技术领域technical field
本发明涉及一种固体材料双向反射分布函数测量装置，属于材料辐射特性测量技术领域。The invention relates to a measuring device for a bidirectional reflection distribution function of a solid material, which belongs to the technical field of material radiation characteristic measurement.
背景技术Background technique
双向反射分布函数(BRDF)最早是由美国学者Nicodemus于1970年提出，用以描述各种不同表面的空间反射分布特性，主要由材料表面的粗糙度、材料的介电常数、入射光的波长以及入射光的偏振特性等因素共同决定。双向反射分布函数广泛应用于航空航天、遥感探测、计算机图像处理、自然灾害及气候研究等诸多领域，除此之外，双向反射分布函数的测量结果也可以用于得到一些目标材料的发射率及吸收率。在激光主动探测、道路交通安全等领域更需要与入射光逆向的反射特性—后向反射特性。目前，常见的BRDF测量装置都着眼于与入射光方向不同的其他方向的反射量，较少涉及后向反射。少有的几种针对后向反射的测量装置都具有光路复杂、调节困难的缺点，很难实现对含后向反射的BRDF的快速、简便的测量。The bidirectional reflectance distribution function (BRDF) was first proposed by American scholar Nicodemus in 1970 to describe the spatial reflection distribution characteristics of various surfaces, mainly by the roughness of the material surface, the dielectric constant of the material, the wavelength of the incident light and Factors such as the polarization characteristics of the incident light are jointly determined. The bidirectional reflectance distribution function is widely used in many fields such as aerospace, remote sensing detection, computer image processing, natural disasters and climate research. In addition, the measurement results of the bidirectional reflectance distribution function can also be used to obtain the emissivity and Absorption rate. In the fields of laser active detection, road traffic safety and other fields, the reflection characteristics that are reverse to the incident light - the retroreflection characteristics are more needed. At present, common BRDF measurement devices focus on the amount of reflection in other directions different from the direction of the incident light, and rarely involve back reflection. The few measuring devices for retroreflection all have the disadvantages of complex optical path and difficult adjustment, and it is difficult to realize fast and simple measurement of BRDF with retroreflection.
发明内容Contents of the invention
本发明为了解决当前含后向反射的BRDF的测量装置测量相应速度慢，结构复杂的问题，提供了一种简便快速、全方向的样品双向反射分布函数的测量装置，所采取的技术方案如下：In order to solve the problem of slow measurement speed and complex structure of the current measuring device containing retroreflective BRDF, the present invention provides a simple, fast and omnidirectional measuring device for the bidirectional reflectance distribution function of samples. The technical scheme adopted is as follows:
一种固体材料双向反射分布函数测量装置，所述装置包括样品座1、测量孔3、光纤匹配套管4、分路反射探测光纤束5、激光器控制台6、光功率计7、光纤8、紧定螺钉9、球形罩壳10、升降螺栓11和电脑12；A device for measuring the bidirectional reflection distribution function of solid materials, the device includes a sample holder 1, a measurement hole 3, an optical fiber matching sleeve 4, a shunt reflection detection optical fiber bundle 5, a laser console 6, an optical power meter 7, an optical fiber 8, Set screw 9, spherical cover 10, lifting bolt 11 and computer 12;
所述样品座1通过升降螺栓11安装于所述球形罩壳10内部；所述样品座1上设有左右对称的两个紧定螺钉9；所述测量孔3均匀分布于所述球形罩壳10上；所述球形罩壳10的壳体上设有两个光纤匹配套管4；一个所述光纤匹配套管4通过分路反射探测光纤束5与所述激光器控制台和光功率计7进行信号传输；另一个所述光纤匹配套管4通过光纤8与光功率计7进行信号传输；所述光功率计7的信号输出端与所述电脑12的信号输入端相连。The sample holder 1 is installed inside the spherical casing 10 through lifting bolts 11; the sample holder 1 is provided with two left and right symmetrical set screws 9; the measuring holes 3 are evenly distributed in the spherical casing 10; two optical fiber matching sleeves 4 are provided on the housing of the spherical cover 10; one of the optical fiber matching sleeves 4 communicates with the laser control console and the optical power meter 7 through the shunt reflection detection fiber bundle 5 Signal transmission; the other optical fiber matching sleeve 4 performs signal transmission with the optical power meter 7 through the optical fiber 8; the signal output end of the optical power meter 7 is connected to the signal input end of the computer 12 .
进一步地，所述装置检测的样品通过紧定螺钉9设置于所述样品座1上表面的中心位置；所述样品座1的高度和水平度通过所述升降螺栓11调节使样品2上表面与球形罩壳10的半球底面共面。Further, the sample detected by the device is set on the center position of the upper surface of the sample seat 1 through the set screw 9; the height and level of the sample seat 1 are adjusted by the lifting bolt 11 to make the upper surface of the sample 2 and the The bottom surfaces of the hemispheres of the spherical housing 10 are coplanar.
进一步地，所述样片2厚度<30mm，直径范围为45mm-90mm。Further, the sample piece 2 has a thickness of <30mm and a diameter ranging from 45mm to 90mm.
进一步地，所述固体材料双向反射分布函数测量装置的测量步骤如下：Further, the measurement steps of the solid material bidirectional reflectance distribution function measurement device are as follows:
步骤一、在测量进行之前，连接光路并对光纤进行固定；启动激光器控制台6，设定发射功率及温度，打开激光器控制台温度控制，将温度控制在25℃；Step 1. Before the measurement, connect the optical path and fix the optical fiber; start the laser console 6, set the transmission power and temperature, turn on the temperature control of the laser console, and control the temperature at 25°C;
步骤二、安装标准白板到样品座上，使用紧定螺钉对所述标准白板位置固定，并调整样品座高度及水平度，使标准白板上表面与球形罩壳的半球底面共面；Step 2. Install the standard whiteboard on the sample holder, fix the position of the standard whiteboard with set screws, and adjust the height and level of the sample holder so that the upper surface of the standard whiteboard is coplanar with the hemispherical bottom of the spherical casing;
步骤三、用光纤匹配套管4更改分路探测光纤束5或光纤8在球形罩壳10上的位置，测量标准白板的各个方向的反射功率并记为P白板；Step 3: Use the optical fiber matching sleeve 4 to change the position of the branch detection optical fiber bundle 5 or the optical fiber 8 on the spherical housing 10, measure the reflected power in all directions of the standard whiteboard and record it as Pwhiteboard ;
步骤四、将标准白板更换为待测样品，重复步骤二、步骤三、步骤四，测得数据记为P样品；Step 4. Replace the standard white board with the sample to be tested, repeat Step 2, Step 3, and Step 4, and record the measured data as Psample ;
步骤五、然后根据步骤三和步骤四分别获得的数据P白板和p样品，通过测得白板功率的值与样品功率的比较计算间接测得固体材料双向反射分布函数的值；Step 5, then according to the data Pwhiteboard and psample obtained respectively in step 3 and step 4, the value of the bireflection distribution function of the solid material is indirectly measured by comparing the value of the measured whiteboard power with the sample power;
进一步地，步骤五所述固体材料双向反射分布函数间接测量计算方法的模型中，以标准白板作为参考标准，并将其反射视作比较理想的漫射体，其各方向双向反射分布函数值均为用同方向样品反射得到的功率值与白板反射得到的功率值进行比较，即可测得样品的在该方向的双向反射分布函数值，其具体计算模型如下：Further, in the model of the indirect measurement and calculation method of the bidirectional reflectance distribution function of solid materials described in step five, the standard whiteboard is used as a reference standard, and its reflection is regarded as an ideal diffuser, and the values of the bidirectional reflectance distribution function in each direction are equal to for By comparing the power value obtained by the reflection of the sample in the same direction with the power value obtained by the reflection of the whiteboard, the value of the bidirectional reflection distribution function of the sample in this direction can be measured. The specific calculation model is as follows:
其中：f——固体材料双向反射分布函数的值；Where: f - the value of the bidirectional reflectance distribution function of the solid material;
P样品——测得的样品的反射光功率；Psample - the measured reflected light power of the sample;
P白板——测得的白板的反射光功率；Pwhiteboard - the measured reflected light power of the whiteboard;
θi——入射光线的天顶角；θi ——zenith angle of incident light;
——入射光线的方向角； - the direction angle of the incident light;
θr——反射光线的天顶角；θr ——zenith angle of reflected light;
——反射光线的方向角； - the direction angle of the reflected light;
λ——入射光波长；λ—wavelength of incident light;
ρ——标准白板的反射率。ρ——reflectivity of standard whiteboard.
进一步地，所述球形罩壳9上按5°天顶角间距，60°方向角间距均匀分布有103个圆形的测量孔3，所述测量孔3分别通过光纤匹配套管4与分路反射探测光纤束5或光纤8相连接，实现对半球空间内103个方向进行测量。Further, 103 circular measurement holes 3 are evenly distributed on the spherical case 9 according to a 5° zenith angle interval and a 60° direction angle interval, and the measurement holes 3 are connected to the shunt through the optical fiber matching sleeve 4 respectively. The reflection detection optical fiber bundle 5 or the optical fiber 8 are connected to realize the measurement of 103 directions in the hemispherical space.
进一步地，所述分路反射探测光纤束5由七根光纤组成；其中，所述七根光纤中的一根光纤为入射光纤，所述入射光纤耦合从激光器控制台6中出射的光并发射到样品上；另外六根光纤为一组，围绕在入射光纤周围，接受反射光并传递至光功率计7。Further, the branch reflection detection fiber bundle 5 is composed of seven optical fibers; wherein, one of the seven optical fibers is an incident optical fiber, and the incident optical fiber couples the light emitted from the laser console 6 and emits to the sample; the other six optical fibers form a group, surround the incident optical fiber, receive the reflected light and transmit it to the optical power meter 7 .
进一步地，所述分路反射探测光纤束5用于提供入射光并对后向反射的光的分量进行近似测量；所述光纤8用于接收除了后向之外其他一个方向的反射光。Further, the branch reflection detection fiber bundle 5 is used to provide incident light and perform approximate measurement on the component of the retroreflected light; the optical fiber 8 is used to receive the reflected light in a direction other than the backward direction.
本发明有益效果：Beneficial effects of the present invention:
本发明所述装置利用球形罩壳形成一个暗室环境，并提供测量孔用于挂载光纤。激光器发射出的光经由光纤传播照射到样品表面并发生反射，反射光被光纤或反射探头接收、传播至光功率计进行反射功率测量。将样品的方向反射功率分布与标准白板方向反射功率分布进行对比得到BRDF值。The device of the present invention utilizes a spherical casing to form a dark room environment, and provides measurement holes for mounting optical fibers. The light emitted by the laser is transmitted through the optical fiber to the surface of the sample and reflected. The reflected light is received by the optical fiber or the reflection probe and transmitted to the optical power meter for reflection power measurement. The BRDF value is obtained by comparing the directional reflection power distribution of the sample with the standard whiteboard directional reflection power distribution.
本发明提出的固体材料双向反射分布函数测量装置结构简单、操作方便，不需要对光路进行复杂的调节，可以简便快速地测量出包括后向反射在内的样品表面的反射分布特性。本发明能够快速高效地对待测样片表面的反射特性分布进行测量，同时具有较高的可扩展性，通过对反射探头、光纤、激光器与光功率计的调整和匹配可以在一个较宽光谱范围内进行测量，同时，将测量的不确定度降低到6％左右。The device for measuring the bidirectional reflectance distribution function of solid materials proposed by the present invention has simple structure and convenient operation, does not require complex adjustments to the optical path, and can simply and quickly measure the reflection distribution characteristics of the sample surface including back reflection. The invention can quickly and efficiently measure the distribution of reflection characteristics on the surface of the sample to be tested, and has high scalability. Through the adjustment and matching of reflection probes, optical fibers, lasers and optical power meters, the reflection characteristics can be measured in a wide spectral range. The measurement is carried out, and at the same time, the uncertainty of the measurement is reduced to about 6%.
附图说明Description of drawings
图1是本发明所述测量装置的结构示意图。Fig. 1 is a schematic structural view of the measuring device of the present invention.
图2是漫射白板30°入射时，所测得其他各方向的功率分布的测量结果图。Figure 2 is a diagram of the measurement results of the measured power distribution in other directions when the diffuse whiteboard is incident at 30°.
图3是漫射白板各个方向后向反射的功率分布的测量结果图。Fig. 3 is a diagram of the measurement results of the power distribution of the retroreflection in all directions of the diffuse whiteboard.
具体实施方式Detailed ways
下面结合具体实施例对本发明做进一步说明，但本发明不受实施例的限制。The present invention will be further described below in conjunction with specific examples, but the present invention is not limited by the examples.
实施例1：Example 1:
结合图1说明本实施例，本实施例提出一种固体材料双向反射分布函数测量装置，它包括样品座1、样品2、测量孔3、光纤匹配套管4、分路反射探测光纤束5、激光器控制台6、光功率计7、光纤8、紧定螺钉9、球形罩壳10、升降螺栓11、电脑12。所述样品座1通过升降螺栓11安装于所述球形罩壳10内部；所述样品座1上设有左右对称的两个紧定螺钉9；所述测量孔3均匀分布与所述球形罩壳10上；所述球形罩壳10的的壳体上设有两个光纤匹配套管4；一个所述光纤匹配套管4通过分路反射探测光纤束5与所述激光器控制台6和光功率计7进行信号传输；另一个所述光纤匹配套管4通过光纤8与光功率计7进行信号传输；所述光功率计7的信号输出端与所述电脑12的信号输入端相连。This embodiment is illustrated in conjunction with Fig. 1. This embodiment proposes a solid material bidirectional reflection distribution function measurement device, which includes a sample holder 1, a sample 2, a measurement hole 3, an optical fiber matching sleeve 4, a branch reflection detection optical fiber bundle 5, Laser console 6, optical power meter 7, optical fiber 8, set screw 9, spherical cover 10, lifting bolt 11, computer 12. The sample holder 1 is installed inside the spherical case 10 through the lifting bolt 11; the sample holder 1 is provided with two left and right symmetrical set screws 9; the measuring holes 3 are evenly distributed with the spherical case 10; two optical fiber matching sleeves 4 are arranged on the housing of the spherical cover 10; one of the optical fiber matching sleeves 4 detects the optical fiber bundle 5 through branch reflection and the laser console 6 and the optical power meter 7 for signal transmission; the other optical fiber matching sleeve 4 carries out signal transmission with the optical power meter 7 through the optical fiber 8; the signal output end of the optical power meter 7 is connected with the signal input end of the computer 12 .
样品2放在样品座1上，通过紧定螺钉9固定在样品座1中央。升降螺栓11可以调节样品座1的高度和水平度，从而使样品2上表面与球形罩壳10的半球底面共面。其中，所述样片2厚度<30mm，直径范围为45mm-90mm。The sample 2 is placed on the sample holder 1 and fixed in the center of the sample holder 1 by a set screw 9 . The lifting bolt 11 can adjust the height and levelness of the sample holder 1, so that the upper surface of the sample 2 is coplanar with the hemispherical bottom surface of the spherical casing 10. Wherein, the thickness of the sample 2 is less than 30mm, and the diameter ranges from 45mm to 90mm.
分路反射探测光纤束5及光纤8借助光纤匹配套管4，通过球形罩壳10上均布的测量孔3进行定位。The branch reflection detection fiber bundle 5 and the fiber 8 are positioned through the uniformly distributed measuring holes 3 on the spherical casing 10 by means of the fiber matching sleeve 4 .
某特定波长的激光从激光器控制台6中产生，通过分路反射探测光纤束5传递至球面，出射后在空气中传播，经过样2上表面的反射后，其某方向的反射光线被光纤8接收，并传递到光功率计7测量。A laser with a specific wavelength is generated from the laser console 6, transmitted to the spherical surface through the branch reflection detection fiber bundle 5, propagates in the air after being emitted, and after being reflected by the upper surface of the sample 2, the reflected light in a certain direction is captured by the optical fiber 8 received, and delivered to the optical power meter 7 for measurement.
对于平行于入射光线的后向反射分量，经过样品2上表面的后向反射光被分路反射探测光纤束5接收，并传递到光功率计7测量。For the retroreflection component parallel to the incident light, the retroreflected light passing through the upper surface of the sample 2 is received by the shunt reflection detection fiber bundle 5 and transmitted to the optical power meter 7 for measurement.
所述球形罩壳9上按5°天顶角间距，60°方向角间距均匀分布有103个圆形的测量孔3，所述测量孔3分别通过光纤匹配套管4与分路反射探测光纤束5或光纤8相连接，实现对半球空间内103个方向进行测量。所述分路反射探测光纤束5由七根光纤组成；其中，所述七根光纤中的一根光纤为入射光纤，所述入射光纤耦合从激光器控制台6中出射的光并发射到样品上；另外六根光纤为一组，围绕在入射光纤周围，接受反射光并传递至光功率计7。所述分路反射探测光纤束5用于提供入射光并对后向反射的光的分量进行近似测量；所述光纤8用于接收除了后向之外某一方向的反射光。There are 103 circular measuring holes 3 evenly distributed on the spherical housing 9 according to the zenith angle spacing of 5° and the directional angular spacing of 60°, and the measuring holes 3 pass through the optical fiber matching sleeve 4 and the branch reflection detection optical fiber respectively. The beam 5 or the optical fiber 8 are connected to realize the measurement of 103 directions in the hemispherical space. The branch reflection detection optical fiber bundle 5 is composed of seven optical fibers; wherein, one of the seven optical fibers is an incident optical fiber, and the incident optical fiber couples the light emitted from the laser console 6 and emits it onto the sample ; The other six optical fibers form a group, surrounding the incident optical fiber, accepting the reflected light and passing it to the optical power meter 7 . The branch reflection detection fiber bundle 5 is used to provide incident light and to perform approximate measurement on the component of the back reflected light; the optical fiber 8 is used to receive the reflected light in a direction other than the back direction.
本实施例所述测量装置中的各组成部件的工作原理和作用：The working principle and effect of each component in the measuring device described in this embodiment:
所述的样品座1的作用是为待测样品提供一个放置的平面，同时可以根据待测样品的大小和厚度进行调节与固定以提高测量的精度。The function of the sample holder 1 is to provide a plane for placing the sample to be tested, and at the same time, it can be adjusted and fixed according to the size and thickness of the sample to be tested to improve the measurement accuracy.
所述的样品2是待测双向反射分布函数的固体材料。The sample 2 is a solid material whose bidirectional reflectance distribution function is to be measured.
所述的测量孔3是在球形罩壳10上均匀分布的孔眼，其作用是通过光纤匹配套管4与分路反射探测光纤束5或光纤8相连接，进行定位。The measuring holes 3 are holes evenly distributed on the spherical housing 10, and their function is to connect with the branch reflection detection fiber bundle 5 or the fiber 8 through the fiber matching sleeve 4 for positioning.
所述的光纤匹配套管4的作用将分路反射探测光纤束5或光纤8固定到测量孔上，方便测量。The function of the optical fiber matching sleeve 4 is to fix the shunt reflection detection optical fiber bundle 5 or optical fiber 8 to the measurement hole, which is convenient for measurement.
所述的分路反射探测光纤束5的原理是光的全反射，其作用是将激光发射到样品表面及接收后向反射的激光分量传递至光功率计进行测量。The principle of the branch reflection detection optical fiber bundle 5 is the total reflection of light, and its function is to transmit the laser light to the sample surface and receive the back-reflected laser component to the optical power meter for measurement.
所述的激光器控制台6内置激光器，并提供对激光器的电流控制和温度控制。激光器的原理是法布里－珀罗谐振腔，其作用是产生特定波长的激光。The laser console 6 has a built-in laser, and provides current control and temperature control to the laser. The principle of the laser is a Fabry-Perot resonator, and its function is to generate laser light of a specific wavelength.
所述的光功率计7的原理是光电效应，其作用是测量反射光的功率大小。The principle of the optical power meter 7 is the photoelectric effect, and its function is to measure the power of reflected light.
所述的光纤8的原理是光的全反射，其作用是接收样品的反射光，传递至光功率计进行测量。The principle of the optical fiber 8 is the total reflection of light, and its function is to receive the reflected light of the sample and transmit it to the optical power meter for measurement.
所述的紧定螺钉9的作用是固定待测样品。The function of the set screw 9 is to fix the sample to be tested.
所述的球形罩壳10的作用是产生一个半球暗室，并分布测量孔3挂载分路反射探测光纤束5或光纤8进行定位和测量。The function of the spherical casing 10 is to create a hemispherical darkroom, and the distributed measurement holes 3 are mounted with shunt reflection detection optical fiber bundles 5 or optical fibers 8 for positioning and measurement.
所述的升降螺栓11的作用是调节样品座1的高度与水平度，使样品待测表面与球形罩壳10半球底面共面The function of the lifting bolt 11 is to adjust the height and levelness of the sample holder 1, so that the surface to be tested of the sample is coplanar with the hemispherical bottom surface of the spherical casing 10
所述的计算机12的作用是控制光功率计7并进行数据处理，实现半自动化操作。The function of the computer 12 is to control the optical power meter 7 and perform data processing to realize semi-automatic operation.
本实施例提出的固体材料双向反射分布函数测量装置结构简单、操作方便，不需要对光路进行复杂的调节，可以简便快速地测量出包括后向反射在内的样品表面的反射分布特性。本发明能够快速高效地对待测样片表面的反射特性分布进行测量，同时具有较高的可扩展性，通过对反射探头、光纤、激光器与光功率计的调整和匹配可以在一个较宽光谱范围内进行测量，同时，将测量的不确定度降低到6％左右。The device for measuring the bidirectional reflectance distribution function of solid materials proposed in this embodiment has a simple structure and is easy to operate. It does not require complex adjustments to the optical path, and can easily and quickly measure the reflection distribution characteristics of the sample surface including back reflection. The invention can quickly and efficiently measure the distribution of reflection characteristics on the surface of the sample to be tested, and has high scalability. Through the adjustment and matching of reflection probes, optical fibers, lasers and optical power meters, the reflection characteristics can be measured in a wide spectral range. The measurement is carried out, and at the same time, the uncertainty of the measurement is reduced to about 6%.
实施例2Example 2
本实施例提出一种固体材料双向反射分布函数测量装置，所述固体材料双向反射分布函数测量装置的测量步骤如下：This embodiment proposes a solid material bidirectional reflectance distribution function measurement device, and the measurement steps of the solid material bidirectional reflectance distribution function measurement device are as follows:
步骤一、在测量进行之前，连接光路并对光纤进行固定；启动激光器控制台6，设定发射功率及温度，打开激光器控制台温度控制，将温度控制在25℃；Step 1. Before the measurement, connect the optical path and fix the optical fiber; start the laser console 6, set the transmission power and temperature, turn on the temperature control of the laser console, and control the temperature at 25°C;
步骤二、安装标准白板到样品座上，使用紧定螺钉对所述标准白板位置固定，并调整样品座高度及水平度，使标准白板上表面与球形罩壳的半球底面共面；Step 2. Install the standard whiteboard on the sample holder, fix the position of the standard whiteboard with set screws, and adjust the height and level of the sample holder so that the upper surface of the standard whiteboard is coplanar with the hemispherical bottom of the spherical casing;
步骤三、用光纤匹配套管4更改分路探测光纤束5或光纤8在球形罩壳10上的位置，测量标准白板的各个方向的反射功率并记为P白板；Step 3: Use the optical fiber matching sleeve 4 to change the position of the branch detection optical fiber bundle 5 or the optical fiber 8 on the spherical housing 10, measure the reflected power in all directions of the standard whiteboard and record it as Pwhiteboard ;
步骤四、将标准白板更换为待测样品，重复步骤二、步骤三、步骤四，测得数据记为P样品；Step 4. Replace the standard white board with the sample to be tested, repeat Step 2, Step 3, and Step 4, and record the measured data as Psample ;
步骤五、然后根据步骤三和步骤四分别获得的数据P白板和P样品，通过测得白板功率的值与样品功率的比较计算间接测得固体材料双向反射分布函数的值Step 5, then according to the data Pwhiteboard and Psample obtained in step 3 and step 4 respectively, the value of the bidirectional reflectance distribution function of the solid material is indirectly measured by comparing the value of the measured whiteboard power with the sample power
其中，步骤五所述固体材料双向反射分布函数间接测量计算方法的模型中，以标准白板作为参考标准，并将其反射视作比较理想的漫射体，其各方向双向反射分布函数值均为用同方向样品反射得到的功率值与白板反射得到的功率值进行比较，即可测得样品的在该方向的双向反射分布函数值，其具体计算模型如下：Wherein, in the model of the indirect measurement and calculation method of the bidirectional reflectance distribution function of solid materials described in step five, the standard whiteboard is used as a reference standard, and its reflection is regarded as an ideal diffuser, and the values of the bidirectional reflectance distribution function in each direction are By comparing the power value obtained by the reflection of the sample in the same direction with the power value obtained by the reflection of the whiteboard, the value of the bidirectional reflection distribution function of the sample in this direction can be measured. The specific calculation model is as follows:
其中：f——固体材料双向反射分布函数的值；Where: f - the value of the bidirectional reflectance distribution function of the solid material;
P样品——测得的样品的反射光功率；Psample - the measured reflected light power of the sample;
P白板——测得的白板的反射光功率；Pwhiteboard - the measured reflected light power of the whiteboard;
θi——入射光线的天顶角；θi ——zenith angle of incident light;
——入射光线的方向角； - the direction angle of the incident light;
θr——反射光线的天顶角；θr ——zenith angle of reflected light;
——反射光线的方向角； - the direction angle of the reflected light;
λ——入射光波长；λ—wavelength of incident light;
ρ——标准白板的反射率。ρ——reflectivity of standard whiteboard.
虽然本发明已以较佳的实施例公开如上，但其并非用以限定本发明，任何熟悉此技术的人，在不脱离本发明的精神和范围内，都可以做各种改动和修饰，因此本发明的保护范围应该以权利要求书所界定的为准。Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Any person familiar with this technology can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore The scope of protection of the present invention should be defined by the claims.
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810275164.3ACN108489937A (en) | 2018-03-30 | 2018-03-30 | A kind of solid material bidirectional reflectance distribution function measuring device |
| Application Number | Priority Date | Filing Date | Title |
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| CN201810275164.3ACN108489937A (en) | 2018-03-30 | 2018-03-30 | A kind of solid material bidirectional reflectance distribution function measuring device |
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| CN108489937Atrue CN108489937A (en) | 2018-09-04 |
| Application Number | Title | Priority Date | Filing Date |
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| CN201810275164.3APendingCN108489937A (en) | 2018-03-30 | 2018-03-30 | A kind of solid material bidirectional reflectance distribution function measuring device |
| Country | Link |
|---|---|
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109342329A (en)* | 2018-10-26 | 2019-02-15 | 长春理工大学 | BRDF automatic test system and test method |
| CN109470656A (en)* | 2018-12-26 | 2019-03-15 | 北京工业大学 | A novel bidirectional reflection distribution function rapid test system and method |
| CN113176184A (en)* | 2021-04-16 | 2021-07-27 | 长春理工大学 | Simulation device for sea surface target pBRDF measurement and use method thereof |
| CN113390831A (en)* | 2021-05-20 | 2021-09-14 | 常州千明智能照明科技有限公司 | Full-appearance bidirectional reflection distribution characteristic measuring method |
| CN114354544A (en)* | 2021-12-03 | 2022-04-15 | 河南师范大学 | Device and method for measuring bidirectional scattering distribution function of translucent material |
| CN115184282A (en)* | 2022-09-13 | 2022-10-14 | 北京理工大学 | An imaging type scattering property measurement system and measurement method including a contrast plate |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1181135A (en)* | 1995-03-06 | 1998-05-06 | Ade光学系统公司 | Surface inspection system and method of inspecting surface of workpiece |
| CN202057596U (en)* | 2011-04-11 | 2011-11-30 | 西安超凡光电设备有限公司 | Comparison-type reflectivity measuring instrument |
| CN104101580A (en)* | 2014-07-25 | 2014-10-15 | 中国工程物理研究院应用电子学研究所 | BRDF quick measuring device based on hemisphere array detection |
| CN105259144A (en)* | 2015-11-03 | 2016-01-20 | 西安工业大学 | Large-dynamic-range omnibearing sample BRDF (bidirectional reflectance distribution function) measuring device |
| CN105891157A (en)* | 2016-03-30 | 2016-08-24 | 哈尔滨工业大学 | Measuring device for retroreflection characteristics of solid materials |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1181135A (en)* | 1995-03-06 | 1998-05-06 | Ade光学系统公司 | Surface inspection system and method of inspecting surface of workpiece |
| CN202057596U (en)* | 2011-04-11 | 2011-11-30 | 西安超凡光电设备有限公司 | Comparison-type reflectivity measuring instrument |
| CN104101580A (en)* | 2014-07-25 | 2014-10-15 | 中国工程物理研究院应用电子学研究所 | BRDF quick measuring device based on hemisphere array detection |
| CN105259144A (en)* | 2015-11-03 | 2016-01-20 | 西安工业大学 | Large-dynamic-range omnibearing sample BRDF (bidirectional reflectance distribution function) measuring device |
| CN105891157A (en)* | 2016-03-30 | 2016-08-24 | 哈尔滨工业大学 | Measuring device for retroreflection characteristics of solid materials |
| Title |
|---|
| 陶会荣: "无合作目标激光测距中目标特性对测量影响研究", 《中国博士学位论文全文数据库 信息科技辑》* |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109342329A (en)* | 2018-10-26 | 2019-02-15 | 长春理工大学 | BRDF automatic test system and test method |
| CN109470656A (en)* | 2018-12-26 | 2019-03-15 | 北京工业大学 | A novel bidirectional reflection distribution function rapid test system and method |
| CN113176184A (en)* | 2021-04-16 | 2021-07-27 | 长春理工大学 | Simulation device for sea surface target pBRDF measurement and use method thereof |
| CN113390831A (en)* | 2021-05-20 | 2021-09-14 | 常州千明智能照明科技有限公司 | Full-appearance bidirectional reflection distribution characteristic measuring method |
| CN114354544A (en)* | 2021-12-03 | 2022-04-15 | 河南师范大学 | Device and method for measuring bidirectional scattering distribution function of translucent material |
| CN115184282A (en)* | 2022-09-13 | 2022-10-14 | 北京理工大学 | An imaging type scattering property measurement system and measurement method including a contrast plate |
| Publication | Publication Date | Title |
|---|---|---|
| CN108489937A (en) | A kind of solid material bidirectional reflectance distribution function measuring device | |
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