Summary of the invention
The main technical problem to be solved in the present invention is through existing electric label-sensitivity test method to electronicsThe test experience of tester is bad when the sensitivity of tag read-write equipment is tested, can not be according to obtained sensitivity to electronicsThe performance of tag read-write equipment carries out the problem of thoroughly evaluating.
In order to solve the above technical problems, the present invention provides a kind of electronic label read/write sensitivity test method, the electricitySubtab reader sensitivity test method includes:
S11: test equipment is based on pre-set test value set corresponding with each test condition parameters to electronics markThe value of at least two test condition parameters of label reader and/or the test equipment is configured respectively；The electronic tagThe test condition parameters of reader include the carrier frequency, carrier power and reader communications codes of the electronic label read/writeAt least one of rate, the test condition parameters of the test equipment include the return loss of the test equipment, scattering phaseAnd at least one of test equipment communication code rate；S12: being configured the scattering amplitude initial value of the test equipment,And increase adjustment is carried out to the scattering amplitude of the test equipment on the basis of initial value, until the electronic tag is readIt writes device and the test equipment communicates successfully, and record target scattering amplitude at this time；
S13: obtaining communication link current between the electronic label read/write and the test equipment and be lost, and according toThe communication link loss and the target scattering amplitude calculate the current sensitivity of the electronic label read/write；
S14: the current valued combinations of the sensitivity and the test condition parameters that foundation is currently calculated reflectPenetrate relationship；
S15: remaining valued combinations of at least two test condition parameters are calculated according to step S12 and step S13The corresponding sensitivity of corresponding test condition parameters valued combinations is obtained, and establishes corresponding test condition parameters valued combinations and correspondenceSensitivity mapping relations.
Further, the S15 includes:
To remaining all valued combinations of at least two test condition parameters respectively according to step S12 and step S13The corresponding sensitivity of corresponding test condition parameters valued combinations is calculated, and establish corresponding test condition parameters valued combinations andThe mapping relations of corresponding sensitivity.
Further, pair of the first test condition parameters and the first test value set is previously provided in the test equipmentIt should be related to, the corresponding relationship of the second test condition parameters and the second test value set, third test condition parameters and third testThe corresponding relationship of the corresponding relationship of value set and the 4th test condition parameters and the 4th test value set；
The S11 includes:
The test equipment is based on test value set corresponding with each test condition parameters respectively to the electronic tagThe value of four kinds of test condition parameters of reader and the test equipment is configured respectively.
Further, the test condition parameters include the carrier frequency of the electronic label read/write, carrier power withAnd reader communication code rate, the test equipment, which is configured the test condition parameters of the electronic label read/write, includes:
The test equipment sends parameter setting instruction to the electronic label read/write, wraps in the parameter setting instructionThe value of carrier frequency, the value of carrier power and the reader communication code rate that the needs containing the electronic label read/write are arrangedValue, so that the electronic label read/write to the carrier frequency of itself, carrier power and leads to according to the parameter setting instructionLetter code rate is configured.
Further, the S11 includes:
S111: it is one in the first test value set that first test condition parameters, which are arranged, in the test equipmentValue；
S112: it is one in the second test value set that second test condition parameters, which are arranged, in the test equipmentValue；
S113: it is one that the third is tested in value set that the third test condition parameters, which are arranged, in the test equipmentValue；
S114: it is one in the 4th test value set that the 4th test condition parameters, which are arranged, in the test equipmentValue；
The S15 includes:
S151: judge whether to traverse all values of the 4th test condition parameters, if not, S152 is gone to, if so, going toS153；
S152: setting the 4th test condition parameters are next value, and repeat S12-S152；
S153: judge whether to traverse all values of the third test condition parameters, if not, S154 is gone to, if so, going toS155；
S154: it is next value that the third test condition parameters, which are arranged, and repeats S114-S154；
S155: judge whether to traverse all values of second test condition parameters, if not, S156 is gone to, if so, going toS157；
S156: setting second test condition parameters are next value, and repeat S113-S156；
S157: judge whether to traverse all values of first test condition parameters, if not, S158 is gone to, if so, going toS159；
S158: setting first test condition parameters are next value, and repeat S112-S158；
S159: it exits.
Further, the test equipment includes signal analysis module and signal generating module, the signal analysis moduleFor receiving signal, the signal generating module is used to emit scattered signal, the S11 packet to the electronic label read/writeIt includes:
S110: the carrier frequency of electronic label read/write is configured；
After the S110, before the S12, further includes:
S16: the signal frequency and the electronic tag that the signal generating module and the signal analysis module is arranged are readThe carrier frequency for writing device is identical；
S17: during the test equipment and the electronic label read/write are communicated, the electronics mark is calculatedSign reader transmitting carrier signal the first frequency to be compared and the signal generating module transmitting signal second to thanCompared with frequency；
S18: the frequency departure between first frequency to be compared and second frequency to be compared is calculated, and determines instituteFrequency departure is stated less than or equal to predeterminated frequency deviation threshold.
Further, the frequency departure calculated between first frequency to be compared and second frequency to be comparedInclude:
Directly calculate the absolute value of the difference of the described first frequency to be compared and second frequency to be compared；
Or,
During the test equipment and the electronic label read/write are communicated, the signal analysis mould is obtainedThe frequency of block and as standard frequency, the difference for calculating first frequency to be compared and the standard frequency obtains firstFrequency difference, and the difference for calculating the described second frequency to be compared and the standard frequency obtains second frequency difference, calculates instituteState the absolute value of the difference of first frequency difference and the second frequency difference.
Further, the method also includes: when the frequency departure being calculated be greater than predeterminated frequency deviation threshold when, it is rightThe frequency of the signal generating module is adjusted, until the frequency departure being calculated is less than or equal to predeterminated frequency deviation thresholdValue.
Further, the present invention also provides a kind of electronic label read/write sensitivity test instruments, comprising: processor is depositedReservoir and communication bus；
The communication bus is for realizing the connection communication between the processor and the memory；
The processor is for executing one or more program stored in the memory, to realize as any of the above-describedThe step of described electronic label read/write sensitivity test method.
Further, the present invention also provides a kind of storage medium, the storage medium is stored with one or more program,One or more of programs can be executed by one or more processor, to realize the electronic tag as described in any of the above-describedThe step of reader sensitivity test method.
Beneficial effect
Electronic label read/write sensitivity test method, instrument and the storage medium provided through the invention, can be directed toOne electronic label read/write obtains its Sensitirity va1ue under at least two different communication environments, corresponding communication loopBorder is all to be configured to obtain to test condition parameters by test equipment, is not necessarily to tester's manual setting communication environment, is simplifiedThe operation of tester, due to the sensitivity under available different communication environment, it is possible to electronic label read/writePerformance carry out more comprehensive assessment.
Specific embodiment
It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not intended to limit the present invention.
First embodiment
It is shown in Figure 1 the present embodiment provides a kind of electronic label read/write sensitivity test method, comprising:
S11: test equipment is based on pre-set test value set corresponding with each test condition parameters to electronics markThe value of label reader and/or at least two test condition parameters of itself is configured respectively.
Specifically, test equipment can be configured at least three kinds of test condition parameters of electronic label read/write,At least three kinds of test condition parameters of itself can also be configured, it can also be to electronic label read/write and test equipmentAt least three kinds of test condition parameters are configured, such as at this point it is possible to a kind of test condition parameters to electronic label read/writeIt is configured, and the two kinds of test condition parameters of itself is configured.
It should be noted that the test condition parameters in the present embodiment should be that developer just sets in advance, whenWhen the test condition parameters being arranged in test equipment in advance include the test condition parameters of electronic label read/write, the test-stripsPart parameter may include at least one in the carrier frequency, carrier power and reader communication code rate of electronic label read/writeKind, when the test condition parameters being arranged in test equipment in advance include the test condition parameters of itself, test condition ginsengNumber may include the return loss of test equipment, scattering at least one of phase and test equipment communication code rate.
The corresponding test value set of each test condition parameters is additionally provided on test equipment, test equipment is to eachKind test condition parameters should be configured when being configured based on corresponding test value set.
S12: the scattering amplitude initial value of test equipment is configured according to initial value setting instruction, and in the initial valueOn the basis of increase adjustment is carried out to the scattering amplitude of test equipment, until electronic label read/write and test equipment communication atFunction, and record target scattering amplitude at this time.
It should be noted that the initial value setting instruction in step S12 can be what tester issued, it is also possible to surveyWhat test instrument automatically generated, initial value should be set in advance in test equipment at this time, under normal conditions for, this initial valueShould be sufficiently small, it can be 0 particularly, it should real-time monitoring electricity during increasing scattering amplitude on the basis of initial valueThe signal intelligence of subtab reader and test equipment should record target scattering amplitude at this time when the two communicates successfully,It is therefore to be understood that the target scattering amplitude in the present embodiment is test equipment and when electronic label read/write communicates successfullyMinimum value.In other words, the test equipment in the present embodiment can every a preset time interval be judged as itself withWhether success communication increases rule by preset amplitude and increases test equipment electronic label read/write if communication is unsuccessfulScattering amplitude, be then further continued for detection communication whether succeed.
S13: it obtains communication link current between electronic label read/write and test equipment and is lost, and according to the communication chainPath loss consumption and target scattering amplitude calculate the current sensitivity of electronic label read/write.
Each scattering amplitude has its corresponding performance number, and the corresponding performance number of target scattering amplitude is subtracted communication chainPath loss consumes the sensitivity that can be obtained by Current electronic tag read-write equipment.Communication link loss in the present embodiment can be according to electricityCommunications setting situation determination between subtab reader and test equipment obtains.
S14: the mapping relations of the current valued combinations of the sensitivity and test condition parameters that foundation is currently calculated.
The corresponding relationship of a kind of test condition parameters valued combinations and sensitivity can be obtained according to step S14.
S15: remaining valued combinations of at least two test condition parameters are calculated according to step S12 and step S13The accordingly corresponding sensitivity of test condition parameters valued combinations, and establish corresponding test condition parameters valued combinations and corresponding spiritThe mapping relations of sensitivity.
According to step S15, the corresponding relationship of at least two test condition parameters valued combinations and sensitivity can be obtained.
For ease of understanding, it is assumed here that it is preset on test equipment there are two types of test condition parameters, respectively A and B,Corresponding test value set is { A1, A2, A3 } and { B1, B2 }.If test condition parameters setting is set respectively in step S11Be set to A1 and B1, then it can be to any one in (A1, B2), (A2, B1), (A2, B2), (A3, B1), (A3, B2) in step S15Kind or the corresponding sensitivity of a variety of valued combinations calculated all in accordance with step S12 and step S13, particularly, can to this 5The corresponding sensitivity of kind valued combinations is all calculated, in this way, all valued combinations and the spirit of test condition parameters can be obtainedThe corresponding relationship of sensitivity is more fully evaluated so as to the performance to electronic label read/write.
Optionally, the first test condition parameters and the first test can be previously provided in the test equipment in the present embodimentThe corresponding relationship of value set, the corresponding relationship of the second test condition parameters and the second test value set, third test condition parametersWith the corresponding relationship of the corresponding relationship of third test value set and the 4th test condition parameters and the 4th test value set.ThisWhen, in step s 11, test equipment should all be configured these four test condition parameters, specifically, should be based onTest value set corresponding with each test condition parameters is respectively to four kinds of test-strips of electronic label read/write and test equipmentThe value of part parameter is configured respectively, and four in the present embodiment kind test condition parameters can be the carrier wave of electronic label read/writeFrequency, carrier power, reader communication code rate, return loss, scattering phase and the test equipment communication code rate of test equipmentIn any four parameter.Optionally, in some embodiments, in addition to above-mentioned four kinds of test condition parameters are arranged in test equipmentOther than corresponding test value set, the corresponding relationship of the 5th test condition parameters and the 5th test value set can also be set,The corresponding relationship of 6th test condition parameters and the 6th test value set, this six kinds of test condition parameters can be above-mentioned institute at this timeThe six kinds of parameters referred to.
Test equipment in the present embodiment is in perhaps carrier power or the reading of the carrier frequency to electronic label read/writeWhen writing device communication code rate and being configured, parameter setting instruction can will be sent to electronic label read/write, in parameter setting instructionValue comprising the value of carrier frequency or the value of carrier power or reader communication code rate that electronic label read/write needs to be arranged,For electronic label read/write according to the parameter setting instruction to itself carrier frequency or carrier power or communication code rate intoRow setting.So in scheme provided by the invention, test equipment can automatically to the carrier frequency of electronic label read/write,Carrier power or communication code rate are configured, and are not necessarily to tester's manual test, are simplified the operation of tester.
It should be noted that when presetting, there are four types of test condition parameters and corresponding four kinds of tests in the present embodimentWhen value set, its corresponding sensitivity, specific process can all be calculated to all valued combinations of four kinds of test condition parametersIt may refer to shown in Fig. 2, comprising:
S111: it is a value in the first test value set that the first test condition parameters, which are arranged, in test equipment.
S112: it is a value in the second test value set that the second test condition parameters, which are arranged, in test equipment.
S113: it is the value that third is tested in value set that third test condition parameters, which are arranged, in test equipment.
S114: it is a value in the 4th test value set that the 4th test condition parameters, which are arranged, in test equipment.
S12: the scattering amplitude initial value of test equipment is configured according to initial value setting instruction, and in the initial valueOn the basis of increase adjustment is carried out to the scattering amplitude of test equipment, until electronic label read/write and test equipment communication atFunction, and record target scattering amplitude at this time.
S13: it obtains communication link current between electronic label read/write and test equipment and is lost, and according to the communication chainPath loss consumption and target scattering amplitude calculate the current sensitivity of electronic label read/write.
S14: the mapping relations of the current valued combinations of the sensitivity and test condition parameters that foundation is currently calculated.
S151: judge whether to traverse all values of the 4th test condition parameters, if not, S152 is gone to, if so, going toS153；
S152: the 4th test condition parameters of setting are next value, and repeat S12-S152；
S153: judge whether to traverse all values of third test condition parameters, if not, S154 is gone to, if so, going toS155；
S154: setting third test condition parameters are next value, and repeat S114-S154；
S155: judge whether to traverse all values of the second test condition parameters, if not, S156 is gone to, if so, going toS157；
S156: the second test condition parameters of setting are next value, and repeat S113-S156；
S157: judge whether to traverse all values of the first test condition parameters, if not, S158 is gone to, if so, going toS159；
S158: the first test condition parameters of setting are next value, and repeat S112-S158；
S159: it exits.
It is described herein comprising four kinds of test condition parameters when meter sensitivity process, it should be appreciated that when comprisingWhen six kinds of test condition parameters, between step S114 and S12, test equipment can also be arranged the 5th test condition parameters and beA value in 5th test value set, the 6th test condition parameters of setting are a value in the 6th test value set, thenThe all values and the 5th test-strips of the 6th test condition parameters have been traversed respectively before step S151 referring to the above methodThe all values of part parameter.
It should be noted that all values of the traversal test condition parameters in above-mentioned steps refer to traversal test condition parametersCorresponding test value set, and the corresponding sensitivity of each valued combinations is calculated.For example, being preset on test equipmentTest condition parameters be A, B, C, D, and the corresponding test value set of each test condition parameters be { A1, A2, A3 ...Ap }, { B1, B2, B3 ... Bq }, { C1, C2, C3 ... Cx }, { D1, D2, D3 ... Dy }, can then after after above-mentioned processTo obtain pqxy kind test value valued combinations, and each test value valued combinations has its corresponding sensitivity.
It should be understood that the first test condition parameters in Fig. 2 can be the carrier frequency of electronic label read/write, theTwo test condition parameters can be the carrier power of electronic label read/write, and third test condition parameters can be test equipmentReturn loss, the 4th test condition parameters can be the scattering phase of test equipment.It of courses, in other examples, theOne test condition parameters can be the carrier power of electronic label read/write or the return loss of test equipment or test equipmentScattering phase, the second test condition parameters can be electronic label read/write carrier frequency or test equipment echo damageThe concrete type of the scattering phase of consumption or test equipment, third test condition parameters and the 4th test condition parameters and above-mentioned classSeemingly, which is not described herein again.
Optionally, test equipment may include signal analysis module and signal generating module, wherein signal generating module is usedIn emitting scattered signal to electronic label read/write, signal analysis module is shown in Figure 3 for receiving signal, and S11 can be withInclude:
S110: based on pre-set test value set corresponding with the carrier frequency of electronic label read/write to electronics markThe carrier frequency of label reader is configured.
After S110, before S12, it can also include the following steps:
S16: the signal tranmitting frequency and electronic label read/write of setting signal generation module and the signal analysis moduleCarrier frequency it is identical.
S17: during test equipment and electronic label read/write are communicated, electronic label read/write transmitting is calculatedCarrier signal the first frequency to be compared and signal source module transmitting signal the second frequency to be compared.
S18: calculating the frequency departure between the first frequency to be compared and the second frequency to be compared, and determines that frequency departure is smallIn equal to predeterminated frequency deviation threshold.
After having executed above-mentioned steps S110-S18, it can determine that the carrier frequency of electronic label read/write and signal occurThe step of frequency departure of the scattered signal tranmitting frequency of module is smaller, executes follow-up test sensitivity again at this time can guarantee to surveyThe accuracy of test result.
The mode that the frequency departure between the first frequency to be compared and the second frequency to be compared is calculated in the present embodiment can be withIt is following manner:
Directly calculate the absolute value of the difference of the first frequency to be compared and the second frequency to be compared；
Or,
During test equipment and electronic label read/write are communicated, the frequency of acquisition signal analysis module simultaneously will, as standard frequency, the difference for calculating the first frequency and standard frequency to be compared obtains first frequency difference, and calculates second for itThe difference of frequency and standard frequency to be compared obtains second frequency difference, calculates the difference of first frequency difference and second frequency differenceAbsolute value.
It should be noted that mould occurs to signal when the frequency departure being calculated is greater than predeterminated frequency deviation thresholdThe frequency of block is adjusted, until the frequency departure being calculated is less than or equal to predeterminated frequency deviation threshold.
Test condition parameters in the present embodiment, which can be, can arbitrarily influence electronic label read/write or test equipmentThe parameter of signal tranmitting frequency.
Second embodiment
It is shown in Figure 4 the present embodiment provides a kind of electronic label read/write sensitivity test instrument, including processor41, memory 42 and communication bus 43, wherein communication bus 43 is logical for realizing the connection between processor 41 and memory 42Letter, processor 41 is for executing one or more program stored in memory 42, to realize any electricity in above-described embodimentThe step of subtab reader sensitivity test method.
The present embodiment also provides a kind of storage medium, which is stored with one or more program, one orMultiple programs can be executed by one or more processor, to realize any electronic label read/write sensitivity in above-described embodimentThe step of test method.
It is noted that herein, the terms "include", "comprise" or its any other variant are intended to non-exclusiveProperty include so that include a series of elements process, method, article or device not only include those elements, but alsoFurther include other elements that are not explicitly listed, or further include for this process, method, article or device it is intrinsicElement.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that wanted including thisThere is also other identical elements in the process, method of element, article or device.
The serial number of the above embodiments of the invention is only for description, does not represent the advantages or disadvantages of the embodiments.
Through the above description of the embodiments, those skilled in the art can be understood that above-described embodiment sideMethod can be realized by means of software and necessary general hardware platform, naturally it is also possible to by hardware, but in many casesThe former is more preferably embodiment.Based on this understanding, technical solution of the present invention substantially in other words does the prior artThe part contributed out can be embodied in the form of software products, which is stored in a storage mediumIn (such as ROM/RAM, magnetic disk, CD), including some instructions are used so that a terminal (can be mobile phone, computer, serviceDevice, air conditioner or network equipment etc.) execute method described in each embodiment of the present invention.
The embodiment of the present invention is described with above attached drawing, but the invention is not limited to above-mentioned specificEmbodiment, the above mentioned embodiment is only schematical, rather than restrictive, those skilled in the artUnder the inspiration of the present invention, without breaking away from the scope protected by the purposes and claims of the present invention, it can also make very muchForm, all of these belong to the protection of the present invention.