-04-20应用材料公司K-nearest neighbor-based method and system to provide multi-variate analysis on tool process data
US20150160098A1 (en)*2013-11-012015-06-11Hitachi Power Solutions Co., Ltd.Health management system, fault diagnosis system, health management method, and fault diagnosis method
US20150269050A1 (en)*2014-03-182015-09-24Microsoft CorporationUnsupervised anomaly detection for arbitrary time series

Cited By (4)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN110308713A (en)*2019-06-032019-10-08湖州师范学院 A Method for Identification of Industrial Process Fault Variables Based on k-Nearest Neighbor Reconstruction
CN116075824A (en)*2020-07-232023-05-05Pdf决策公司 Automatic window generation for process traces
CN116075824B (en)*2020-07-232024-09-06Pdf决策公司 Automatic window generation for process traces
CN116601576A (en)*2020-12-082023-08-15杰富意钢铁株式会社Trigger condition determining method for time-series signal, abnormality diagnosis method for monitoring target device, and trigger condition determining device for time-series signal

Also Published As

Publication numberPublication date
US10565513B2 (en)2020-02-18
TW202139004A (en)2021-10-16
US20180082201A1 (en)2018-03-22
WO2018053536A2 (en)2018-03-22
KR20190045383A (en)2019-05-02
JP6896069B2 (en)2021-06-30
KR102239233B1 (en)2021-04-09
CN109716303B (en)2023-11-03
TWI729211B (en)2021-06-01
JP2019533236A (en)2019-11-14
TWI779584B (en)2022-10-01
US20200210873A1 (en)2020-07-02
US12131269B2 (en)2024-10-29
KR20200106565A (en)2020-09-14
JP2021157811A (en)2021-10-07
WO2018053536A3 (en)2018-07-26
TW201823986A (en)2018-07-01
JP7260591B2 (en)2023-04-18
KR102155155B1 (en)2020-09-11
CN117540242A (en)2024-02-09

Similar Documents

PublicationPublication DateTitle
CN109716303A (en)Time series fault detection, fault classification and transition analysis using K-nearest neighbor and logistic regression methods
Kim et al.Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing
US7765020B2 (en)Graphical user interface for presenting multivariate fault contributions
CN107949812A (en)Combined method for detecting anomalies in a water distribution system
US20220027230A1 (en)Predicting Equipment Fail Mode from Process Trace
US20230221684A1 (en)Explaining Machine Learning Output in Industrial Applications
Jiang et al.Independent component analysis-based non-Gaussian process monitoring with preselecting optimal components and support vector data description
Li et al.Meteorological radar fault diagnosis based on deep learning
KR102486463B1 (en)Method and Apparatus for Real Time Fault Detection Using Time series data According to Degradation
Zambon et al.Detecting changes in sequences of attributed graphs
Wang et al.Enhancing root cause diagnosis for industrial process faults: Asymmetric sparsemax-driven predictive modeling
Zeng et al.Detecting anomalies in satellite telemetry data based on causal multivariate temporal convolutional network
Cordoni et al.A deep learning unsupervised approach for fault diagnosis of household appliances
Manca et al.Explainable AI for industrial alarm flood classification using counterfactuals
Nayak et al.Concept drift and model decay detection using machine learning algorithm
Chen et al.Exploiting Related Sensor Measurements for Effective Unsupervised Learning-based Detection of Equipment Anomalies
Li et al.Research on Adaptive Updating Method of Nuclear Power Plant Transient Models Based on Concept Drift
Meyer et al.Development of Anomaly Detection with Variable Contexts on Refrigeration Data
Al Iqbal et al.Automated diagnosis of anomalies via sensor-step data outlier detection: An application in semiconductors
Carrasco et al.Harnessing Real-Time Sensor Data for Fault Diagnosis in the Continuous Production of Copper Magnet Wires
Shahid et al.A novel deep multi‐task learning model for spatial–temporal fault detection and diagnosis in industrial systems
Choi et al.Two-steps Data Quality Assessment Methodology for Handling Drift of Machine Learning
Jiang et al.Mesh Failure Prediction Using Deep Learning Techniques
CN117828316A (en) A method and system for detecting anomalies in time series data classification based on entropy measurement

Legal Events

DateCodeTitleDescription
PB01Publication
PB01Publication
SE01Entry into force of request for substantive examination
SE01Entry into force of request for substantive examination
GR01Patent grant
GR01Patent grant

[8]ページ先頭

©2009-2025 Movatter.jp