CN109307839B - Circuit for Testing Contact Voltage Drop During the Electrical Life Experiment of AC Appliances - Google Patents
Circuit for Testing Contact Voltage Drop During the Electrical Life Experiment of AC AppliancesDownload PDFInfo
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
- G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
- G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
- G01R19/2509—Details concerning sampling, digitizing or waveform capturing
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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Abstract
Description
Translated fromChinese技术领域technical field
本发明涉及交流电器电寿命实验过程中测试触点电压降的电路，用于对各类交流继电器、接触器和交流电气开关电寿命实验过程中触点电压降的测量。The invention relates to a circuit for testing the voltage drop of contacts during the electrical life experiment of alternating current appliances, which is used for measuring the contact voltage drop during the electrical life experiment of various alternating current relays, contactors and alternating current electrical switches.
背景技术Background technique
在交流电器(如交流继电器和交流接触器)的电寿命实验过程中，测试其电参数和时间参数对于确定交流电器产品的失效机理，进而完成失效分析具有非常重要的工程实用价值。In the electrical life experiment process of AC electrical appliances (such as AC relays and AC contactors), testing their electrical parameters and time parameters has very important engineering practical value for determining the failure mechanism of AC electrical products, and then completing failure analysis.
交流电器触点电压降的测量属于微电压测量。测量方法可分为模拟测量法、热电变换器法等。The measurement of the voltage drop of the contacts of the AC appliance belongs to the micro-voltage measurement. Measurement methods can be divided into analog measurement method, thermoelectric converter method and so on.
模拟测量法，又称为仪表测量法，这是一种基于模拟电路的测量交流电压的方法，采用仪表直接测量触点对两端的电压。通常利用万用表或采取示波器的电压探头测量电压，测量电路结构简单，操作方便。但电器状态的频繁变换，导致人工操作困难，测试过程复杂，同时，为提高测量精度，需要大幅提高仪表的分辨率，由此带来了高成本、使用不便等问题。The analog measurement method, also known as the meter measurement method, is a method of measuring AC voltage based on an analog circuit, using a meter to directly measure the voltage across the contact pair. Usually, a multimeter or a voltage probe of an oscilloscope is used to measure the voltage. The measurement circuit has a simple structure and is easy to operate. However, the frequent change of electrical state makes manual operation difficult and the test process complicated. At the same time, in order to improve the measurement accuracy, the resolution of the instrument needs to be greatly improved, which brings problems such as high cost and inconvenience.
热电变换器法，通过放大触点对两端的交流信号来加热热电偶的电热丝，从而产生直流温差电动势，使输出的热电势等于交流信号的热电势，以此来测量触点电压降。此法可做到较高的测试精度。不足之处是这种方法转换速度慢，输入阻抗低，交流频率越低，测试精度越差。The thermoelectric converter method heats the heating wire of the thermocouple by amplifying the AC signal at both ends of the contact pair, thereby generating a DC thermoelectric electromotive force, so that the output thermoelectric potential is equal to that of the AC signal, so as to measure the contact voltage drop. This method can achieve higher test accuracy. The disadvantage is that the conversion speed of this method is slow, the input impedance is low, and the lower the AC frequency, the worse the test accuracy.
发明内容SUMMARY OF THE INVENTION
本发明涉及一种交流电器电寿命实验过程中测试触点电压降的电路，属于模拟测量法的一种改进，测试过程简单，能够在兼顾测试精度的同时大幅提高测量范围，有效克服现有测量仪器的不足之处。The invention relates to a circuit for testing the voltage drop of contacts during the electrical life test process of an alternating current appliance, which belongs to an improvement of the analog measurement method, the testing process is simple, the measurement range can be greatly improved while taking into account the testing accuracy, and the existing measurement method can be effectively overcome. shortcomings of the instrument.
交流电器电寿命实验过程中测试触点电压降的电路，它包括交流电压源1、负载2和被测触点对3，它还包括零磁通式霍尔电流传感器组4、限流电阻5、低通滤波器7、双路高阻低倍电压放大器8、增益可调的电压放大器9、多路AD转换器10、单片机11和显示模块12，交流电压源1的一个电极连接负载2的一端，负载2的另一端连接被测触点对3中的一个触点和低通滤波器7的一个信号输入端，交流电压源1的另一个电极穿过零磁通式霍尔电流传感器组4，连接被测触点对3的另一个触点和限流电阻5的一端，限流电阻5的另一端连接低通滤波器7的另一个信号输入端，零磁通式霍尔电流传感器组4的电压信号输出端连接双路高阻低倍电压放大器8的第一路信号输入端，低通滤波器7的信号输出端连接双路高阻低倍电压放大器8的第二路信号输入端，双路高阻低倍电压放大器8的第二路信号输出端连接增益可调的电压放大器9的信号输入端，增益可调的电压放大器9的信号输出端连接多路AD转换器10的CH0通道信号输入端，双路高阻低倍电压放大器8的第一路信号输出端连接多路AD转换器10的CH1通道信号输入端，多路AD转换器10的CH0通道信号输出端和CH1通道信号输出端分别连接单片机11的一个信号输入端，单片机11的显示信号输出端连接显示模块12的信号输入端，单片机11的第一控制信号输出端连接增益可调的电压放大器9的控制信号输入端，单片机11的第二控制信号输出端连接零磁通式霍尔电流传感器组4的控制信号输入端。The circuit for testing the voltage drop of contacts during the electrical life experiment of AC electrical appliances, it includes an AC voltage source 1, a
由于电路中设置了零磁通式霍尔电流传感器组4和增益可调的电压放大器9，能够在兼顾测试精度的同时大幅提高测量范围，有效克服现有测量仪器的不足之处。Since the zero-flux Hall
附图说明Description of drawings
图1是本发明的结构示意图。Figure 1 is a schematic structural diagram of the present invention.
具体实施方式Detailed ways
具体实施方式一：下面结合图1具体说明本实施方式。本实施方式包括交流电压源1、负载2、被测触点对3、零磁通式霍尔电流传感器组4、限流电阻5、低通滤波器7、双路高阻低倍电压放大器8、增益可调的电压放大器9、多路AD转换器10、单片机11和显示模块12，交流电压源1的一个电极连接负载2的一端，负载2的另一端连接被测触点对3中的一个触点和低通滤波器7的一个信号输入端，交流电压源1的另一个电极穿过零磁通式霍尔电流传感器组4，连接被测触点对3的另一个触点和限流电阻5的一端，限流电阻5的另一端连接低通滤波器7的另一个信号输入端，零磁通式霍尔电流传感器组4的电压信号输出端连接双路高阻低倍电压放大器8的第一路信号输入端，低通滤波器7的信号输出端连接双路高阻低倍电压放大器8的第二路信号输入端，双路高阻低倍电压放大器8的第二路信号输出端连接增益可调的电压放大器9的信号输入端，增益可调的电压放大器9的信号输出端连接多路AD转换器10的CH0通道信号输入端，双路高阻低倍电压放大器8的第一路信号输出端连接多路AD转换器10的CH1通道信号输入端，多路AD转换器10的CH0通道信号输出端和CH1通道信号输出端分别连接单片机11的一个信号输入端，单片机11的显示信号输出端连接显示模块12的信号输入端，单片机11的第一控制信号输出端连接增益可调的电压放大器9的控制信号输入端，单片机11的第二控制信号输出端连接零磁通式霍尔电流传感器组4的控制信号输入端。Embodiment 1: The present embodiment will be described in detail below with reference to FIG. 1 . This embodiment includes an AC voltage source 1 , a
本实施方式中，激励源及被激励部件包括；交流电压源1、负载2、被测触点对3；电流测量部件包括零磁通式霍尔电流传感器组4；过电压保护部件包括限流电阻5；信号调理部件包括低通滤波器7、双路高阻低倍电压放大器8、增益可调的电压放大器9和多路AD转换器10；In this embodiment, the excitation source and the excited components include: an AC voltage source 1, a
交流电压源1对成串联关系的负载2和被测触点对3进行激励，激励的交流电压值、负载类型跟负载值取决于被测交流电器的种类与功率等级。The AC voltage source 1 excites the
被测触点对3两端的微小电压UCi(触点电压降)进入低通滤波器7；经过低通滤波器7进入双路高阻低倍电压放大器8，经过放大后的电压信号进入增益可调的电压放大器9，得到输出电压UCo，其幅度与被测触点对3的触点电压降UCi成一次函数关系。The tiny voltage UCi (contact voltage drop) at both ends of the tested
回路电流I经过零磁通式霍尔电流传感器组4提取的电压值信号，进入双路高阻低倍电压放大器8，得到输出电压UI，其幅度与回路电流I成一次函数关系。The loop current I passes through the voltage value signal extracted by the zero-flux Hall
增益可调的电压放大器9输出电压UCo和双路高阻低倍电压放大器8输出电压UI进入多路AD转换器10的CH0通道和CH1通道，并转为数字量。The output voltage UCo of the gain-
多路AD转换器10在单片机11的控制之下，从IO口将UCo和UI的数字量读入片内。单片机11通过判断UCo的有效值大小，来反馈调节增益可调的电压放大器9的增益，UCo的有效值为AD转换器10参考电压值的1/4～3/4，增益倍数的量程可以从1倍到100倍之间调节；使得增益可调的电压放大器9输出电压UCo的有效值达到最佳；通过判断UI的有效值大小，来反馈调节零磁通式霍尔电流传感器组4的量程，使得双路高阻低倍电压放大器输出电压UI的有效值达到最佳，即UI的有效值为AD转换器10参考电压值的1/4～3/4。Under the control of the
目前已有交流电器电寿命实验过程中测试触点电压降的方法来看，多种类、不同功率等级的交流电器电寿命实验的触点电压降测量是最难实现的，其原因测试电路拓扑结构确定后，增益大小固定，被测电路的电压、电流幅度范围十分有限，若更换其他功率等级的交流电器，被测电路的电压、电流范围势必会超出设定范围，则会带来测试精度不够或无法测试的问题。因此需要利用多个放大电路的组合来适应多种功率等级交流电器的测试需求，由此带来操作复杂、电路繁琐、难以维护的问题。At present, there are existing methods for testing the voltage drop of contacts during the electrical life experiment of AC appliances. It is the most difficult to measure the voltage drop of contacts in the electrical life experiment of AC appliances of various types and different power levels. The reason is that the test circuit topology structure After determination, the gain size is fixed, and the voltage and current amplitude ranges of the circuit under test are very limited. If the AC electrical appliances of other power levels are replaced, the voltage and current ranges of the circuit under test will inevitably exceed the set range, which will lead to insufficient test accuracy. or untestable issues. Therefore, it is necessary to use a combination of multiple amplifier circuits to meet the testing requirements of AC appliances of various power levels, which brings about the problems of complicated operation, cumbersome circuits and difficult maintenance.
而本实施方式所设计的这种交流电器电寿命实验过程中测试触点电压降的方法来看，其通过增益可调的电压放大器、多路AD转换器和单片机构成反馈通路，利用软件的方式可实现增益自适应，保证增益自动调节的同时，可以提高调节范围，从而使得被测电路的电压、电流范围大幅增加，被测电路的电压可以从几十微伏到1伏之间变化。进而可以满足多种类、不同功率等级的交流电器电寿命实验需求，结构简单，易于维护。However, the method for testing the contact voltage drop during the electrical life experiment of the AC electrical appliance designed in this embodiment is that the feedback path is formed by a voltage amplifier with adjustable gain, a multi-channel AD converter and a single-chip microcomputer, and a software method is used to form a feedback path. Gain self-adaptation can be achieved, and the adjustment range can be increased while the gain is automatically adjusted, so that the voltage and current ranges of the circuit under test are greatly increased, and the voltage of the circuit under test can vary from tens of microvolts to 1 volt. Furthermore, it can meet the electrical life test requirements of various types and different power levels of AC electrical appliances, and has a simple structure and is easy to maintain.
通过零磁通式霍尔电流传感器组、多路AD转换器和单片机构成的反馈网络，仅需单片机控制一个模拟开关，就可实现回路电流测试范围自动调节。Through the feedback network formed by the zero-flux Hall current sensor group, the multi-channel AD converter and the single-chip microcomputer, the loop current test range can be automatically adjusted only by the single-chip computer controlling an analog switch.
由测试得到的触点电压降UCi和回路电流I，可利用软件计算得到交流接触电阻Rc＝UCi/I(I≠0)。From the contact voltage drop UCi and the loop current I obtained by testing, the AC contact resistance Rc =UCi /I (I≠0) can be obtained by software calculation.
单片机11根据以下三式，通过软件方式计算出被测触点对3的触点电压降UCi、回路电流I和接触阻抗Rc：The single-
单片机11将被测触点对3的触点电压降UCi、回路电流I和接触阻抗Rc的波形实时显示并记录在显示模块12上，向操作者提供被测结果。The
关于bu和ku，如上文所述，增益可调的电压放大器9的输出电压UCo的幅度与被测触点对3的触点电压降UCi的幅度成一次函数关系，即满足Uco＝ku·UCi+bu双路高阻低倍电压放大器8的输出电压UI的幅度与回路电流I的幅度成一次函数关系，即满足UI＝ki·I+bi。Regarding bu andku , as mentioned above, the amplitude of the output voltage UCo of the gain-
具体实施方式二：下面结合图1具体说明本实施方式。本实施方式与实施方式一的不同之处是：它还包括组合过压保护器6，组合过压保护器6的两个接线端分别连接在低通滤波器7的两个信号输入端上；Embodiment 2: The present embodiment will be described in detail below with reference to FIG. 1 . The difference between this embodiment and Embodiment 1 is that it also includes a combined
组合过压保护器由瞬态抑制二极管与稳压二极管并联在一起而成。The combined overvoltage protector consists of a TVS diode and a Zener diode in parallel.
当两个电器触点断开时，被测触点对3两端的电压UCi等于交流电压源1电压，此时限流电阻5与组合过压保护器6能够将低通滤波器7的输入电压限制在安全范围内；当两个电器触点闭合时，组合过压保护器6不工作。When the two electrical contacts are disconnected, the voltage UCi across the tested
从目前已有交流电器电寿命实验过程中测试触点电压降的方法来看，被测触点对的触点电压降UCi是最难测准的参数，其原因是在电寿命实验过程中，UCi的变化范围太大，可达从交流50μV直至交流660V量级。因此为保证仪器安全需使量程覆盖整个测试范围，由此带来测试精度下降的问题；若为保证测试精度需减小UCi的变化范围，要求电器必须始终闭合，由此带来电寿命实验过程中无法在线实时测试的问题。Judging from the existing methods of testing the contact voltage drop during the electrical life experiment of AC appliances, the contact voltage drop UCi of the tested contact pair is the most difficult parameter to measure. The reason is that during the electrical life experiment process , the variation range of UCi is too large, from AC 50μV to AC 660V magnitude. Therefore, in order to ensure the safety of the instrument, it is necessary to make the range cover the entire test range, which brings about the problem of decreased test accuracy; if the variation range of UCi needs to be reduced to ensure the test accuracy, it is required that the electrical appliance must always be closed, which brings about the electrical life test process. Problems that cannot be tested online in real time.
而本实施方式所涉及的交流电器电寿命实验过程中测试触点电压降的方法，设计了组合电压保护器与低通滤波器的配合，组合过压保护器由瞬态抑制二极管与稳压二极管组合而成，兼具极快的响应时间(亚纳秒级)和相当的额定电流特性。其好处是在电器分断时能够快速启动电压保护，同时限流电阻能够迅速降低回路电流；当电器闭合时保护电路自动脱离，限流电阻变为低通滤波器中的无源元件，将高频信号滤除，进一步提高测试精度，限流电阻具有双重功效。这一设计完全克服了上述精度不够以及无法在线实时测试的矛盾，而且测试结构简洁，测量精度高。However, in the method for testing the contact voltage drop during the electrical life experiment of the AC appliance involved in this embodiment, the combination of a combined voltage protector and a low-pass filter is designed, and the combined overvoltage protector is composed of a transient suppression diode and a Zener diode. Combined, it has a very fast response time (sub-nanosecond) and comparable current rating characteristics. The advantage is that the voltage protection can be started quickly when the electrical appliance is disconnected, and the current limiting resistor can quickly reduce the loop current; when the electrical appliance is closed, the protection circuit is automatically disengaged, and the current limiting resistor becomes a passive component in the low-pass filter, which reduces the high frequency. Signal filtering can further improve the test accuracy, and the current limiting resistor has dual functions. This design completely overcomes the above-mentioned contradictions of insufficient precision and inability to test online in real time, and has a simple test structure and high measurement accuracy.
本实施方式提供了一种交流电器在电寿命实验过程中在线实时测试触点电压降的方法。当电器电寿命实验时出现触点断开状态时，触点两端的交流电压经组合过压保护器与限流电阻，将高电压限制在安全范围内。当电器电寿命实验时出现触点闭合状态时，触点两端微小交流电压信号(触点电压降)，经过低通滤波后，由高阻低倍放大器放大后进入增益可调电压放大器，可得到与触点电压降成正比的输出电压。进一步，结合零磁通式霍尔电流传感器所测得的回路电流有效值，即可得到被测触点的接触阻抗。由于组合过压保护器的保护作用，能够实现交流电器触点电压降在线测试；同时，高阻低倍放大器容易获得较小的噪声系数，并易于实现失调电压补偿，而单片机与增益可调电压放大器结合，可实现增益自适应，进而提高测量精度、扩大测量范围，该实施方式具有满足在线测量、测量精度高以及测量范围广的特点。This embodiment provides a method for online real-time testing of contact voltage drop during an electrical life test process of an AC appliance. When the contact is disconnected during the electrical life test of the electrical appliance, the AC voltage at both ends of the contact is combined with an overvoltage protector and a current limiting resistor to limit the high voltage within a safe range. When the contact is closed during the electrical life test of the electrical appliance, the small AC voltage signal (contact voltage drop) at both ends of the contact, after low-pass filtering, is amplified by the high-resistance and low-power amplifier and then enters the gain-adjustable voltage amplifier. An output voltage proportional to the contact voltage drop is obtained. Further, combined with the effective value of the loop current measured by the zero-flux Hall current sensor, the contact impedance of the contact under test can be obtained. Due to the protective effect of the combined overvoltage protector, the on-line test of the contact voltage drop of the AC electrical appliance can be realized; at the same time, the high-resistance and low-amplifier amplifier is easy to obtain a smaller noise figure, and it is easy to realize offset voltage compensation, while the single-chip microcomputer and the gain adjustable voltage The combination of amplifiers can realize gain self-adaptation, thereby improving the measurement accuracy and expanding the measurement range. This embodiment has the characteristics of satisfying online measurement, high measurement accuracy and wide measurement range.
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