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CN108398860A - A kind of stripping means of semiconductor laser chip metal - Google Patents

A kind of stripping means of semiconductor laser chip metal
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Publication number
CN108398860A
CN108398860ACN201810232159.4ACN201810232159ACN108398860ACN 108398860 ACN108398860 ACN 108398860ACN 201810232159 ACN201810232159 ACN 201810232159ACN 108398860 ACN108398860 ACN 108398860A
Authority
CN
China
Prior art keywords
substrate
photoresist
metal
semiconductor laser
laser chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201810232159.4A
Other languages
Chinese (zh)
Inventor
欧祥勇
薛正群
张鹏
苏辉
邓仁亮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FUJIAN LITECORE PHOTOELECTRIC TECHNOLOGY Co Ltd
Original Assignee
FUJIAN LITECORE PHOTOELECTRIC TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FUJIAN LITECORE PHOTOELECTRIC TECHNOLOGY Co LtdfiledCriticalFUJIAN LITECORE PHOTOELECTRIC TECHNOLOGY Co Ltd
Priority to CN201810232159.4ApriorityCriticalpatent/CN108398860A/en
Publication of CN108398860ApublicationCriticalpatent/CN108398860A/en
Pendinglegal-statusCriticalCurrent

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Abstract

The present invention relates to a kind of method for stripping metal of semiconductor laser chip.The present invention is to do mask with photoresist, after exposure, using reversion baking, pan-exposure, development and post bake, photoetching offset plate figure is made to fall from power in eaves shape;Metal film is deposited on this basis, is removed photoresist and extra metal with stripper, is completed metal-stripping;Present invention process step is simple, and high yield rate is at low cost, and the eaves shape photoresist that the metal of precipitation is formed is disconnected in masked areas, is facilitated the infiltration of stripper, is conducive to remove.

Description

A kind of stripping means of semiconductor laser chip metal
Technical field
The present invention relates to integrated circuit and microelectromechanical systems manufacture field more particularly to a kind of semiconductor laser coresThe stripping means of piece metal.
Background technology
In microelectromechanical systems (MEMS) and integrated circuit processing technique, some materials metal such as gold, titanium, nickel,It is difficult to do mask with photoresist, is corroded by chemical reagent and Tiny figure;Some multiple layer metals are replaced with different corrosive liquidsSerious lateral undercutting can occur when use;Some metal erosion liquid can have corrosiveness to subsurface material.
Metal lift-off material is to coat a layer photoresist in substrate surface, the region for not needing metal by cross front baking,Exposure, development form mask pattern;Substrate surface sputter or be deposited method plate metal film, finally impregnate stripper orPhotoresist is dissolved removing by acetone soln, and the metal of photoresist surface thereon also falls off with it together, required to leaveMetallic pattern.The metal film of stripping means being critical that on photoresist is disconnected with the metal film in mask areas of disconnection, in this wayLiquid infiltration is easily peeled off to enter to dissolve photoresist.Some toxicity of the solution that common method for stripping metal uses are big, technique is numerousTrivial, expensive raw material price;For example, by using layered mask stripping method:In substrate base layer spin coating LOR glue, after overbaking is handled;AgainThe spin coating positive photoresist on LOR glue, prepares desired figure by way of exposing, developing.In actual mechanical process,LOR glue is more sticky, during spin coating LOR glue, easily forms gap between substrate and LOR glue, in developing process, can figure collapse,Make aliasing;Secondly LOR can form buffings in substrate edge, influence lithographic accuracy after overbaking is handled.
Invention content
In view of this, being to realize the purpose of the present invention is to provide a kind of stripping means of semiconductor laser chip metalAbove-mentioned purpose, the present invention adopt the following technical scheme that:A kind of stripping means of semiconductor laser chip metal, step packetIt includes:
Step S1:With photoresist by substrate spin coating;
Step S2:Substrate after spin coating is subjected to front baking processing, hot plate temperature is 90 DEG C -105 DEG C, -70 seconds 50 seconds time;
Step S3:Rotine exposure is carried out with reticle;
Step S4:Substrate is positioned on hot plate and carries out reversion baking processing, hot plate temperature is 110 DEG C -125 DEG C, the 60 seconds time -100 seconds;
Step S5:Place the substrates in cooling in air, time 3-5 minute;
Step S6:Substrate is subjected to pan-exposure processing, time 60-90 second;
Step S7:Substrate is put into developing liquid developing, makes photoresist picture that eaves shape be presented and falls from power;
Step S8:Substrate is put on 110 DEG C of -125 DEG C of hot plates and carries out post bake, -100 seconds 60 seconds time;
Step S9:Substrate treatment is cleaned;
Step S10:Substrate is put into sputtering unit sputtering or evaporation deposited metal film;
Step S11:Substrate is put into stripper, photoresist and excess metal are removed;
Further, the photoresist of the step S1 is single layer AZ5200E sequence of photolithography glue.
Further, the film thickness of the substrate spin coating of the step S1 is 2-3um.
Further, it is acetone or photoresist lift off liquid, 5-10 points of soaking time that the stripper of the step S11, which uses,Clock.
Further, the metal of different-thickness can be removed by the film thickness of spin coating described in rate-determining steps S1.
The present invention has the advantages that compared with prior art:The present invention uses single layer AZ5200E sequence of photolithography glue(Such as AZ5214E)Tackifier, gluing, front baking, mask exposure, reversion baking, pan-exposure, development are coated, realizes image inversion;It is compared compared to conventional lift-off process, present invention process step is simple, and high yield rate is at low cost;The room that the metal of precipitation is formedEaves shape photoresist is disconnected in masked areas, is facilitated the infiltration of stripper, is conducive to remove.
Description of the drawings
Fig. 1 is that the obtained eaves shape of present invention development is fallen from power photoresist side wall
Fig. 2 is the sectional view that the present invention completes metal-stripping.
Specific implementation mode
The present invention will be further described with reference to the accompanying drawings and embodiments.
Fig. 1 is please referred to, the present invention provides a kind of stripping means of semiconductor laser chip metal, and step includes:
Step S1:With photoresist by substrate spin coating;
Step S2:Substrate after spin coating is subjected to front baking processing, hot plate temperature is 90 DEG C -105 DEG C, -70 seconds 50 seconds time;
Step S3:Rotine exposure is carried out with reticle;
Step S4:Substrate is positioned on hot plate and carries out reversion baking processing, hot plate temperature is 110 DEG C -125 DEG C, the 60 seconds time -100 seconds;
Step S5:Place the substrates in cooling in air, time 3-5 minute;
Step S6:Substrate is subjected to pan-exposure processing, time 60-90 second;
Step S7:Substrate is put into developing liquid developing, makes photoresist picture that eaves shape be presented and falls from power;
Step S8:Substrate is put on 110 DEG C of -125 DEG C of hot plates and carries out post bake, -100 seconds 60 seconds time;
Step S9:Substrate treatment is cleaned;
Step S10:Substrate is put into sputtering unit sputtering or evaporation deposited metal film;
Step S11:Substrate is put into stripper, photoresist and excess metal are removed;
Further, the photoresist of the step S1 is single layer AZ5200E sequence of photolithography glue.
Further, the film thickness of the substrate spin coating of the step S1 is 2-3um.
Further, it is acetone or photoresist lift off liquid, 5-10 points of soaking time that the stripper of the step S12, which uses,Clock.
Further, the metal of different-thickness can be removed by the film thickness of spin coating described in rate-determining steps S1.
The foregoing is merely presently preferred embodiments of the present invention, all equivalent changes done according to scope of the present invention patent withModification should all belong to the covering scope of the present invention.

Claims (5)

CN201810232159.4A2018-03-212018-03-21A kind of stripping means of semiconductor laser chip metalPendingCN108398860A (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
CN201810232159.4ACN108398860A (en)2018-03-212018-03-21A kind of stripping means of semiconductor laser chip metal

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
CN201810232159.4ACN108398860A (en)2018-03-212018-03-21A kind of stripping means of semiconductor laser chip metal

Publications (1)

Publication NumberPublication Date
CN108398860Atrue CN108398860A (en)2018-08-14

Family

ID=63092689

Family Applications (1)

Application NumberTitlePriority DateFiling Date
CN201810232159.4APendingCN108398860A (en)2018-03-212018-03-21A kind of stripping means of semiconductor laser chip metal

Country Status (1)

CountryLink
CN (1)CN108398860A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN110011633A (en)*2019-04-252019-07-12北京中科飞鸿科技有限公司A kind of SAW filter preparation method with positive photoresist high adhesion force
CN110133761A (en)*2019-05-202019-08-16湖南理工学院 A metamaterial reflective film and its manufacturing method
CN111025862A (en)*2019-11-122020-04-17常州微泰格电子科技有限公司Photoetching processing method
CN111522208A (en)*2020-05-062020-08-11南京南大光电工程研究院有限公司Method for stripping metal film by using positive photoresist as mask
CN112864798A (en)*2021-01-262021-05-28威科赛乐微电子股份有限公司Preparation method of VCSEL chip metal film electrode
CN113594024A (en)*2021-07-302021-11-02中国电子科技集团公司第四十四研究所Manufacturing method of metal electrode stripping adhesive film and manufacturing method of metal stripping electrode
CN117031889A (en)*2023-08-292023-11-10无锡市华辰芯光半导体科技有限公司Single-layer positive photoresist photoetching method
CN117214236A (en)*2023-10-232023-12-12江苏飞特尔通信有限公司GeTe film material sample for TG-DSC test of LTCC and preparation method thereof

Citations (1)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN1800983A (en)*2005-12-312006-07-12厦门大学Anti-stripping photolithography method for integrated circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN1800983A (en)*2005-12-312006-07-12厦门大学Anti-stripping photolithography method for integrated circuit

Cited By (11)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN110011633A (en)*2019-04-252019-07-12北京中科飞鸿科技有限公司A kind of SAW filter preparation method with positive photoresist high adhesion force
CN110133761A (en)*2019-05-202019-08-16湖南理工学院 A metamaterial reflective film and its manufacturing method
CN111025862A (en)*2019-11-122020-04-17常州微泰格电子科技有限公司Photoetching processing method
CN111522208A (en)*2020-05-062020-08-11南京南大光电工程研究院有限公司Method for stripping metal film by using positive photoresist as mask
CN112864798A (en)*2021-01-262021-05-28威科赛乐微电子股份有限公司Preparation method of VCSEL chip metal film electrode
CN113594024A (en)*2021-07-302021-11-02中国电子科技集团公司第四十四研究所Manufacturing method of metal electrode stripping adhesive film and manufacturing method of metal stripping electrode
CN113594024B (en)*2021-07-302024-01-30中国电子科技集团公司第四十四研究所 Method for producing metal electrode stripping film and method for producing metal stripping electrode
CN117031889A (en)*2023-08-292023-11-10无锡市华辰芯光半导体科技有限公司Single-layer positive photoresist photoetching method
CN117031889B (en)*2023-08-292024-04-02无锡市华辰芯光半导体科技有限公司 A single-layer positive photoresist photolithography method
CN117214236A (en)*2023-10-232023-12-12江苏飞特尔通信有限公司GeTe film material sample for TG-DSC test of LTCC and preparation method thereof
CN117214236B (en)*2023-10-232024-10-01江苏飞特尔通信有限公司GeTe film material sample for TG-DSC test of LTCC and preparation method thereof

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SE01Entry into force of request for substantive examination
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Application publication date:20180814


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