Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, completeSite preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based onEmbodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every otherEmbodiment shall fall within the protection scope of the present invention.
Implantation equipment wirelessly carries out communication and/capacitor fill/powers to et al. Ke battery.It plantsEnter equipment and generally comprises circuit board, charging and communication coil, battery, output electrode and several sampling resistors.The embodiment of the present inventionIn circuit-under-test plate be implanted into equipment in circuit board, the circuit board be equipped with a variety of electric elements, be implanted into equipment coreCenter portion part, for controlling the working condition of implantation equipment.
The embodiment of the present invention provides a kind of for detecting the Auto-Test System of implantation medical instrument circuit board, which canFor detecting DBS (deep brain stimulation, deep brain stimulation), VNS (vagusneve stimulation, fanWalk nerve stimulation), SCS (Spinal cord stimulation, spinal cord stimulation trial) and SNM (SacralNeuromodulation, sacral nerve stimulation system) etc. charging and non-charge prepd.As shown in Figure 1, the system includes: displacement workFill 11, power supply 12 and computer 13.It shifts tooling 11 and is equipped with charging programmable device 14, induction coil 15 and test board 16, displacementTooling 11 for changing charging programmable device 14 and induction coil 15 relative position.
There are many selections for the specific structure of displacement tooling 11, such as can be the electronic dress for being equipped with one or more guide railsIt sets, charging programmable device 14 and induction coil 15 can be individually positioned on two platforms that can be realized relative motion, so then may be usedTo realize the change in location between the two.Measurand in the embodiment of the present invention only has circuit-under-test plate 10, and induction coil 15 isA part of this test macro, simulation is charging and the communication coil for being implanted into equipment；What the programmable device 14 that charges was simulated is externalCharging equipment, charge programmable device 14 inside also be provided with induction coil.Relative position described in the present embodiment can be relative distance, togetherWhen also may include relative angle etc., be specifically dependent upon the structure of displacement tooling 11, the present invention provides a kind of preferred structure,It will describe in detail in subsequent embodiment.
Test board 16 is equipped with for providing the element loaded, the peripheral circuit of circuit-under-test plate 10 to circuit-under-test plate 10And the interface of connection circuit-under-test plate 10 and induction coil 15, induction coil 15 are connected by test board 16 and circuit-under-test plate 10It connects.Element on test board 16 for example may include element, relay, analog switch, electrode, resistance of several fictitious loads etc.Device, these elements are used to simulate such as output electrode, the sampling resistor device that circuit-under-test plate 10 is connected in actual productsPart and the actual loading situation for simulating circuit-under-test plate 10.
Computer 13 is connect with test board 16, charging programmable device 14 and power supply 12 respectively, for controlling on test board 16Element provides load to circuit-under-test plate 10, and the coil of control charging programmable device 14 passes through induction coil 15 and circuit-under-testPlate 10 charges to power supply (this power supply is battery simulator, is set as rechargeable battery during charging measurement) 12, andThe running parameter of circuit-under-test plate 10 is obtained by charging programmable device 14.These running parameters can be by the periphery on test board 16Circuit (such as temperature sampling resistance) is acquired, and passes to charging programmable device 14 by induction coil 15.
During power supply 12 is electrically charged, displacement tooling 11 can change the coil and induction coil of charging programmable device 14The change of 15 relative position, the two distance or angle will affect the running parameter of circuit-under-test plate 10, such as may includeCharging current, charging voltage, temperature etc..The coil of charging programmable device 14 mode will be carried out with induction coil 15 by wireless communicationCommunication is to read these parameters.For acquiring charging current, ammeter 17 can be set between power supply 12 and test board 16Charging current is measured, computer 13 can be by the data and the circuit-under-test plate 10 that by wireless communication spread out of from belt current laterThe charging current of sensor compares, these running parameters will be used to judge as test result circuit-under-test plate 10 whether qualification canIt leans on.In non-charged state, i.e., the stage that carries out treatment test of circuit-under-test plate 10, ammeter 17 can be used for power supply power supply power consumptionThe reading of test data.
Test macro provided in an embodiment of the present invention is utilized using the battery of power supply (battery simulator) simulation implantation equipmentThe programmable device that charges simulates external charging device, and the coil of implantation equipment is simulated using induction coil, is simulated using test board testedThe peripheral circuit of circuit board is in circuit-under-test plate under actual working environment, while changing charging using displacement tooling and compilingThe relative position of journey device coil and induction coil, the charging operations being likely to occur in actual use with analog subscriber lead toIt crosses computer control charging process and reads the running parameter of circuit-under-test plate, which carries out needle to the circuit board of implantation equipmentTo the stronger test of property, entire test process realizes automatic operation, working efficiency with higher.
As a preferred embodiment, the computer 13 in the present embodiment can also read the work of charging programmable device 14Make parameter, and charge efficiency is calculated according to the running parameter of the running parameter of circuit-under-test plate 10 and charging programmable device 14.ChargingThe voltage of efficiency=circuit-under-test plate 10 charging current * circuit-under-test plate 10/(charging programmable device voltage * charging programmable device electricityStream).
The charging current and voltage of circuit-under-test plate 10 can be sampled by circuit-under-test plate 10 itself, charging programmable device 14Voltage and current can be sampled by charging programmable device, and charge efficiency is sent to meter after can also being calculated by charging programmable device 14Calculation machine 13.
Another embodiment of the present invention provides a kind of systems for detecting implantation medical instrument circuit board, in previous realityOn the basis of applying example, magnet is additionally provided in the displacement tooling 11 of the present embodiment.Implantation equipment is typically provided with the electromagnetism for resetSwitch, user can trigger this switch by magnet and realize corresponding control, and the magnet in the present embodiment is then used to detect testedThe reset function of circuit board 10, computer 13 can control the opposite position of displacement 11 variations in magnet of tooling and circuit-under-test plate 10It sets, and detects the working condition of the electromagnetic switch on circuit-under-test plate 10.
As the preferred embodiment of the present invention, the displacement tooling 11 of the present embodiment will control the change in location of two groups of devices,That is magnet and the relative position of circuit-under-test plate 10, the relative position of charge programmable device 14 coil and induction coil 15.For this purpose, thisEmbodiment provides a kind of preferred displacement 11 structure of tooling, and as shown in Figures 2 and 3, displacement tooling 11 includes: Y-axis guide rail A, XAxis rail B, translation stage 111, induction coil tooling 112, charge programmable device coil tooling 113, magnet tooling 114, and test board is flatPlatform 115.X-axis guide rail B is movably disposed on Y-axis guide rail A and is driven by Y-axis guide rail A, and X-axis guide rail B intersects with Y-axis guide rail AIt is arranged vertically, translation stage 111 is movably disposed on X-axis guide rail B and is driven by X-axis guide rail B, 112 He of induction coil toolingMagnet tooling 114 is fixedly mounted on translation stage 111, and induction coil tooling 112 and magnet tooling 114 are on translation stage 111Quadrature arrangement.Charging programmable device coil tooling 113 be located at the one end the X-axis guide rail B and with the X-axis guide rail B is relatively fixed setsIt sets；Test board platform 115 is located at the one end the Y-axis guide rail A and fixed setting opposite with the Y-axis guide rail A.
Induction coil tooling 112 is for installing induction coil, and charging programmable device coil tooling 113 is filled for installingThe coil of electrical programming device.Induction coil tooling 112 and charging programmable device coil tooling 113 can be realized induction coil and chargingThe detachable installation of programmable device.
In the displacement tooling 11 of the present embodiment, the coil of charging programmable device 14 is installed on charging programmable device coil toolingIn 113, induction coil 15 is mounted in induction coil tooling 112.In order to adapt to the test of different type product, enhancing displacement work11 versatility is filled, the programmable device coil tooling that charges and induction coil tooling 1 use unified fixation and the mode of connection, are carrying outWhen different product is tested, only need to change with charging programmable device coil tooling and induction coil tooling.
In the displacement tooling 11 of the present embodiment, the coil of charging programmable device coil tooling 113 and the programmable device 14 that charges is fixedIt is mounted in one end of X-axis guide rail B；Corresponding with the charging coil of programmable device 14 is to be movably disposed at the X-axis to leadTranslation stage 111 on rail B, translation stage 111 are equipped with the induction coil tooling 112 with the coil alignment of charging programmable device 14, senseCoil 15 is answered to be mounted in induction coil tooling 112, translation stage 111 is additionally provided with the magnet work with induction coil tooling quadrature arrangementThe magnet for filling 114 and being mounted in magnet tooling 114, translation stage 111 is controlled movement by X-axis guide rail B, when translation stage 111 is mobileInduction coil and magnet is driven to move together.In the displacement tooling 11 of the present embodiment, one end of Y-axis guide rail A is flat equipped with test boardPlatform 115, test platform are equipped with test board 16；X-axis guide rail B is arranged vertically on Y-axis guide rail A, X-axis guide rail B and is mounted on XAll structures on axis rail B are controlled movement by Y-axis guide rail A.In the displacement tooling 11 of the present embodiment, Y-axis guide rail A and X-axisThe motion control of guide rail B can be carried out independently.
In order to meet communication test demand and ensure that the communication in test process is stablized, the displacement tooling 11 of the present embodimentIn, the coil alignment situation of induction coil 15 and charging programmable device 14 is not influenced by the movement of translation stage 111；Induction coil 15 withThe coil relative distance of charging programmable device 14 is controlled by X-axis guide rail B, is changed with the movement of translation stage 111.
A kind of alternative mode, as shown in figure 4, charging programmable device coil tooling can also be arranged on translation stage, withThe movement of translation stage and move, and induction coil tooling is fixed to one end of X-axis guide rail, i.e., will incuded in the present embodimentCoil tooling and charging programmable device tooling exchange lower position.
The versatility that displacement tooling 11 is detected and enhanced to meet the reset function of circuit-under-test 10, in the present embodimentTooling 11 is shifted, the relative position that can be realized magnet and circuit-under-test plate 10 is adjusted.In the displacement tooling 11 of the present embodiment,Magnet is mounted in magnet tooling 114, position-adjustable of the magnet in magnet tooling 114.One end of Y-axis guide rail A, which is equipped with, to be surveyedTest plate (panel) platform 115, test platform are equipped with test board 16, are equipped with circuit-under-test plate 10 on test board 16.In displacement platform 11In, magnet tooling 114 and X-axis guide rail B are capable of the alignment case of electromagnetic switch on regulating magnet and circuit-under-test plate 10, and Y-axis is ledRail A controls X-axis guide rail B movement and realizes that the relative distance of magnet and circuit-under-test plate 10 is adjusted.
The translation stage 111 of the displacement tooling of the present embodiment is equipped with the second mounting rack 1111 and the first installation of quadrature arrangementFrame 1112, induction coil tooling 112 are removably installed on the second mounting rack 1111, and magnet tooling 114 is removably installedIn on the first mounting rack 1112, in order to ensure in magnet functional test, the magnet on X-axis guide rail B can be with circuit-under-test plateElectromagnetic switch alignment on 10, magnet tooling 114 include sliding rack 1141 and sliding block 1142, and sliding rack 1141 is by setting theVertical rails on one mounting rack 1112, which can slide up and down to, to be mounted on the first mounting rack 1112, and sliding rack 1141 is equipped with edgeThe horizontal slide rail of X-direction, sliding block 1142 by horizontal slide rail can left and right horizontal be slidably mounted on sliding rack 1141, sliding block1142 are equipped with the magnet mounting portion 1142a for installing magnet, in this way, magnet can be tested electricity relatively in magnet functional testRoad plate, which moves up and down, to be adjusted to ensure the electromagnetic switch being aligned on circuit-under-test plate.Due to induction coil tooling 112It is all disposed on translation stage 111 with magnet tooling 114, the interference in order to avoid induction coil by magnet tooling 114, this implementationThe centre distance of magnet mounting portion 1142a is not less than 5cm in the centre distance magnet tooling 114 of the induction coil tooling 112 of example.
In addition, the displacement tooling of the present embodiment is additionally provided with for the sliding rack 1141 to be locked in first mounting rackThe first locking structure on 1112 and for the second locking structure by the slider locks on the sliding rack 1141, works as magneticThe electromagnetic switch of iron and circuit-under-test plate is described after aligned by the first locking structure and the second locking structure locking magnet positionFirst locking structure and the second locking structure are preferably fastener.
The displacement tooling of the present embodiment further includes tooling base 116 in addition to comprising above-mentioned component, the X-axis guide rail B, instituteY-axis guide rail A, charging programmable device coil tooling 113 and test board platform 115 is stated to be fixed on the tooling base 116.
The test function for using the displacement tooling of the present embodiment to be related to is introduced below in conjunction with attached drawing, such as Fig. 2 andShown in Fig. 3:
One, communication function:
Control translation stage 111 is moved along X-axis guide rail B, is adjusted charging programmable device coil at a distance from induction coil, is led toCommunication distance test.
Two, magnet control function:
A control translation stage 111 is moved along X-axis guide rail B, is adjusted charging programmable device coil at a distance from induction coil, is realizedCommunication, confirmation carry out magnet control test；
B control translation stage 111 is moved along X-axis guide rail B, makes the electricity on the magnet alignment circuit-under-test plate on translation stage 111Magnetic switch；Control X-axis guide rail B is moved along the Y-axis guide rail A, makes electromagnetic switch of the magnet on circuit-under-test plate；
C control X-axis guide rail B is moved along Y-axis guide rail A, makes magnet far from the electromagnetic switch on circuit-under-test plate；
D charging programmable device coil is communicated with induction coil, read test result.
Three, hardware reset function:
A control translation stage 111 is moved along X-axis guide rail B, is adjusted charging programmable device coil at a distance from induction coil, is realizedCommunication, confirmation carry out hardware reset test；
B control translation stage 111 is moved along X-axis guide rail B, is made induction coil close to charging programmable device coil, is made magnet alignmentElectromagnetic switch on circuit-under-test plate；
C control X-axis guide rail B is moved along Y-axis guide rail A, makes electromagnetic switch of the magnet on circuit-under-test plate；
D waits for a period of time；
E control X-axis guide rail B is moved along Y-axis guide rail A, makes magnet far from the electromagnetic switch on circuit-under-test plate；Control translationPlatform 111 is moved along X-axis guide rail B, is made induction coil far from charging programmable device coil, is returned to initial position.
F charging programmable device coil is communicated with induction coil, read test result.
Four, charging distance:
A control translation stage 111 is moved along X-axis guide rail B, is adjusted charging programmable device coil at a distance from induction coil, is realizedCommunication, confirmation carry out magnet control test；
B controls translation stage 111 and moves along X-axis guide rail B according to testing requirement, so that charging programmable device coil and the line of inductionThe distance of circle respectively reaches 0cm, 1cm, 2cm, until 10cm；
C is charged in different distance and returns to test result.
Displacement tooling 11, which can be the control of above-mentioned relative position, independently to be carried out, such as be can be and shifted by being arranged inController in tooling 11 is individually controlled.And in order to improve whole convenience, the present embodiment is using 13 pairs of computer displacementsTooling 11 is controlled, i.e., the computer 13 in the present embodiment is also used to control displacement tooling 11 in charging or communication processThe relative position of variation sensing coil 15 and charging 14 coil of programmable device.
Realization of the invention is not limited to above preferred embodiment, further includes other embodiments, such as shown in Fig. 4 and Fig. 5,The difference of the displacement tooling of the displacement tooling and above preferred embodiment is: the test board and circuit-under-test plate of the displacement toolingIt is fixed at the side of the induction coil 112 of translation stage, magnet tooling is in described Y-axis guide rail one end and the relatively described Y-axis is ledRail fixed setting.Test board and induction coil, which are arranged on translation stage, is advantageous in that line between the two will not be with flatThe movement of moving stage and move, further ensure that the stability and accuracy of test.
Specifically, the test board of the displacement tooling and circuit-under-test plate are also disposed on the translation stage, the test boardPositioned at the coil for the charging programmable device being in together on translation stage or the side of induction coil, and circuit-under-test plate and the charging programThe orthogonal thereto setting of coil or induction coil of device；Magnet tooling, including be set to described Y-axis guide rail one end and the relatively described Y-axis and leadSecond fixed station 118 of rail fixed setting and the magnet positions being movably disposed on second fixed station 118 are adjustedMechanism, magnet are installed on the magnet regulating mechanism, and the position of the magnet can be adjusted by the magnet regulating mechanismSo that the magnet is aligned and is adjusted at a distance between the two with the circuit-under-test plate.
Further, the magnet positions regulating mechanism includes sliding stand 119, the first mounting rack and sliding rack, wherein slidingDynamic platform 119 can be slidably arranged in along the x axis on second fixed station 118, and the first mounting rack is fixed on the sliding stand119 and towards circuit-under-test plate side be arranged, sliding rack, which can slide up and down to, is mounted on first mounting rack towards the quiltIn the plate face of slowdown monitoring circuit plate side, the magnet is fixedly mounted on coil of the first carriage far from the charging programmable deviceOr one end of induction coil.By the setting of above-mentioned magnet positions regulating mechanism, magnet can be with respect to circuit-under-test plate in X-axis sidePosition adjustment is carried out to, Y direction and upper and lower short transverse, thus alignment required when realizing test or far from operation.
Further, be additionally provided on the sliding rack slidably sliding block, the sliding block to be equipped with for pacifying along the x axisFill the magnet mounting portion of the magnet.Position adjustment can also be carried out to magnet X-direction by sliding block.
The test function for using the displacement tooling of the alternative embodiment to be related to is introduced below in conjunction with attached drawing, is such as schemedShown in 4 and Fig. 5:
One, communication function:
Control translation stage 111 is moved along X-axis guide rail B, is adjusted charging programmable device coil at a distance from induction coil, is led toCommunication distance test.
Two, magnet control function:
A control translation stage 111 is moved along X-axis guide rail B, is adjusted charging programmable device coil at a distance from induction coil, is realizedCommunication, confirmation carry out magnet control test；
B control sliding stand 119 moves in the X-axis direction on the second fixed station 118, makes tested on magnet alignment translation stageElectromagnetic switch on circuit board；Control X-axis guide rail B is moved along the Y-axis guide rail A, keeps the electromagnetic switch of circuit-under-test plate closeMagnet；
C control X-axis guide rail B is moved along Y-axis guide rail A, makes the electromagnetic switch of circuit-under-test plate far from magnet；
D charging programmable device coil is communicated with induction coil, read test result.
Three, hardware reset function:
A control translation stage 111 is moved along X-axis guide rail B, is adjusted charging programmable device coil at a distance from induction coil, is realizedCommunication, confirmation carry out hardware reset test；
B control translation stage 111 is moved along X-axis guide rail B, makes induction coil close to charging programmable device coil, and control slidingPlatform 119 moves in the X-axis direction on the second fixed station 118, makes the electromagnetic switch on magnet alignment circuit-under-test plate；
C control X-axis guide rail B is moved along Y-axis guide rail A, makes electromagnetic switch of the magnet on circuit-under-test plate；
D waits for a period of time；
E control X-axis guide rail B is moved along Y-axis guide rail A, makes the electromagnetic switch on circuit-under-test plate far from magnet；Control translationPlatform 111 is moved along X-axis guide rail B, is made induction coil far from charging programmable device coil, is returned to initial position.
F charging programmable device coil is communicated with induction coil, read test result.
Four, charging distance:
A control translation stage 111 is moved along X-axis guide rail B, is adjusted charging programmable device coil at a distance from induction coil, is realizedCommunication, confirmation carry out magnet control test；
B controls translation stage 111 and moves along X-axis guide rail B according to testing requirement, so that charging programmable device coil and the line of inductionThe distance of circle respectively reaches 0cm, and 1cm, 2cm ... are until 10cm；
C is charged in different distance and returns to test result.
Displacement tooling 11, which can be the control of above-mentioned relative position, independently to be carried out, such as be can be and shifted by being arranged inController in tooling 11 is individually controlled.And in order to improve whole convenience, the present embodiment is using 13 pairs of computer displacementsTooling 11 is controlled, i.e., the computer 13 in the present embodiment is also used to control displacement tooling 11 in charging or communication processThe relative position of variation sensing coil 15 and charging 14 coil of programmable device.
It should be noted that the relative position of circuit-under-test plate 10 and operator are just using the displacement tooling of the present embodimentCircuit-under-test plate is plugged from golden finger socket in operator's both hands.Magnet is placed in the magnet tooling on translation stage, translationThe distance of circuit-under-test plate and magnet is adjusted along Y-axis for platform, and magnet is when testing hardware reset function by near magnet in 0-2cm keeps at a distance in 8cm or more when testing remaining project, produces to avoid magnet to the dry reed switch on circuit-under-test plateRaw unexpected effect.The coil of charging programmable device is placed in the charging programmable device coil tooling on translation stage, induction coilIt is placed in the tail portion fixing end of X-axis guide rail, the coil of charging programmable device and the distance of induction coil are adjusted along X-axis for translation stage, withMeet communication distance (0-5cm), the test of charging distance (0-2cm).Hardware reset function needs X-axis and Y-axis to cooperate, and works as testWhen hardware reset function, circuit-under-test plate and magnet distance are transferred to 0-2cm, and the coil for the programmable device that charges is at a distance from induction coilIt is transferred to 0-5cm.Magnet and charging programmable device coil are respectively positioned in the tooling for being placed in translation stage 99, and mutual distance is not less than5cm.The necessary synchronizing moving of coil and induction coil of charging programmable device, remains center shaft assignment.Circuit-under-test plate and magneticIron remains 8cm or more distance, only close when hardware reset and magnet functional test.
For the performance of detection circuit board more fully hereinafter, the present embodiment also carries out the output signal of circuit-under-test plate 10Acquisition.Power supply 12 in the present embodiment is also used to provide electric energy to charging programmable device 14, test board 16 and circuit-under-test plate 10, withThe load board output waveform signals that circuit-under-test is provided according to test board 16, e.g. electric pulse stimulation signal.
Correspondingly, this system further includes capture card 18, for acquiring the waveform signal of the output of circuit-under-test plate 10, computer13 obtain the waveform signal that circuit-under-test plate 10 exports by capture card.
The output parameter of circuit-under-test plate can also be arranged in computer 13 by charging programmable device 14 and induction coil 15.MeterThe control charging of calculation machine 13 programmable device through wireless communication, is programmed circuit-under-test plate 10, according to testing requirement exampleThe pulse output amplitude and frequency of circuit-under-test plate 10 such as can be set.
Test to output waveform, the test to charging process, can be successive with any order to the test of reset functionIt carries out, these detection operations do not conflict.
It will be understood by those skilled in the art that there are many type and model of the implantation equipment that manufacturer provides are also usual, exampleIf any brain pacemaker, spinal stimulator etc..In order to be able to detect detection system provided by the invention from different implantation equipmentCircuit board, as a preferred embodiment, the charging programmable device 14 in the present embodiment is also used to through induction coil 15The intrinsic information of circuit-under-test plate 10 is read, computer 13 can be determined according to the intrinsic information for controlling the member on test board 16The signal of part.It is possible thereby to provide suitable load signal to the circuit board of different model, make this system that there is preferable extensionProperty.
The process of above-mentioned reading intrinsic information should carry out before detection starts, in summary detection function, the present inventionEmbodiment also provides a kind of detection method, and this method is executed by above-mentioned computer 13, as shown in fig. 6, this method includes following stepIt is rapid:
S1, the intrinsic information of the circuit-under-test plate 10 of implantation equipment is obtained by charging programmable device 14, which can rememberRecord also can recorde in charging programmable device 14 in circuit-under-test plate 10, specifically can be type information, type information etc.Deng；
S2A determines distance value and charge parameter according to intrinsic information, and what this distance value indicated is charging 14 coil of programmable deviceAt a distance between induction coil 15；Charge parameter for example can be charging current.It, can will be each intrinsic before being testedInformation and its corresponding testing scheme (including distance value and charge parameter) are stored in computer 13, are tested after detection startsWhen plate 16 is connect with circuit-under-test plate 10, computer 13 can get intrinsic information, and inquire its corresponding testing scheme(including distance value and charge parameter).
Charge parameter is sent to charging programmable device 14 and circuit-under-test plate 10 by S3A.Charge parameter packet in the present embodimentIt includes the power output parameter for the programmable device 14 that is suitable for charging and the electric energy suitable for circuit-under-test plate 10 receives parameter.These chargingsParameter can specify charging programmable device 14 for example with some or multiple charging currents output electric energy, can also correspondingly specify quiltSlowdown monitoring circuit plate 10 switches suitable resistance parameter to adapt to the size of the charging current.As described above, the connection of computer 13 isTest board 16, the charge parameter can pass to circuit-under-test plate 10 by test board 16.
S4A, according to distance value control Mobile tool 11 adjustment charging programmable device 14 coil and induction coil 15 between away fromFrom power supply 12 is arranged to be electrically charged state by computer 13, and controls charging programmable device 14 and pass through induction coil 15 and tested electricityRoad plate 10 is based on charge parameter and charges to 12 inlet wire of power supply.This step can there are many specific embodiments, such as above-mentioned distanceOne or more can be set in value, both can also make fixed or multiple and different apart from upper carry out wireless charging at oneElectricity；Each apart from upper, one or more is also can be set in corresponding charge parameter, flexibly comprehensive according to product and user demandDetect charging effect in ground.
S5A receives the running parameter that feeds back according to charge parameter of circuit-under-test plate 10, specifically can by test board 16 comeThe running parameter that the sensor on circuit-under-test plate 10 is recorded is read, such as may include charging voltage, charging current, temperatureValue etc.；
For certain running parameters, such as temperature value, also there are some peripheral circuits on test board 16, it can in peripheral circuitTo include that temperature sampling resistance namely test board 16 can also acquire the work such as generated temperature in charging process simultaneously and joinNumber, so above-mentioned running parameter can also include parameter detected by test board 16.
Whether normal S6A judges circuit-under-test plate 10 according to running parameter, such as can judge circuit-under-test plate 10 respectivelyCharging voltage, charging current, temperature value etc. whether meet expection, so that it is determined that whether its state normal.
Detection method provided in an embodiment of the present invention is determined accordingly by obtaining the intrinsic information of circuit-under-test plate automaticallyTest parameter, send suitable charge parameter to charging programmable device and circuit-under-test plate, circuit-under-test plate made to be in practical workMake under environment, while changing coil and the relative position of induction coil of the programmable device that charges using displacement tooling, to simulate useThe charging operations that family is likely to occur in actual use, this method control charging process by computer and read circuit-under-testThe running parameter of plate carries out the stronger detection of specific aim to the circuit board of implantation equipment with this, which realizes automationOperation, working efficiency with higher.
In order to improve convenience and accuracy, above-mentioned intrinsic information is preferably stored in circuit-under-test plate 10, above-mentioned stepsS1 can specifically include following steps:
S11 sends enabling signal to charging programmable device 14, and waits programmable device 14 to be charged by induction coil 15 and be testedCircuit board 10 is communicated to obtain intrinsic information.
S12 receives the intrinsic information that charging programmable device 14 is fed back.
Enabling signal can be simple digital signal, and charging programmable device 14 can be by wireless after receiving enabling signalMode sends handshake to circuit-under-test plate 10, which can be a waveform signal；Circuit-under-test plate 10 can parseThe handshake is simultaneously responded, and intrinsic information is sent to charging programmable device 14, then re-sends to computer 13.
As a preferred embodiment, the charge parameter in the present embodiment includes charging time and charging current,In each distance value respectively correspond identical charging time and multiple charging currents.Such as four distance value X1 ... can be presetX4, charging time t, charging current A1 ... A4, these parameters can form multiple combinations, and S4A may include steps of:
S4A1, control Mobile tool 11 will be separately positioned on each distance between charging programmable device 14 and induction coil 15 and above stopStay the corresponding charging time；
S4A2, when stopping, control charging programmable device 14 is based respectively on multiple by induction coil 15 and circuit-under-test plate 10Charging current charges to power supply 12.
Such as can be in X1 apart from upper stop at least 4*t (four length identical period), and divide in each periodNot Cai Yong A1 ... A4 charge, thus complete the corresponding charging action of X1；Then distance is adjusted to X2, equally stops fourA length identical period, and A1 is respectively adopted in each period ... A4 charges, and uses later in X3, X4 distanceIdentical mode of operation, the corresponding charging action of X4 that X1 can be completed ....
S5A is carried out with S4A is synchronous, and computer 13 acquires the work ginseng of circuit-under-test plate 10 in above-mentioned charging process in real timeNumber, it is hereby achieved that four groups of parameters, i.e. running parameter corresponding to four kinds of different distances, wherein include again in every group of parameter withThe corresponding running parameter of four charging currents.
Above-mentioned preferred detection scheme can detect accurately under different distance, circuit-under-test plate under different charge parametersThus working condition improves the reliability of testing result.
Can also include: after above-mentioned steps S1 to further increase reliability and the convenience of detection operation
S1A determines criteria parameter according to intrinsic information, this step synchronous with S2A can carry out.Criteria parameter therein is answeredIt when corresponding with running parameter collected in step S5A, such as may include standard charge voltage, standard charging current, temperatureSpend upper limit value etc..
In the case where that can obtain criteria parameter, step S6A be may include steps of:
Running parameter is compared S6A1 with criteria parameter；
Whether normal S6A2 judges circuit-under-test plate 10 according to comparison result, such as judges running parameter and criteria parameterWhether consistent or the two error whether within the acceptable range, so that it is determined that whether circuit-under-test plate 10 normal.
The detection operation of output waveform is introduced below.After step S1, computer 13 can control charging and compileMode is configured circuit-under-test plate 10, such as its output amplitude and frequency can be set etc. journey device 14 by wireless communication,The detection process for then carrying out output signal, specifically, as shown in fig. 7, this method can also include the following steps:
S2B determines that load parameter and power supply parameter, load parameter and power supply parameter are also possible to test according to intrinsic informationA part of content of scheme, the step for can it is synchronous with above-mentioned steps S2A carry out.The load of the product of each type or modelParameter and power supply parameter are not quite similar, and load parameter is, for example, nerve stimulator 1k resistance, 500 ohm of electricity of spinal stimulatorResistance；Power supply parameter is, for example, supply voltage etc..
S3B controls power supply 12 according to power supply parameter and powers to circuit-under-test plate 10, and power supply 12 is arranged to defeated by computer 13Energy state out powers to simulate actual working state to circuit-under-test plate 10；
S4B sends load parameter to the test board 16 of connection circuit-under-test plate 10, and test board 16 will be negative according to what is receivedIt carries parameter and adjusts the element state of itself to simulate the load of circuit-under-test plate 10, make circuit-under-test plate 10 in the shadow of load parameterRing lower output waveform signals；
S5B obtains the waveform signal that circuit-under-test plate 10 exports by capture card 18；
S6B judges whether circuit-under-test plate 10 is normal according to waveform signal.
Above-mentioned steps S3B-S6B is not interfere with each other with step S3A-S6A isolated execution, and this method is defeated to circuit-under-test plate 10Signal is automatically detected out, further increases the comprehensive and convenience of detection operation.
Judgement for output waveform similarly with step S1A can also include: after step S1
S1B determines criterion signal according to intrinsic information；
Step S6B may include: in the case
Waveform signal is compared S6B1 with criterion signal；
S6B2 judges whether circuit-under-test plate 10 is normal, and there are many concrete modes of signal fusing according to comparison result, thisInvention repeats no more.
In addition to the detection of charge function and output signal, the step of detection 10 reset function of circuit-under-test plate can also be addedSuddenly, this step carries out in the state of guaranteeing that power supply 12 is in and is powered for circuit-under-test plate 10, the control movement of computer 13Magnet in tooling 11 examines whether circuit-under-test plate 10 is reset close to circuit-under-test plate 10, while by charging programmable device 14(various parameters recovery initial value).
The embodiment of the invention provides a kind of computer equipments, comprising: at least one processor；And at least oneManage the memory of device communication connection；Wherein, memory is stored with the computer program that can be executed by least one processor, calculatesMachine program is executed by least one processor, so that at least one processor executes above-mentioned implantation medical instrument circuit board detecting sideMethod.
Below with reference to Fig. 8, Fig. 9 in the embodiment of the present invention test board 16 and circuit-under-test plate 10 describe in detail.
The embodiment of the invention provides a kind of circuit-under-test plate 10, which includes base portion 101 and tested portion 102,In be tested portion 102 be implanted into equipment circuit board.
Base portion 101 is equipped with the through-hole for accommodating tested portion 102.In the present embodiment, being tested portion 102 is a kind of approximationThe structure of arc, correspondingly the shape of an adaptation is excavated to form through-hole in 101 middle part of base portion.
The edge in tested portion 102 and the edge of through-hole are connected by several cleavable portions 103, are tested portion 102 and base portion 101It is in same plane.In order to which the comparison for connecting the two is firm, the present embodiment is provided with multiple cleavable portions 103, cleavableThere are gaps for position other than portion 103.
One end of base portion 101, the i.e. upper position of Fig. 8 are equipped with multiple for connecting external test facility (such as above-mentioned realityApply the test board 16 in example) conductive contact blade 104, these conductive contact blades 104 formed finger plug (phase is set on test board 16The golden finger socket answered) it is laid on the end of base portion 101.Conductive contact blade 104 is respectively by being arranged in base portion 101 and tested portionConducting wire in 102 connects each tie point in tested portion 102, and conducting wire can pass through base portion by the cleavable portion 103 closed onGap between 101 and tested portion 102.
So set, when circuit-under-test plate 10 be inserted into test board 16 after, make on test board 16 element (peripheral circuit, such asSampling resistor, output electrode etc.) and tested portion 102 on tie point between form electrical connection, it is negative that test board 16 provides simulationIt carries, power supply is provided, charge coil and communication coil are provided, titanium shell temperature sampling artifical resistance and battery temperature sampling simulation are providedResistance is given by tested portion 102, and tested portion 102 is made to generate response.
The circuit-under-test plate provided according to embodiments of the present invention, base portion surrounding surround tested portion, when being detectedWhen, the equipment such as operator or manipulator can clamp base portion and carry out grafting to test equipment, base portion as actual loading object,Preferable protective effect can be played to tested portion, can be cut off in tested portion from base portion after completing detection, so that entirelyDetection process safety and conveniently.
Tested portion 102 in circuit-under-test plate provided in an embodiment of the present invention is equipped with charge coil tie point 105 and leads toBelieve antenna connector 106, the two all extends to tested 102 outside of portion, and the two is distributed in the two of tested portion 102 in the present embodimentSide extends outwardly from rectilinear end.In order to coil tie point carry out effective protection, the area of through-hole need to be large enough to hold tested portion,Charge coil tie point 105 and communication coil tie point 106, the shape of through-hole are also set with the length that antenna connector stretches outIt sets.Further, charging antenna connector 105 and communication antenna tie point 106 pass through several cleavable portions 103 and through-hole respectivelyEdge connection.
In order to realize the detection to charge function, on circuit-under-test plate 10 tie point relevant to charge function be required toTest board 16 is connected, and the conductive contact blade 104 in the present embodiment includes for connecting charge coil tie point 105 in tested portion thusWith the first conductive contact blade of communication coil tie point 106.System as shown in connection with fig. 1, when charging programmable device 14 passes through induction coilWhen 15 charging, the charging antenna and communication antenna that test board 16 is connected are started to work, to make 105 He of charge coil tie pointCommunication coil tie point 106 receives signal.
Conductive contact blade 104 further includes the second conductive contact blade for connecting temperature sampling ohmic connection points 107 in tested portion.Such as second conductive contact blade may include conductive contact blade for connecting titanium skin temperature sampling resistor tie point and be used forConnect the conductive contact blade of battery temperature sampling resistor tie point.System as shown in connection with fig. 1, when charging programmable device 14 passes through the line of inductionWhen 15 charging of circle, titanium skin temperature sampling resistor and battery temperature sampling resistor on test board 16 generate temperature signal,And the temperature sampling ohmic connection points 107 of circuit-under-test plate 10 are transferred to by the second conductive contact blade, so that the phase in tested portionClose acquisition of the element completion to temperature value.
Conductive contact blade 104 further includes the third conductive contact blade for connecting tie point 108 of powering in tested portion, so that testedPortion 102 connects power supply 12 and realizes power supply or charging operations.
In order to realize the detection to output waveform, conductive contact blade 104 further includes for connecting signal output electricity in tested portion4th conductive contact blade of pole tie point 109.In the present embodiment, it is tested portion 102 and is equipped with 16 signal output electrode connectionsPoint, base portion 101 be equipped with conductive contact blade corresponding with each electrode connection points, respectively with multiple load phases on test board 16Even.System as shown in connection with fig. 1, when power supply 12 start power supply when, signal output electrode tie point 109 by output waveform signals, andThe signal output electrode being transferred on test board 16 passes to computer 13 eventually by capture card 18.
Conductive contact blade 104 further includes the 5th conductive contact blade for write-in program, is mainly used for on circuit-under-test plate 10Single-chip microcontroller program, when welding circuit board is completed and after reliability test, the autotest program that single-chip microcontroller may be written isDifferent, the efficiency of write-in program can be improved in the 5th conductive contact blade of setting.
The specification of the base portion 101 of circuit-under-test plate provided in an embodiment of the present invention can be fixed namely a kind of base portion101 can be adapted for the tested portion 102 of different product, and for the tested portion 102 of different product, tie point is arranged thereonType may not be identical；Quantity may not be identical, such as the quantity of output electrode tie point is different.It is needed on base portion 101 thusEnough conductive contact blades are set, and to cope with different tested portions 102, the quantity of conductive contact blade 104 needs to be greater than or equal to quiltThe quantity of tie point in survey portion 102 is then not necessarily each tested portion 102 in this way and produces different base portions to improve versatility101, production cost can be reduced.
The circuit boards of difference implantation products, golden finger pipe leg defines identical, and test board 16 can be general, i.e. one piece of test board16 can take into account DBS (deep brain stimulation, deep brain stimulation), VNS (vagusneve stimulation, fanWalk nerve stimulation), SCS (Spinal cord stimulation, spinal cord stimulation trial) and SNM (SacralNeuromodulation, sacral nerve stimulation system) etc. charging and non-charge prepd, versatility is good, and testing efficiency is high.
Correspondingly, the embodiment of the invention provides a kind of implantation medical instrument detection circuit board, as above-mentioned test board 16,Test board 16 includes: as shown in Figure 9
Circuit-under-test plate interconnecting piece 161, for connecting circuit-under-test plate 10, in the present embodiment using golden finger socketForm is connect with the finger plug (conductive sheets of end arranged cells) of circuit-under-test plate 10, and golden finger socket can take into account different thicknessSpend circuit board.
Circuit-under-test plate peripheral circuit 162, including a variety of electrical components are needed for implantation equipment and tested electricRoad plate 10 cooperates the element, such as sampling resistor, communication antenna, output electrode etc. to work.These elements pass through testedCircuit board interconnecting piece 161 is connected with the tie point on circuit-under-test plate 10, simulates the actual condition of circuit-under-test plate, it is ensured that testedCircuit board 10 works normally.
Load unit 163, for simulating the load of circuit-under-test plate.Implantation equipment will bear certain bear in human bodyIt carries, the load of the implantation equipment of variety classes and purposes is not identical, and a variety of load elements can be set to simulate difference in this elementThe load that circuit-under-test plate 10 is born, such as can have nerve stimulator 1k resistance, 500 Ohmic resistances of spinal stimulatorDeng.
Selecting unit 164 and acquisition apparatus connecting unit 165.It acquires apparatus connecting unit 165 and quilt is connected by selecting unit 164Electrical component in slowdown monitoring circuit plate peripheral circuit 162, such as can connect output electrode.The wherein effect of selecting unit 164 isThe connected relation of the control acquisition electrical component connected to it of apparatus connecting unit 165, acquisition apparatus connecting unit 165 connect outside and adoptCollect equipment, i.e. capture card 18, capture card 18 can obtain the signal that be connected to electrical component issues under load effect.
In actual conditions, peripheral circuit generally includes more electrical component, and by taking output electrode as an example, brain pacemaker mayWith more than ten output electrodes, each output electrode can individually issue stimulus signal.In order to accurately be detected, detectProgram only meeting control section output electrode may issue signal in the same time, and correspondingly, acquisition apparatus connecting unit 165 can lead toIt crosses selecting unit 164 and connects all output electrodes, and same selection of time unit 164 can be connected only and wherein export letterNumber partial electrode.
The implantation medical instrument detection circuit board provided according to embodiments of the present invention, can be by circuit-under-test plate and external inspectionMeasurement equipment connects, and so that circuit-under-test template die is intended actual working state by peripheral circuit and load unit, utilizes simultaneouslySelecting unit controls the connected state of external equipment and detected element, to obtain the detected member that circuit-under-test plate is controlledThe signal that part issues, the system are not required to rely on other elements in implantation equipment, carry out needle to the circuit board of implantation medical instrumentTo the stronger detection of property, while flexible setting can be carried out to selecting unit, it is with higher to adapt to different detection demandsWorking efficiency.
As a preferred embodiment, as shown in Figure 10, circuit-under-test plate peripheral circuit 162 includes implantable medical instrumentMultiple output electrodes 1621 of device and the metal shell interface 1622 of implantation medical instrument.
Selecting unit 164 includes multiple analog switches, and analog switch connects corresponding output electrode correspondingly respectively1621 and metal shell interface 1622, wherein one end connection metal shell of metal shell interface 1622 (is not shown, gold in Figure 10Belong to the anode that shell can be used as pulse output), one of analog switch of other end connection selecting unit 164 leads to as a result,Cross the disconnection of analog switch and the connected relation of closed state control output electrode and acquisition apparatus connecting unit 165, and controlAcquire the connected relation of apparatus connecting unit 165 and metal shell.It acquires apparatus connecting unit 165 and acquires equipment output electrode to outsideThe waveform signal issued under load effect.
In the present embodiment, selecting unit 164 is set there are two switching group, and acquisition apparatus connecting unit 165 is equipped with correspondingTwo access interface Out1 and Out2, each access interface connect the electric appliance member on peripheral circuit by different switching groups respectivelyPart, i.e. output electrode and metal shell interface.In the present embodiment, one end of port Out1 connection first switch group 1641, theThe other end of one switching group 1641 connects whole output electrodes and metal shell interface；Port Out2 connection second switch group 1642One end, the other end of second switch group 1642 connects whole output electrodes and metal shell interface.
Two port Out1 and Out2 for acquiring apparatus connecting unit 165 and 16 in circuit-under-test plate peripheral circuit 162A output electrode 1621 is connected with any two in metal shell interface 1622.First switch group 1641 and second switch group1642 state can be controlled by single-chip microcontroller.Specifically, any two output electrode, is connect by connecting with computerMouthful, serial port chip and single-chip microcontroller are realized by computer according to testing requirement to first switch group 1641 and second switch group 1642The control of middle corresponding analog switch, to realize the connection of capture card and electrode output.
In practical application, in order to acquire the output signal of more multichannel simultaneously, more access interface and more also can be setMore switching groups.
In a preferred embodiment, load unit 163 may include:
Multiple groups load elements 1631 are respectively used to the load of simulation variety classes implantation equipment；
Multiple analog switches, these analog switches form third switching group 1632, for controlling multiple groups load elements 1631With the connection status of acquisition apparatus connecting unit 165 and output electrode 1621.The both ends of two port Out1 and Out2 and loadIt is connected.By being realized by computer according to testing requirement to third with computer connecting interface, serial port chip and single-chip microcontrollerThe control of analog switch is corresponded in switching group 1632, to realize the connection of two port Out1 and Out2 and different loads.It canChoosing load includes that DBS is loaded, SCS load, VNS load and SNM (Sacral Neuromodulation, sacral nerve stimulation system)Load etc..
The load for being achieved in different product classification is connected with any two output electrode, while circuit-under-test plate 10 exportsWaveform is connected to port Out1 and Out2, feeds back to capture card 18 and is handled.
About the power supply of test board 16 and the acquisition of charging current, power supply 12 and ammeter 17 can be connected to test board16.Power supply 12 can provide duplex feeding, is variable power voltage supply 10 (range is 4.1V~2V) all the way, simulates electricity using batterySource (charge prepd does charge function test) connects circuit-under-test plate 10 by the golden finger socket on test board 16 and powers；SeparatelyIt is constant voltage all the way, is powered by voltage chips to the electrical component on test board 16.
Specifically, circuit-under-test plate peripheral circuit 162 includes power supply circuit, one end series connection external power supply 12 of power supply circuitWith ammeter 17, the other end connects tie point of powering accordingly on circuit-under-test plate 10.
In charging detection application, it is defeated by circuit-under-test plate 10 that power supply circuit can be used for receiving external charging programmable deviceThe electric energy entered, and charge to external power supply 12, ammeter 17 can show charging current.
In other performance detections application such as signal output, power supply circuit can be used for receiving the electricity of the input of external power supply 12Can, and circuit-under-test plate 10 is powered.
For different product, it can choose circuit-under-test plate 10 and access different charging and communication antenna, such as SCS fillsElectricity and the charging of communication antenna and DBS and communication antenna etc..In a preferred embodiment, circuit-under-test plate peripheral circuit 162It may include a variety of communication antennas and/or a variety of charging antennas.It specifically can use the list in computer control detection circuit boardPiece machine connects a kind of communication antenna and/or a kind of charging antenna by single-chip microcontroller setting circuit-under-test plate 10.
Circuit-under-test plate peripheral circuit can also include outside temperature sampling resistance, such as battery temperature sampling resistor and metalShell temperature sampling resistance, temperature sampling resistance is connected by circuit-under-test plate interconnecting piece 161 to be connected accordingly on circuit-under-test plate 10Contact.Acquisition for temperature parameter can obtain and the programmable device that charges in vitro is carried out wireless communication with circuit-under-test plate 10, temperature sampling resistance is connected with device without separately setting port.
The embodiment of the invention also provides a kind of method tested automatically for a variety of active implantation medical instruments, the partyMethod can execute by the single-chip microcontroller in test board 16, for control the element in test board 16 realize to circuit-under-test plate 10 fromDynamic test operation, this method comprises the following steps as shown in figure 11:
S1C receives load handover information and electricity that computer 13 is determined according to the intrinsic information of tested implantation medical instrumentPole handover information, the intrinsic information can be sent by 16 communication antenna of test board and the antenna of charging programmable device 14, be hadBody can refer to the step S1 of method shown in Fig. 6；
S2C connects load elements according to each electrode that load handover information controls tested implantation medical instrument, in controlIt states load unit 163 and connects load elements corresponding with current circuit-under-test plate 10；
S3C connects external acquisition equipment, control according to each electrode that the control of electrode handover information is connected to load elementsAbove-mentioned selecting unit 164 connects part output electrode or metal shell, so that external acquisition equipment obtains the electrode connected and existsThe signal issued under the influence of the load elements of connection.
The structure of load unit 163, above-mentioned steps S2C may include: in corresponding above-mentioned preferred embodiment
S2C1 determines a mould according to load handover information from multiple analog switches for being separately connected different loads elementQuasi- switch, specifically according to load handover information from selection one mould corresponding with the information in above-mentioned third switching group 1632Quasi- switch, wherein load handover information may include for determining the information for the load elements for simulating DBS, for determining VNS'sThe information of load elements, the information of load elements for determining SCS, the information of load elements for determining SNM.Load is cutIt changes information specifically and the number for including analog switch can be used to express.
S2C2 is closed identified analog switch so that load elements of its connection connect each of tested implantation medical instrumentA electrode changes load elements 1631 and acquisition apparatus connecting unit 165 and output electrode 1621 by third switching group 1632Connection status.
The structure of selecting unit 164, above-mentioned steps S3C may include steps of in corresponding above-mentioned preferred embodiment:
S3C1 determines at least one switching group, plurality of switching group according to electrode handover information from multiple switch groupOne end be separately connected load elements and external acquisition equipment, the other end is separately connected whole electrodes.Specifically cut according to electrodeIt changes information and selects one or whole switching groups, electrode switching letter from above-mentioned first switch group 1641 and second switch group 1642It may include the number of switching group in breath.
S3C2, control determined by switching group execute closed action so that electrode of its connection connect it is external acquire equipment,Change output electrode, metal shell and acquisition apparatus connecting unit 165 by first switch group 1641 and/or second switch group 1642Connection relationship.
Further, S3C2 may include steps of:
S3C21 determines at least one analog switch according to electrode handover information in determining switching group, plurality of to openPass group respectively includes multiple analog switches, and each analog switch is separately connected different electrodes.Specifically switched according to electrode and is believedBreath selects one or more simulations corresponding with the information to open from above-mentioned first switch group 1641 and/or second switch group 1642It closes, may include the number of analog switch in electrode handover information；
S3C22, be closed determined by analog switch so that electrode of its connection connect it is external acquire equipment, opened by firstAnalog switch in pass group 1641 and/or second switch group 1642 changes output electrode, metal shell and acquisition apparatus connecting unit165 connection relationship.
Correspondingly, the embodiment of the present invention also provides a kind of automatic testing equipment for a variety of active implantation medical instruments,The device is the computer program virtual bench being arranged in the single-chip microcontroller of test board 16, and the device as shown in figure 12 includes:
Receiving module 121 is cut for receiving computer according to the load that the intrinsic information of tested implantation medical instrument determinesChange information and electrode handover information；
Load control module 122, each electrode for controlling tested implantation medical instrument according to load handover information connectConnect load elements；
Electrode control module 123, each electrode for being connected to load elements according to the control of electrode handover information are connectedOutside acquisition equipment, so that external acquisition equipment obtains the signal that the electrode connected issues under the influence of the load elements of connection.
As a preferred embodiment, load control module 122 may include:
The first analog switch selecting module, for according to load handover information from multiple different loads elements that are separately connectedAn analog switch is determined in analog switch；
First analog switch control module, for being closed identified analog switch, so that the load elements of its connection connectEach electrode of logical tested implantation medical instrument.
As a preferred embodiment, electrode control module 123 includes:
Switching group selecting module, for determining at least one switching group from multiple switch group according to electrode handover information,One end of plurality of switching group is separately connected load elements and external acquisition equipment, and the other end is separately connected whole electrodes；
Switching group control module executes closed action so that electrode of its connection is connected for controlling identified switching groupOutside acquisition equipment.
Further, switching group control module includes:
Second analog switch selecting module, for determining at least one in determining switching group according to electrode handover informationAnalog switch, plurality of switching group respectively include multiple analog switches, and each analog switch is separately connected different electrodes；
Second analog switch control module, for being closed identified analog switch so that electrode of its connection connects outsideAcquire equipment.
The method and device tested automatically for a variety of active implantation medical instruments provided according to embodiments of the present invention,The electrode that implantation medical instrument can be controlled by load handover information connects the load elements of respective type, and is cut by electrodeIt changes information control and is connected to each electrode of load elements and the connection status of external acquisition equipment, to obtain implantable medical instrumentIt is stronger that the signal that the electrode of device is issued in the case where simulating actual condition, this method and device carry out specific aim to implantation medical instrumentDetection is adapted to a variety of active implantable medical instrument by carrying out flexible setting to load handover information and electrode handover informationThe detection demand of device, working efficiency with higher.
Particular embodiments described above has carried out further in detail the purpose of the present invention, technical scheme and beneficial effectsDescribe in detail it is bright, it should be understood that the above is only a specific embodiment of the present invention, the guarantor being not intended to limit the present inventionRange is protected, all within the spirits and principles of the present invention, any modification, equivalent substitution, improvement and etc. done should be included in thisWithin the protection scope of invention.