技术领域technical field
本发明涉及一种面结构光解相领域,具体涉及一种基于莫尔序列光栅的面结构光解相方法。The invention relates to the field of surface structure photolysis, in particular to a surface structure photolysis method based on a moiré sequence grating.
背景技术Background technique
随着科技的进步,高精度的三维测量技术需求越来越大,根据测量时是否与被测量物体接触,三维测量分为接触式和非接触式,非接触式三维测量技术在具备同样高精度的条件下还具备传统接触式测量技术所不具备的优点:如测量工件表面保护、大型工件测量、耗时少、便携等。近年来非接触式三维测量技术在文物保护、逆向工程、虚拟现实等领域也得到越来越多的应用。With the advancement of science and technology, the demand for high-precision three-dimensional measurement technology is increasing. According to whether the measurement is in contact with the measured object, three-dimensional measurement is divided into contact type and non-contact type. Non-contact three-dimensional measurement technology has the same high precision. Under the same conditions, it also has the advantages that traditional contact measurement technology does not have: such as measuring workpiece surface protection, measuring large workpieces, less time-consuming, and portable. In recent years, non-contact 3D measurement technology has also been more and more applied in the fields of cultural relics protection, reverse engineering, virtual reality and so on.
在非接触式三维测量中,基于相位结构光的主动式三维测量方法以高精度、高速度、易于实现等优点逐渐成为三维测量领域的研究热门。In non-contact 3D measurement, the active 3D measurement method based on phase structured light has gradually become a research hotspot in the field of 3D measurement due to its advantages of high precision, high speed and easy implementation.
基于面结构光的三维测量原理:在由投影仪和相机组成的结构光测量系统中,通过投影仪将具有已知相位信息的面结构光投射到被测物体表面,再由相机同步采集经过物体表面高度调制后的条纹光栅图像,通过对采集的条纹光栅图像的解相来得到相应的相位分布,再根据系统标定中得到的相位和三维坐标的关系重建出物体的三维形貌。The principle of three-dimensional measurement based on surface structured light: In the structured light measurement system composed of projector and camera, the surface structured light with known phase information is projected onto the surface of the measured object through the projector, and then the camera collects the passing object synchronously. For the fringe grating image after surface height modulation, the corresponding phase distribution is obtained by dephasing the collected fringe grating image, and then the three-dimensional shape of the object is reconstructed according to the relationship between the phase and the three-dimensional coordinates obtained in the system calibration.
存在的问题:在面结构光三维测量实际应用中,能否从采集的条纹光栅图像中解出准确的相位信息直接影响着三维测量和重建精度。传统的四步相移多频投影测量方式,在计算相位级数整数部分的时候,由于随机噪声、非线性误差和过亮过暗等因素的影响,在求取相位级数的时候,由于误差的不断传递放大,导致所求得的相位级数整数部分存跳跃误差,导致最终求出相位中出现2π的整数倍跳跃误差,造成相位缺失,在实际测量中,这种跳跃误差往往较多且不易消除。Existing problems: In the practical application of surface structured light 3D measurement, whether the accurate phase information can be solved from the collected fringe grating image directly affects the accuracy of 3D measurement and reconstruction. The traditional four-step phase-shift multi-frequency projection measurement method, when calculating the integer part of the phase series, due to the influence of factors such as random noise, nonlinear error and too bright or too dark, when calculating the phase series, due to the error The continuous transmission and amplification of the obtained phase series results in a jump error in the integer part of the obtained phase series, resulting in an integer multiple jump error of 2π in the final calculated phase, resulting in a missing phase. In actual measurement, this kind of jump error is often more and more Not easy to remove.
发明内容Contents of the invention
有鉴于此,本发明的目的是克服现有技术中的缺陷,提供基于莫尔序列光栅的面结构光解相方法,在面结构光三维测量过程中,能够对噪声、过亮过暗区域引起的求取相位级数时整数部分跳跃误差进行抑制和校正,避免相位缺失,保证得到正确的相位信息。In view of this, the purpose of the present invention is to overcome the defects in the prior art, and to provide a surface structured light phase decomposition method based on a moiré sequence grating, which can eliminate the noise caused by noise, too bright and too dark areas during the three-dimensional measurement of surface structured light. When calculating the phase series, the jump error of the integer part is suppressed and corrected to avoid phase loss and ensure correct phase information.
本发明的基于莫尔序列光栅的面结构光解相方法,包括如下步骤:The surface structure photolysis method based on the moiré sequence grating of the present invention comprises the following steps:
步骤1:根据三个节距分别为P1、P2与P3的一级光栅条纹并以两个为一组的方式获得两个节距分别为P12和P23的虚拟的二级莫尔光栅条纹,根据该两个二级光栅条纹获得节距为P123的虚拟的三级莫尔光栅条纹,所述三级莫尔光栅条纹为全场光栅条纹;Step 1: Obtain two virtual secondary Moiré grating stripes with pitches P12 and P23 respectively based on the three primary grating stripes with pitches of P1, P2 and P3 respectively, according to The two second-level grating stripes obtain virtual third-level Moiré grating stripes with a pitch of P123, and the third-level Moiré grating stripes are full-field grating stripes;
步骤2:根据步骤1获得节距数据生成节距分别为P1、P12和P123的一级光栅条纹、二级莫尔光栅条纹和三级莫尔光栅条纹的四步相移光栅条纹图像,分别记为投影图像1、投影图像12和投影图像123;Step 2: According to the pitch data obtained in step 1, generate the four-step phase-shift grating fringe images of the first-order grating fringes, the second-order Moiré grating fringes, and the third-order Moiré grating fringes with the pitches of P1, P12, and P123 respectively. are projected image 1, projected image 12 and projected image 123;
步骤3:将投影图像1、投影图像12和投影图像123分别通过投影仪投影到物体表面,并通过相机采集图像,获得采集图像1、采集图像12和采集图像123;Step 3: Projecting the projected image 1, the projected image 12 and the projected image 123 onto the surface of the object through the projector respectively, and collecting the images through the camera to obtain the collected image 1, the collected image 12 and the collected image 123;
步骤4:根据步骤3中获得采集图像1、采集图像12和采集图像123,计算对应采集图像的包裹相位Step 4: According to the acquisition image 1, acquisition image 12 and acquisition image 123 obtained in step 3, calculate the wrapping phase of the corresponding acquisition image
步骤5:根据步骤4中获得包裹相位计算采集图像1的相位级数小数部分Δn1与整数部分N1、采集图像12的相位级数小数部分Δn12和整数部分以及采集图像123的相位级数小数部分Δn123和整数部分N123;Step 5: Obtain the package phase according to step 4 Calculate the phase series fractional part Δn1 and the integer part N1 of the collected image 1, the phase series fractional part Δn12 and the integer part of the collected image 12, and the phase series fractional part Δn123 and the integer part N123 of the collected image 123;
步骤6:根据步骤5中获得的采集图像1的相位级数小数部分Δn1与整数部分N1,计算采集图像1的绝对相位Φ1。Step 6: Calculate the absolute phase Φ1 of the acquired image 1 according to the fractional part Δn1 and the integer part N1 of the phase series of the acquired image 1 obtained in step 5.
进一步,其中步骤1中,所述二级莫尔光栅条纹和三级莫尔光栅条纹的节距通过下列(1)至(3)式求得:Further, wherein in step 1, the pitch of the two-stage Moiré grating stripes and the three-stage Moiré grating stripes is obtained by the following formulas (1) to (3):
进一步,其中步骤4中,各采集图像的包裹相位下列(4)至(6)式求得:Further, in step 4, the wrapping phase of each acquired image is obtained by the following formulas (4) to (6):
其中I1d、I12d、I123d…为对应采集图像四幅图中对应像素的亮度值。Wherein I1d , I12d , I123d . . . are brightness values of corresponding pixels in the four images corresponding to the collected images.
进一步,其中步骤5中,所述采集图像1的相位级数小数部分Δn1与整数部分N1通过下列(7)至(11)式求得:Further, in step 5, the fractional part Δn1 and the integer part N1 of the phase series of the acquired image 1 are obtained by the following formulas (7) to (11):
其中,round表示四舍五入取整运算,并且由于节距123为全场光栅,因此N123=0。Wherein, round represents a rounding operation, and since the pitch 123 is a full-field grating, N123=0.
进一步,其中步骤6中,根据(12)式可直接计算出采集图像1的绝对相位Φ1:Further, in step 6, the absolute phase Φ1 of the acquired image 1 can be directly calculated according to formula (12):
本发明的有益效果是:本发明公开的基于莫尔序列光栅的面结构光解相方法,该方法通过直接投影节距为P12和P123的莫尔光栅条纹,相比传统面结构光直接投影节距为P1,P2和P3的条纹光栅,在计算相位级数小数部分的过程中避免了由于误差传递和放大造成计算虚拟节距P12、P123的条纹光栅的整数和小数级数引入的跳跃误差,该方法通过直接计算节距为P12和P123的莫尔条纹光栅采集图像的相位级数小数和整数部分,极大的抑制和修正了相位跳跃误差,在保证结构光三维测量中本身的精度和优点下,获取更多的有效相位信息,同时,本发明方法在过亮过暗和抗噪性上也有较好的效果,算法具有较好的鲁棒性,该解相方法操作简单,能够极大抑制和校正传统外差解相方法中出现的相位跳跃误差,适合大规模的推广和应用。The beneficial effect of the present invention is: the surface structured light phase resolution method based on the moiré sequence grating disclosed in the present invention, the method directly projects the moiré grating fringes with pitches of P12 and P123, compared with the traditional surface structured light direct projection pitch The fringe gratings with pitches P1, P2 and P3 avoid the jump error introduced by the integer and decimal series of fringe gratings with virtual pitches P12 and P123 due to error transmission and amplification in the process of calculating the fractional part of the phase series, This method directly calculates the fractional and integer parts of the phase series of the image collected by the moiré fringe grating with the pitches of P12 and P123, which greatly suppresses and corrects the phase jump error, and ensures its own accuracy and advantages in structured light three-dimensional measurement At the same time, the method of the present invention also has a better effect on over-brightness and over-darkness and noise resistance, and the algorithm has better robustness. The phase resolution method is simple to operate and can greatly It suppresses and corrects the phase jump error that occurs in the traditional heterodyne phase resolution method, and is suitable for large-scale promotion and application.
附图说明Description of drawings
下面结合附图和实施例对本发明作进一步描述:The present invention will be further described below in conjunction with accompanying drawing and embodiment:
图1是本发明的测量系统的示意图。Fig. 1 is a schematic diagram of the measurement system of the present invention.
图2是本发明的该基于摩尔序列光栅的面结构光解相方法的流程示意图。Fig. 2 is a schematic flow chart of the molar sequence grating-based surface structure photolysis method of the present invention.
图3是本发明的该基于摩尔序列光栅的面结构光解相方法的摩尔序列光栅生成示意图。Fig. 3 is a schematic diagram of generating moiré sequence gratings in the moiré sequence grating-based planar structure photolysis method of the present invention.
图4是本发明的该基于摩尔序列光栅的面结构光解相方法的简要实施示意图。Fig. 4 is a schematic diagram of the implementation of the molar sequence grating-based planar structure photolysis method of the present invention.
具体实施方式Detailed ways
如图1至图3所示是依本发明的发明精神提供的一种基于摩尔序列光栅的面结构光解相方法,其通过一个结构光测量系统来实现,该测量系统包括一个投影仪1、一个工业相机2以及一个终端3,该投影仪1和该工业相机2布置在被测物体4前方,并且该投影仪1和该工业相机2均连接于该终端3。该终端3能够控制该投影仪1向该被测量物体投射具有相位信息的条纹光栅,该工业相机2能够实时采集经过该被测量物体表面调制的条纹图像,并将其发送到该终端3以进行分析和后续的操作,例如进行该方法的操作。As shown in Figures 1 to 3, according to the inventive spirit of the present invention, a moiré sequence grating-based surface structure photolysis method is provided, which is realized by a structured light measurement system, and the measurement system includes a projector 1, An industrial camera 2 and a terminal 3 , the projector 1 and the industrial camera 2 are arranged in front of the measured object 4 , and both the projector 1 and the industrial camera 2 are connected to the terminal 3 . The terminal 3 can control the projector 1 to project a fringe grating with phase information to the measured object, and the industrial camera 2 can collect the fringe image modulated by the surface of the measured object in real time and send it to the terminal 3 for further processing. Analysis and subsequent operations, such as performing the operations of the method.
结合图1所示,本发明公开一种基于摩尔序列光栅的面结构光解相方法,具体步骤如下:As shown in Fig. 1, the present invention discloses a surface structure photolysis method based on molar sequence grating, the specific steps are as follows:
步骤1:由如图1所示的面结构光测量系统,主要由该投影仪1、该工业相机2、该终端3组成,其中该投影仪1和该工业相机2布置在被测物体4前方,其布置位置应保证该工业相机2拍摄范围覆盖该投影仪1的投影范围。例如,在图1这个例子中,该投影仪1和该工业相机2分别位于该被测物体的前方,并且该投影仪1和该工业相机2分别位于该被测物体的两侧,从而该投影仪1能够从该被测物体的前方的一个侧部向该被测物体投影调制后的条纹图像,该工业相机2能够从该被测物体的前方的另一个侧部拍摄被投射到该被测物体的该条纹图像;预设三个节距分别为P1、P2与P3的一级光栅条纹并以两个为一组的方式获得两个节距分别为P12和P23的虚拟的二级莫尔光栅条纹,根据该两个二级光栅条纹获得节距为P123的虚拟的三级莫尔光栅条纹,所述三级莫尔光栅条纹为全场光栅条纹,优选地,步骤1中,所述二级莫尔光栅条纹和三级莫尔光栅条纹的节距通过下列(1)至(3)式求得:Step 1: The surface structured light measurement system as shown in Figure 1 is mainly composed of the projector 1, the industrial camera 2, and the terminal 3, wherein the projector 1 and the industrial camera 2 are arranged in front of the measured object 4 , and its arrangement position should ensure that the shooting range of the industrial camera 2 covers the projection range of the projector 1 . For example, in the example of Fig. 1, the projector 1 and the industrial camera 2 are respectively located in front of the measured object, and the projector 1 and the industrial camera 2 are respectively located on both sides of the measured object, so that the projection The instrument 1 can project a modulated fringe image to the measured object from one side in front of the measured object, and the industrial camera 2 can shoot the fringe image projected onto the measured object from the other side in front of the measured object. The fringe image of the object; preset three first-order grating fringes with pitches of P1, P2 and P3 respectively, and obtain two virtual second-order moire with pitches of P12 and P23 respectively in a group of two Grating stripes, according to the two second-level grating stripes, virtual three-level Moiré grating stripes with a pitch of P123 are obtained, and the three-level Moiré grating stripes are full-field grating stripes. Preferably, in step 1, the two The pitches of the first-order Moiré grating fringes and the third-order Moiré grating fringes are obtained by the following formulas (1) to (3):
其中节距P1、P2、P3、P12和P23需满足一下要求:P1<P2<P3,P12<P23且节距为P123的条纹光栅需覆盖全场;Among them, the pitches P1, P2, P3, P12 and P23 need to meet the following requirements: P1<P2<P3, P12<P23 and the stripe grating with the pitch of P123 needs to cover the whole field;
步骤2:根据步骤1获得节距数据生成节距分别为P1、P12和P123的一级光栅条纹、二级莫尔光栅条纹和三级莫尔光栅条纹的四步相移光栅条纹图像,分别记为投影图像1、投影图像12和投影图像123;Step 2: According to the pitch data obtained in step 1, generate the four-step phase-shift grating fringe images of the first-order grating fringes, the second-order Moiré grating fringes, and the third-order Moiré grating fringes with the pitches of P1, P12, and P123 respectively. are projected image 1, projected image 12 and projected image 123;
步骤3:将投影图像1、投影图像12和投影图像123分别通过投影仪投影到物体表面,并通过相机采集图像,获得采集图像1、采集图像12和采集图像123;Step 3: Projecting the projected image 1, the projected image 12 and the projected image 123 onto the surface of the object through the projector respectively, and collecting the images through the camera to obtain the collected image 1, the collected image 12 and the collected image 123;
步骤4:根据步骤3中获得采集图像1、采集图像12和采集图像123,计算对应采集图像的包裹相位优选地,其中步骤4中,各采集图像的包裹相位下列(4)至(6)式求得:Step 4: According to the acquisition image 1, acquisition image 12 and acquisition image 123 obtained in step 3, calculate the wrapping phase of the corresponding acquisition image Preferably, in step 4, the following (4) to (6) formulas obtain the wrapping phase of each acquired image:
其中I1d、I12d、I123d…为对应采集图像四幅图中对应像素的亮度值。Wherein I1d , I12d , I123d . . . are brightness values of corresponding pixels in the four images corresponding to the collected images.
步骤5:根据步骤4中获得包裹相位计算采集图像1的相位级数小数部分Δn1与整数部分N1、采集图像12的相位级数小数部分Δn12和整数部分以及采集图像123的相位级数小数部分Δn123和整数部分N123;优选地,其中步骤5中,所述采集图像1的相位级数小数部分Δn1与整数部分N1通过下列(7)至(11)式求得:Step 5: Obtain the package phase according to step 4 Calculate the phase series fractional part Δn1 and the integer part N1 of the collected image 1, the phase series fractional part Δn12 and the integer part of the collected image 12, and the phase series fractional part Δn123 and the integer part N123 of the collected image 123; preferably, the steps In 5, the fractional part Δn1 and the integer part N1 of the phase series of the acquired image 1 are obtained by the following formulas (7) to (11):
其中,round表示四舍五入取整运算,并且由于节距123为全场光栅,因此N123=0,通过上述,可以计算出N12,N1,经检验,计算出的整数级数未有跳跃现象。Among them, round means rounding and rounding operations, and since the pitch 123 is a full-field grating, N123=0. Through the above, N12 and N1 can be calculated. After inspection, the calculated integer series has no jumping phenomenon.
步骤6:根据步骤5中获得的采集图像1的相位级数小数部分Δn1与整数部分N1,计算采集图像1的绝对相位Φ1,优选地,步骤6中,根据(12)式可直接计算出采集图像1的绝对相位Φ1:Step 6: Calculate the absolute phase Φ1 of the acquired image 1 according to the phase series fractional part Δn1 and integer part N1 of the acquired image 1 obtained in step 5. Preferably, in step 6, the acquisition can be directly calculated according to formula (12) Absolute phase Φ1 of image 1:
总的来说,本发明在面结构光三维测量系统中,相位解相结果中由于整数级数求取产生跳跃现象的抑制和校正的技术思路是,利用直接生成摩尔序列条纹光栅图像,再经由投影仪投影,工业相机采集,以此获得各采集图像的包裹限位进一步直接求取采集图像的相位级数12和采集图像123的小数部分Δn12,Δn123的方法,避免了传统多频外差解相过程中,由于误差传递和放大造成Δn12,Δn123求取时的极大跳动,继而造成整数级数的跳动,引入绝对相位整数倍的2π跳跃误差。In general, in the surface structured light three-dimensional measurement system, the technical idea of suppressing and correcting the jump phenomenon caused by the calculation of the integer series in the phase resolution result of the present invention is to use the direct generation of moiré sequence fringe grating images, and then through Projector projection, industrial camera collection, in order to obtain the package limit of each collected image Further, the method of directly obtaining the phase series 12 of the collected image and the fractional parts Δn12 and Δn123 of the collected image 123 avoids the extreme error when obtaining Δn12 and Δn123 due to error transmission and amplification in the traditional multi-frequency heterodyne phase resolution process. Large jumps, and then cause jumps of integer series, and introduce 2π jump errors of integer multiples of the absolute phase.
最后说明的是,以上实施例仅用以说明本发明的技术方案而非限制,尽管参照较佳实施例对本发明进行了详细说明,本领域的普通技术人员应当理解,可以对本发明的技术方案进行修改或者等同替换,而不脱离本发明技术方案的宗旨和范围,其均应涵盖在本发明的权利要求范围当中。Finally, it is noted that the above embodiments are only used to illustrate the technical solutions of the present invention without limitation. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present invention can be carried out Modifications or equivalent replacements without departing from the spirit and scope of the technical solution of the present invention shall be covered by the claims of the present invention.
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| CN201711397481.4ACN108061517B (en) | 2017-12-21 | 2017-12-21 | Surface structure photolysis method based on Moire sequence grating |
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| CN110207621A (en)* | 2019-06-04 | 2019-09-06 | 重庆大学 | A kind of area-structure light solution phase method based on the four-step phase-shifting in a disguised form moved |
| CN110207620A (en)* | 2019-06-04 | 2019-09-06 | 重庆大学 | A kind of three-dimensional rebuilding method determining digital fringe projection structure optical orders by different frequency |
| CN110428459A (en)* | 2019-06-04 | 2019-11-08 | 重庆大学 | A method of the Phase- un- wrapping based on numerical order coding |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000234920A (en)* | 1999-02-15 | 2000-08-29 | Hitachi Electronics Eng Co Ltd | Wafer flatness measurement device |
| CN101109616A (en)* | 2007-08-02 | 2008-01-23 | 华中科技大学 | A Three-Frequency Heterodyne Phase Shift Phase Decomposition Method |
| CN202074952U (en)* | 2011-05-04 | 2011-12-14 | 李中伟 | Three dimensional profiles and colored textures acquisition system based on single camera-single overhead projector |
| CN107063128A (en)* | 2016-04-29 | 2017-08-18 | 华南师范大学 | A kind of double frequency phase shift method for three-dimensional measurement and system |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000234920A (en)* | 1999-02-15 | 2000-08-29 | Hitachi Electronics Eng Co Ltd | Wafer flatness measurement device |
| CN101109616A (en)* | 2007-08-02 | 2008-01-23 | 华中科技大学 | A Three-Frequency Heterodyne Phase Shift Phase Decomposition Method |
| CN202074952U (en)* | 2011-05-04 | 2011-12-14 | 李中伟 | Three dimensional profiles and colored textures acquisition system based on single camera-single overhead projector |
| CN107063128A (en)* | 2016-04-29 | 2017-08-18 | 华南师范大学 | A kind of double frequency phase shift method for three-dimensional measurement and system |
| Title |
|---|
| 李中伟: "基于数字光栅投影的结构光三维测量技术与系统研究", 《中国博士学位论文全文数据库 信息科技辑》* |
| 陈玲等: "基于多频外差原理的相位解包裹方法", 《光学技术》* |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109297435A (en)* | 2018-10-24 | 2019-02-01 | 重庆大学 | A Color Digital Raster Coding Method Reversely Cancelling Nonlinear Errors |
| CN110207621A (en)* | 2019-06-04 | 2019-09-06 | 重庆大学 | A kind of area-structure light solution phase method based on the four-step phase-shifting in a disguised form moved |
| CN110207620A (en)* | 2019-06-04 | 2019-09-06 | 重庆大学 | A kind of three-dimensional rebuilding method determining digital fringe projection structure optical orders by different frequency |
| CN110428459A (en)* | 2019-06-04 | 2019-11-08 | 重庆大学 | A method of the Phase- un- wrapping based on numerical order coding |
| CN110207620B (en)* | 2019-06-04 | 2021-07-02 | 重庆大学 | A 3D Reconstruction Method for Determining the Structured Light Series of Digital Grating Projection by Different Frequency |
| CN110428459B (en)* | 2019-06-04 | 2023-05-16 | 重庆大学 | Digital sequential coding-based phase unwrapping method |
| Publication number | Publication date |
|---|---|
| CN108061517B (en) | 2020-08-11 |
| Publication | Publication Date | Title |
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