CN108398241B - Method for evaluating applicability of pulse solar simulator to high-efficiency crystalline silicon battery test - Google Patents
Method for evaluating applicability of pulse solar simulator to high-efficiency crystalline silicon battery testDownload PDFInfo
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Abstract
Description
Technical Field
The invention belongs to the field of solar crystalline silicon cell testing, and particularly relates to a method for judging the applicability of a pulse solar simulator to high-efficiency crystalline silicon cell testing.
Background
In scientific research institutions, a stable solar simulator is generally adopted for testing the photoelectric conversion performance of the solar cell, and the solar cell testing device has the advantage that the testing time can be adjusted at will, and can be optimized and adjusted according to the type of the solar cell, so that the capacitance effect is eliminated. However, in the industrial production of the crystalline silicon cell, due to the pressure on the yield and the cost, the crystalline silicon cell usually adopts a pulse solar simulator to perform a photoelectric conversion performance test, the test time is short, and each cell is generally only 5-15 ms. For a conventional crystalline silicon battery, the parasitic capacitance is very small, so that even if the test time is only 5-15 ms, the capacitance effect does not exist. For the high-efficiency crystalline silicon battery, the parasitic capacitance is large, and if the test time is still 5-15 ms, the capacitance effect will occur, which affects the photoelectric conversion performance test. At present, the types of high-efficiency crystalline silicon batteries are more, including PERC, PERT, PERL, HIT, IBC and the like, the parasitic capacitance of each battery is different, and the parasitic capacitance can also show an increasing trend along with the technical progress and the efficiency improvement. In order to reduce and eliminate the capacitance effect, simulator manufacturers have developed various pulse solar simulators, and respectively adopt different testing methods, including a long pulse method, a double flash method, a multi-flash method, a dynamic scan rate method, a step voltage method and the like. Therefore, it is necessary to establish a method for evaluating applicability of a pulse solar simulator to eliminate a capacitance effect during a high-efficiency crystalline silicon cell test, that is, to determine whether the pulse solar simulator is suitable for the high-efficiency crystalline silicon cell test.
At present, a method for judging whether a pulse solar simulator is suitable for a high-efficiency crystalline silicon battery test is mainly compared with a test result under a steady-state solar simulator. The steady-state solar simulator adopts a constant light source, so that the testing time can be prolonged basically without limit, and the capacitance effect of the high-efficiency crystalline silicon cell is eliminated. For a certain pulse solar simulator and a certain high-efficiency crystalline silicon battery, if the test result of the pulse solar simulator is the same as that of the steady-state solar simulator, the pulse solar simulator can eliminate the capacitance effect of the high-efficiency crystalline silicon battery, namely the pulse solar simulator is suitable for testing the high-efficiency crystalline silicon battery.
However, the current evaluation method has great difficulty in operation: firstly, many high-efficiency crystalline silicon cell manufacturers do not have a steady-state solar simulator, i.e., lack hardware conditions; secondly, the spectrum structure between the steady-state solar simulator and the pulse solar simulator is different, the test data of the steady-state solar simulator and the test data of the pulse solar simulator cannot be directly compared, complex correction needs to be carried out, and therefore the process is complex and time-consuming.
Disclosure of Invention
In view of the above technical problems, the present invention aims to provide a method for evaluating the applicability of a pulse solar simulator to a high-efficiency crystalline silicon cell test, which is used for evaluating whether the pulse solar simulator is suitable for testing the high-efficiency crystalline silicon cell, avoiding the problem of solving hardware conditions by using a steady-state solar simulator, simplifying the evaluation process, and reducing the evaluation time.
In order to achieve the purpose, the technical scheme adopted by the invention is as follows:
a method for judging the applicability of a pulse solar simulator to a high-efficiency crystalline silicon battery test comprises the following steps:
A. placing the high-efficiency crystalline silicon battery at a sample position of a pulse solar simulator to be judged;
B. adjusting the voltage scanning direction of the pulse solar simulator to be a forward direction, testing the photoelectric conversion performance of the high-efficiency crystalline silicon battery, and obtaining the maximum forward scanning power Pmax forward direction；
C. Adjusting the voltage scanning direction of the pulse solar simulator to be reverse, testing the photoelectric conversion performance of the high-efficiency crystalline silicon cell, and obtaining the reverse scanning maximum power Pmax reversal；
D. Calculating the maximum power P of the forward scanmax forward directionAnd said reverse scan maximum power Pmax reversalA difference value Δ of;
E. judging the applicability of the pulse solar simulator to a high-efficiency crystalline silicon battery test according to the difference value delta;
wherein the steps are performed in an order of A, B, C, D, E or A, C, B, D, E.
In some embodiments, in steps B and C, other parameters are consistent except for the opposite voltage scan direction.
In some embodiments, the other parameters include scan voltage range, scan rate, test time.
In some embodiments, said step B and/or C, testing said efficiencyObtaining the maximum forward scanning power P according to the current-voltage curve of the crystalline silicon batterymax forward directionAnd/or the reverse scan maximum power Pmax reversal。
In some embodiments, in step D, the difference value Δ is calculated according to the following formula,
Δ=2×|Pmax forward direction-Pmax reversal|÷(Pmax forward direction+Pmax reversal)×100%。
In some embodiments, in the step E, the difference Δ is compared with a set threshold, and the applicability is better when the difference Δ is smaller than the set threshold; the applicability is poor when the difference Δ is larger than a set threshold.
In some embodiments, the step E specifically includes:
when the delta is less than or equal to the first threshold value, the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test is judged to be excellent;
when the first threshold value is less than or equal to the second threshold value, the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test is judged to be general;
and when the delta is larger than the second threshold value, judging that the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test is poor.
In some embodiments, the first threshold is 0.3% and the second threshold is 0.6%.
Compared with the prior art, the invention has the following advantages by adopting the scheme:
1. the problem of hardware condition does not exist, a steady-state solar simulator is not needed, and the problem of hardware condition is solved.
2. The judgment process is simple, and the judgment time is short. The complex spectrum structure correction is not needed for comparing the test results of the pulse solar simulator and the steady-state solar simulator, and only the positive and negative scanning maximum power of the pulse solar simulator is compared, so that the judgment process is greatly simplified, and the time consumed by judgment is reduced.
Drawings
In order to more clearly illustrate the technical solution of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on the drawings without creative efforts.
FIG. 1 is a schematic diagram of a capacitance effect occurring when a pulsed solar simulator is used to test a high-efficiency crystalline silicon cell;
fig. 2 is a flow chart of a method for evaluating the applicability of the pulse solar simulator to the high-efficiency crystalline silicon cell test according to the invention.
Detailed Description
Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings so that the advantages and features of the invention may be more readily understood by those skilled in the art. It should be noted that the description of the embodiments is provided to help understanding of the present invention, but the present invention is not limited thereto. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
First, terms involved in the present invention are explained as follows: the solar simulator is equipment capable of simulating sunlight and testing the photoelectric conversion performance of the solar cell; the steady-state solar simulator is a solar simulator capable of providing a constant light source, and the testing time of a solar cell is long; the pulse solar simulator is a solar simulator for providing a flash light source, and the testing time of the solar cell is short; the high-efficiency crystalline silicon cell refers to a high-efficiency crystalline silicon solar cell, and comprises PERC, PERT, PERL, HIT, IBC and the like; the capacitance effect means that the high-efficiency crystalline silicon battery has larger parasitic capacitance, and when the pulse solar simulator is used for testing the photoelectric conversion performance, the measurement data and the true value have larger deviation due to the charging and discharging of the capacitance because the testing time is short. The capacitive effects can be mitigated and eliminated by extending the test time or some other method.
The embodiment provides a method for judging the applicability of a pulse solar simulator to a high-efficiency crystalline silicon battery test, and the judgment principle is explained as follows. As shown in fig. 1, the capacitance effect that occurs when a pulsed solar simulator is used to test a high-efficiency crystalline silicon cell. The curve in fig. 1 is a test curve of photoelectric conversion performance (current-voltage curve), and when the voltage is in a forward direction (the voltage is gradually increased), the parasitic capacitance needs to be charged, which results in a lower current, especially near the highest power point (the point where the product of the current and the voltage is the largest on the curve); when the voltage is in the reverse direction (the voltage gradually decreases), the parasitic capacitance discharges, resulting in a higher current, especially near the highest power point. That is, due to the capacitance effect, the maximum power of the forward scan is low and the maximum power of the reverse scan is high. If the capacitance effect is eliminated, the forward scanning curve and the reverse scanning curve are overlapped, namely the maximum power of forward and reverse scanning is the same.
Therefore, the method adopts a mode of comparing the highest power difference of forward and reverse scanning to judge the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test, and the flow is shown as the attached figure 2. Referring to fig. 2, the suitability assessment method includes the following steps:
s1, placing the high-efficiency crystalline silicon battery at the sample position of the pulse solar simulator to be judged;
s2, setting parameters (including scanning voltage range, scanning speed, testing time and the like), and adjusting the voltage scanning direction of the pulse solar simulator to be a forward direction;
s3, forward scanning, testing the photoelectric conversion performance of the high-efficiency crystalline silicon battery, and obtaining the maximum forward scanning power P according to the current-voltage curve of the forward scanningmax forward direction；
S4, adjusting the voltage scanning direction of the pulse solar simulator to be reverse, and keeping other parameters (including scanning voltage range, scanning speed, testing time and the like) unchanged;
s5, reverse scanning, testing the photoelectric conversion performance of the high-efficiency crystalline silicon battery, and obtaining the highest power P of the reverse scanning according to the current-voltage curve of the reverse scanningmax reversal；
S6, according to the formula Δ =2 × | Pmax forward direction-Pmax reversal|÷(Pmax forward direction+Pmax reversal) X 100% calculating the difference value delta of the forward scanning maximum power Pmax and the reverse scanning maximum power Pmax in the reverse direction;
s7, judging the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test according to the difference value delta; in particular, the amount of the solvent to be used,
when the delta is less than or equal to 0.3%, judging that the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test is excellent;
when the delta is more than 0.3% and less than or equal to 0.6%, judging that the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test is general;
and when the delta is greater than 0.6%, judging that the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test is poor.
In the above procedure, the maximum forward scan power is tested first and then the maximum reverse scan power is tested, or the maximum reverse scan power may be tested first and then the maximum forward scan power is tested.
In step S4, when the scan direction is changed, other parameters except the scan direction, such as scan voltage range, scan rate, test time, etc., cannot be changed to avoid the change of these parameters from affecting the test result.
In step S7, the evaluation results are classified into three categories, i.e., good applicability, normal applicability, and poor applicability according to the magnitude of the maximum power difference between the forward and reverse sweeps. In other embodiments, the number of classifications of the evaluation results, the classification threshold, the maximum power difference calculation formula, and the like may be adjusted as needed.
The invention has the following advantages:
1. there is no hardware condition problem. And a steady-state solar simulator is not needed, so that the problem of hardware condition is solved.
2. The judgment process is simple, and the judgment time is short. The complex spectrum structure correction is not needed for comparing the test results of the pulse solar simulator and the steady-state solar simulator, and only the positive and negative scanning maximum power of the pulse solar simulator is compared, so that the judgment process is greatly simplified, and the time consumed by judgment is reduced.
The above embodiments are merely illustrative of the technical ideas and features of the present invention, and are preferred embodiments, which are intended to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the scope of the present invention. All equivalent changes or modifications made according to the principles of the present invention should be covered within the protection scope of the present invention.
Claims (8)
1. A method for judging the applicability of a pulse solar simulator to a high-efficiency crystalline silicon battery test is characterized by comprising the following steps:
A. placing the high-efficiency crystalline silicon battery at a sample position of a pulse solar simulator to be judged;
B. adjusting the voltage scanning direction of the pulse solar simulator to be a forward direction, testing the photoelectric conversion performance of the high-efficiency crystalline silicon battery, and obtaining the maximum forward scanning power Pmax forward direction；
C. Adjusting the voltage scanning direction of the pulse solar simulator to be reverse, testing the photoelectric conversion performance of the high-efficiency crystalline silicon cell, and obtaining the reverse scanning maximum power Pmax reversal；
D. Calculating the forward scan maximum power P according to the following formulamax forward directionAnd said reverse scan maximum power Pmax reversalThe difference value a of (a) is,
Δ=2×|Pmax forward direction-Pmax reversal|÷(Pmax forward direction+Pmax reversal)×100%；
E. Judging the applicability of the pulse solar simulator to a high-efficiency crystalline silicon battery test according to the difference value delta;
wherein the steps are performed in an order of A, B, C, D, E or A, C, B, D, E.
2. The suitability assessment method according to claim 1, wherein in steps B and C, the other parameters are consistent except for the opposite voltage scanning direction.
3. The suitability assessment method according to claim 2, wherein the other parameters include scan voltage range, scan rate, test time.
4. The applicability evaluation method according to claim 1, wherein in the steps B and/or C, a current-voltage curve of the high efficiency crystalline silicon battery is tested, and the maximum forward scanning power P is obtained according to the current-voltage curvemax forward directionAnd/or the reverse scan maximum power Pmax reversal。
5. The suitability evaluation method according to claim 1, wherein in the step E, the difference Δ is compared with a set threshold, and the suitability is better when the difference Δ is smaller than the set threshold; the applicability is poor when the difference Δ is larger than a set threshold.
6. The suitability assessment method according to claim 5, wherein the step E specifically comprises:
when the delta is less than or equal to the first threshold value, the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test is judged to be excellent;
when the first threshold value is less than or equal to the second threshold value, the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test is judged to be general;
and when the delta is larger than the second threshold value, judging that the applicability of the pulse solar simulator to the high-efficiency crystalline silicon battery test is poor.
7. The suitability assessment method according to claim 6, wherein the first threshold value is 0.3%.
8. The suitability assessment method according to claim 6, wherein the second threshold value is 0.6%.
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| CN109639236A (en)* | 2018-12-10 | 2019-04-16 | 腾晖光伏（宁夏）有限公司 | The evaluation method and device that a kind of pulse solar simulator tests photovoltaic module |
| CN110868156A (en)* | 2019-12-20 | 2020-03-06 | 青海黄河上游水电开发有限责任公司光伏产业技术分公司 | Method for measuring power of high-efficiency solar module in sections |
| CN116525483B (en)* | 2023-07-04 | 2023-09-15 | 合肥华晟光伏科技有限公司 | Heterojunction battery testing method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201859011U (en)* | 2010-10-25 | 2011-06-08 | 中国计量科学研究院 | Apparatus for detecting irradiation homogeneity and stability of solar simulator |
| CN102788944A (en)* | 2012-07-06 | 2012-11-21 | 南京大学 | Quick test method of solar battery electric performance and capable of removing internal capacitor effect |
| CN104201988A (en)* | 2014-09-17 | 2014-12-10 | 陕西众森电能科技有限公司 | Test method for electric performance of solar cell module |
| CN104218890A (en)* | 2013-06-03 | 2014-12-17 | 独立行政法人产业技术综合研究所 | I-v characteristic measuring apparatus and i-v characteristic measuring method for solar cell |
| CN105656429A (en)* | 2015-12-30 | 2016-06-08 | 合肥晶澳太阳能科技有限公司 | Electrical parameter test method capable of being applicable to high-efficiency photovoltaic cell module |
- 2018
- 2018-01-30CNCN201810087225.3Apatent/CN108398241B/enactiveActive
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201859011U (en)* | 2010-10-25 | 2011-06-08 | 中国计量科学研究院 | Apparatus for detecting irradiation homogeneity and stability of solar simulator |
| CN102788944A (en)* | 2012-07-06 | 2012-11-21 | 南京大学 | Quick test method of solar battery electric performance and capable of removing internal capacitor effect |
| CN104218890A (en)* | 2013-06-03 | 2014-12-17 | 独立行政法人产业技术综合研究所 | I-v characteristic measuring apparatus and i-v characteristic measuring method for solar cell |
| CN104201988A (en)* | 2014-09-17 | 2014-12-10 | 陕西众森电能科技有限公司 | Test method for electric performance of solar cell module |
| CN105656429A (en)* | 2015-12-30 | 2016-06-08 | 合肥晶澳太阳能科技有限公司 | Electrical parameter test method capable of being applicable to high-efficiency photovoltaic cell module |
Non-Patent Citations (3)
| Title |
|---|
| 太阳模拟器辐照不稳定性测试方法;尹德金 等;《上海计量测试》;20121231(第5期);全文* |
| 新型太阳电池光电转换效率测量技术研究进展;孟海凤 等;《影像科学与光化学》;20160930;第34卷(第5期);全文* |
| 模拟器辐照不均匀度对组件性能测试的影响;朱雪梅 等;《电源技术》;20081130;第32卷(第11期);全文* |
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