A kind of test method for SPI interfaceTechnical field
The present invention relates to backlight module detection technique field more particularly to a kind of test methods for SPI interface.
Background technology
Function machine is commonly called as old man's machine, is different from current smart mobile phone, with the development of science and technology, property of the user to function machineCan be also higher and higher with quality requirements, in order to improve the performance of function machine, SPI of the existing function machine on original FPC platesThe function of TE signals synchronization and ID signal identifications is increased in interface (synchronous serial Peripheral Interface) newly, TE signals are for realizing dataIt is synchronous, the ID signals information in display module corresponding to control chip or resistance value for identification, wherein the ID of control chipInformation is known as software I D values, and software I D values represent manufacturer's identity of control chip, and resistance value represents the hardware of display moduleId information, the hardware id information represent manufacturer's identity of display module.As shown in Figure 1, a kind of detection of existing function machineMethod is the first step, and measurement jig is connected with product, that is, display module to be detected；Second step is obtained and is controlled in product to be detectedID values corresponding to coremaking piece；Third walks, and judges to control the ID values corresponding to chip and the relationship between preset ID values, if IDValue is not equal to preset ID values, then enters the 4th step；If ID values are equal to preset ID values, enter the 5th step；4th step, it is to be checkedIt is unqualified to survey product, replaces next product to be detected, returns to the first step；5th step, to the liquid crystal display of product to be detectedMenu display function be detected, be detected successively using multiple detection pictures, if the display of any detection picture is abnormal,Into the 6th step；If whole detection pictures is shown normally, enter the 7th step；6th step, product to be detected is unqualified, moreNext product to be detected is changed, the first step is returned；7th step, product to be detected is qualified, and detection process terminates, and replaces next wait forProduct is detected, the first step is returned.In above-mentioned detection method, the ID values of control chip are only only had detected, when multiple display mouldsWhen producer's use of group is with a control chip, above-mentioned detection method can not distinguish different display module manufacturers,Cause client that can not look into corresponding display module manufacturer according to product, while above-mentioned testing process does not carry out TE signalsDetection is easy the substandard product of TE abnormal signals being sold to client, and TE abnormal signals will cause function machine normalIt uses, therefore existing detection method has that detection signal is not comprehensive, substandard product omission factor is high.
Invention content
The present invention provides a kind of test method for SPI interface, the test signal for including in the test method is more completeThe omission factor in face, substandard product is relatively low.
The technical solution adopted in the present invention is that a kind of test method for SPI interface includes the following steps：
S1, measurement jig and product to be detected are electrically connected, connect the power supply of measurement jig, the measurement jig packetThe function of detection ID signals and TE signals is included, and is preset with hardware ID standard value, software I D standard values, TE frequency standard values；InstituteThe product to be detected stated includes backlight, liquid crystal display and FPC plates, and the FPC plates are connected with the liquid crystal display,The FPC plates are equipped with resistance, control chip, TE pins and ID pins；
S2, measurement jig obtain resistance value by detecting ID pins, and the resistance value corresponds to the hardware of liquid crystal displayID values；
Relationship between hardware ID value described in S3, judgement and hardware ID standard value；If the hardware ID value is not belonging toThe range of the hardware ID standard value then enters S4；If the hardware ID value belongs to the model of the hardware ID standard valueIt encloses, then enters S5；
S4, backlight flicker indicate that the hardware ID value of liquid crystal display is abnormal, and product to be detected is unqualified, detection processTerminate, replace next product to be detected, returns to S1；
S5, backlight normally show that measurement jig obtains TE frequency values by detecting TE pins；
Relationship between TE frequency values described in S6, judgement and TE frequency standard values；If the TE frequency values are not belonging toThe range of the TE frequency standard values then enters S7；If the TE frequency values belong to the model of the TE frequency standard valuesIt encloses, then enters S8；
S7, backlight flicker indicate that the TE frequency values of product to be detected are abnormal, and product to be detected is unqualified, detection processTerminate, replace next product to be detected, returns to S1；
S8, backlight normally show that measurement jig obtains the software I D values controlled corresponding to chip by detecting ID pins；
The relationship between software I D values and the software I D standard values described in S9, judgement, if the software I D valuesEqual to the software I D standard values, then enter S10；If the software I D values are not equal to the software I D standard values,Into S11；
S10, measurement jig show that software I D values are abnormal, and product to be detected is unqualified, and detection process terminates, and replace nextProduct to be detected returns to S1；
S11, the menu display function of liquid crystal display is detected, uses test pictures, black picture, white respectively successivelyPicture, red picture, green picture and blue picture are tested；
S12, judge that each picture displays whether normally, if the display of any picture is abnormal, enter S13；If comprehensive pictureDisplay is normal, then enters S14；
S13, the menu display function of liquid crystal display are abnormal, and product to be detected is unqualified, replaces next production to be detectedProduct return to S1；
S14, product to be detected are qualified, and detection process terminates, and replace next product to be detected, return to S1.
After the above technical solution is adopted, compared with the prior art, the present invention has the following advantages：
The present invention tests TE signals by increase, prevents the product missing inspection of TE abnormal signals, reduces the omission factor of defective products,The customer complaint rate of client is reduced, wherein increasing the test to hardware ID value, which can be used for identifying the life of display moduleBusiness men identity it has also been discovered that resistance dry joint, the problems such as mismatching, intercepts defective products when testing hardware ID, whileWhen the manufacturer of multiple display modules is used with a control chip, client can also easily distinguish from out each display moduleThe product that manufacturer is produced, convenient for looking into the source of defective products.
As an improvement, ranging from 0V~1.8V of the hardware ID standard value, resistance value in the range to be detectedProduct is produced by the manufacturer of same display module.
As an improvement, ranging from 55HZ~75HZ of the TE frequency standard values, the TE frequency values of different product existDifference, the data in the section are as one group of reference value.
Description of the drawings
Fig. 1 is existing detection method flow chart
Fig. 2 is the test method flow chart in the present invention
Specific implementation mode
As shown in Fig. 2, a kind of test method for SPI interface, includes the following steps：
S1, measurement jig and product to be detected are electrically connected, the model GX06B measurement jigs of measurement jig；It connectsThe power supply of measurement jig, the SPI interface of the measurement jig include detecting the function of ID signals and TE signals, and control in the testHardware ID standard value is preset in tool, in the range of 0V~1.8V；Software I D standard values, for example, use control chip modelIt is ST7789S, corresponding software I D values are then 007C 89F0；TE frequency standard values, in the range of 55HZ~75HZ；It is to be checkedIt includes backlight, liquid crystal display and FPC plates to survey product, and FPC plates are connected with liquid crystal display, and FPC plates are equipped with resistance, controlChip, TE pins and ID pins, wherein FPC plates use the communication mode of SPI interface；The size of product to be detected is 1.77 EnglishVery little, 1.44 inches, the small sizes function machines such as 2.4 inches；
S2, measurement jig obtain resistance value by detecting ID pins, and resistance value corresponds to the hardware ID value of liquid crystal display；
S3, judge relationship between hardware ID value and hardware ID standard value；If hardware ID value is not belonging to hardware ID standard valueRange, i.e., hardware ID value be more than 1.8V when, then enter S4；If hardware ID value belongs to the range of hardware ID standard value, i.e. hardwareID values ∈ [0,1.8] V then enters S5；
S4, backlight flicker indicate that the hardware ID value of liquid crystal display is abnormal, resistance exist mismatch either damaged orThe problem of missing solder, product to be detected is unqualified, and detection process terminates, and replaces next product to be detected, returns to S1；
S5, backlight normally show that measurement jig obtains TE frequency values by detecting TE pins；
S6, judge relationship between TE frequency values and TE frequency standard values；If TE frequency values are not belonging to TE frequency standard valuesRange, i.e. TE frequency values not in 55HZ~75HZ interval ranges, then enter S7；If TE frequency values belong to TE frequency standard valuesRange, i.e. TE frequency values ∈ [55,75] HZ, then enter S8；
S7, the flicker of visual detection backlight indicate that the TE frequency values of product to be detected are abnormal, and TE circuits have open circuit or shortThe problem of road, product to be detected is unqualified, and detection process terminates, and replaces next product to be detected, returns to S1；
S8, visual detection backlight normally show that measurement jig is obtained by detecting ID pins corresponding to control chipSoftware I D values；
S9, judge relationship between software I D values and software I D standard values, measurement jig to software I D values and software I D intoRow matching enters S10 if software I D values are equal to software I D standard values, that is, 007C 89F0；If software I D values are not equal to software I DStandard value then enters S11；
S10, measurement jig show that software I D values are abnormal, indicate that control chip there are problems that mismatching or damage, wait forDetection product is unqualified, and detection process terminates, and replaces next product to be detected, returns to S1；
S11, the menu display function of liquid crystal display is detected, uses test pictures, black picture, white respectively successivelyPicture, red picture, green picture and blue picture are tested；
S12, judge that each picture displays whether normally, if the display of any picture is abnormal, picture includes blank screen, flower extremelyThe defects of screen, bright line, broken string, then enter S13；If comprehensive picture is shown normally, enter S14；
S13, the menu display function of liquid crystal display are abnormal, and product to be detected is unqualified, replaces next production to be detectedProduct return to S1；
S14, product various functions to be detected are normal, and product to be detected is qualified, and detection process terminates, and replace next wait forThe product of detection returns to S1.
It is on the one hand whether normal by detecting TE frequency values in above-mentioned steps, the product of TE frequency anomalies can be preventedMissing inspection reduces the omission factor of defective products, on the other hand by detecting hardware ID value, it is ensured that same display module manufacturer instituteThe product of production will not be erroneously interpreted as other display module manufacturers and be produced, and be looked into corresponding to defective products convenient for clientManufacturer, multiple display module manufacturers that avoid confusion influence the brand image of other manufacturers, furthermore generally in client, needleJig used in the product produced to multiple display module manufacturers is different, that is to say, that display module manufacturer and clientThe jig at end is one-to-one, and after the underproof product missing inspection of hardware ID value, meeting when with the collocation of the jig of clientCause display module display abnormal, increases the customer complaint rate of product, therefore be detected to hardware ID value in the present invention, also favorablyIn reduction customer complaint rate.In conclusion the test method in the present invention, detection signal is comprehensive, defective products recall rate height, omission factorIt is low, customer complaint rate is low.
The above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations.Although with reference to the foregoing embodimentsInvention is explained in detail, it will be understood by those of ordinary skill in the art that, it still can be to implementation above-mentionedExample recorded in technical solution modify, or to wherein each section technical characteristic carry out equivalent replacement, and these modification orPerson replaces, the range for technical solution of the embodiment of the present invention that it does not separate the essence of the corresponding technical solution.