技术领域technical field
本发明属于三维测量技术领域，尤其涉及一种显微三维测量装置及系统。The invention belongs to the technical field of three-dimensional measurement, and in particular relates to a microscopic three-dimensional measurement device and system.
背景技术Background technique
三维技术应用越来越广泛，三维图像能让我们更好的感知现实世界多样化，如何通过更加方便快捷的方式获取物体三维点云数据是三维测量领域的热点，目前常用的三维测量方法是基于三角测量原理的结构光测量方法，一般的三角测量法，由于投影光轴和摄像光轴之间成一定的角度，这样就会受到物体表面面形的影响，出现有些物体表面区域投影仪可以投射的到，但是摄像机拍不到；而有些摄像机拍的到区域，而投影仪投不到，最终导致重建的物体三维面型数据不完整，这种三角测量原理固有的遮挡和阴影问题限制了该方法的应用。The application of 3D technology is becoming more and more widespread. 3D images can allow us to better perceive the diversity of the real world. How to obtain 3D point cloud data of objects in a more convenient and quick way is a hot spot in the field of 3D measurement. Currently, the commonly used 3D measurement methods are based on The structured light measurement method of the triangulation principle, the general triangulation method, because the projection optical axis and the camera optical axis form a certain angle, it will be affected by the surface shape of the object, and some object surface areas can be projected by the projector. However, some cameras can capture the area, but the projector cannot project it, which eventually leads to incomplete 3D surface data of the reconstructed object. The inherent occlusion and shadow problems of this triangulation principle limit the application of the method.
而光场相机以其成像方面记录多维光线信息的优势，开辟了研究三维成像的新领域。目前对于光场相机的三维重建方法一般是采用基于傅立叶切片定理，对四维光场数据进行分析，根据不同深度的像点的聚焦位置不一样，构建适当的滤波函数，得出大量随着深度变化图像对焦区域变化的层析图片，然后根据深度和对焦点的关系重建出物体表面三维面型，精度取决于层析的层数，相对精度较低。The light field camera has opened up a new field of research on three-dimensional imaging with its advantages of recording multi-dimensional light information in imaging. At present, the 3D reconstruction method of light field camera is generally based on the Fourier slice theorem to analyze the 4D light field data. The tomographic picture of the changing focus area of the image, and then reconstruct the three-dimensional surface shape of the object surface according to the relationship between the depth and the focus point. The accuracy depends on the number of layers of the tomography, and the relative accuracy is low.
发明内容Contents of the invention
本发明所要解决的技术问题在于提供一种显微三维测量装置及系统，旨在利用光场相机与结构光三维测量相结合来实现对待测量物的微结构面形高精度三维测量。The technical problem to be solved by the present invention is to provide a microscopic three-dimensional measurement device and system, aiming at realizing high-precision three-dimensional measurement of the microstructure surface shape of the object to be measured by combining a light field camera with structured light three-dimensional measurement.
本发明提供了一种显微三维测量装置，包括：结构光生成装置、光路转向组件、成像透镜组和CCD；The invention provides a microscopic three-dimensional measuring device, comprising: a structured light generating device, an optical path steering component, an imaging lens group and a CCD;
所述结构光生成装置用于产生结构光；The structured light generating device is used to generate structured light;
所述光路转向组件用于将所述结构光引导至待测量物上，并在经过所述待测量物后，将携带有物体图像信息的光线引导至所述成像透镜组；The optical path steering component is used to guide the structured light to the object to be measured, and guide the light carrying the image information of the object to the imaging lens group after passing through the object to be measured;
所述成像透镜组包括主透镜、微透镜阵列即光场相机，用于透射所述光线；The imaging lens group includes a main lens, a microlens array that is a light field camera, and is used to transmit the light;
所述CCD用于记录从所述微透镜阵列中相邻的微透镜透射的光线，得到记录的图像。The CCD is used to record light transmitted from adjacent microlenses in the microlens array to obtain recorded images.
进一步地，所述结构光生成装置为投影装置，所述投影装置沿光路方向依次包括：光源、第一透镜、光栅和第二透镜，所述投影装置用于投射光栅图像。Further, the structured light generation device is a projection device, and the projection device sequentially includes: a light source, a first lens, a grating and a second lens along the direction of the optical path, and the projection device is used for projecting a grating image.
进一步地，所述光路转向组件包括器件:可调平面镜、第一光路转向组件、第二光路转向组件和毛玻璃。Further, the optical path steering assembly includes devices: an adjustable plane mirror, a first optical path steering assembly, a second optical path steering assembly, and frosted glass.
进一步地，所述第一光路转向组件沿光路方向包括第一平面镜、半透半反镜和第一透镜组；Further, the first optical path diversion assembly includes a first plane mirror, a half mirror and a first lens group along the direction of the optical path;
当所述可调平面镜用于将光路引导至所述第一光路转向组件时，所述可调平面镜与所述结构光的传播方向呈第一角度放置，所述可调平面镜和所述第一平面镜平行，并和所述半透半反镜互补。When the adjustable plane mirror is used to guide the light path to the first light path turning assembly, the adjustable plane mirror is placed at a first angle to the propagation direction of the structured light, and the adjustable plane mirror and the first light path The plane mirror is parallel and complementary to the half mirror.
进一步地，所述第二光路转向组件沿光路方向包括第二平面镜、第三平面镜、第二透镜组和毛玻璃；Further, the second optical path diversion assembly includes a second plane mirror, a third plane mirror, a second lens group, and ground glass along the optical path direction;
当所述可调平面镜用于将光路引导至所述第二光路转向组件时，所述可调平面镜与所述结构光的传播方向呈第二角度放置，所述可调平面镜和所述第二平面镜平行，并和所述第三平面镜互补；When the adjustable plane mirror is used to guide the light path to the second light path turning assembly, the adjustable plane mirror is placed at a second angle to the propagation direction of the structured light, and the adjustable plane mirror and the second the plane mirror is parallel and complementary to the third plane mirror;
所述第一角度和第二角度互补。The first and second angles are complementary.
进一步地，所述第一角度为45度，所述第二角度为135度。Further, the first angle is 45 degrees, and the second angle is 135 degrees.
进一步地，所述待测量物置于所述第一透镜组和所述毛玻璃之间并贴合于所述毛玻璃；Further, the object to be measured is placed between the first lens group and the ground glass and attached to the ground glass;
若所述待测量物为非透明物体，则所述投影装置出射的光线经过所述第一光路转向组件；If the object to be measured is a non-transparent object, the light emitted by the projection device passes through the first optical path turning assembly;
若所述待测量物为透明物体，则所述投影装置出射的光线经过所述第二光路转向组件。If the object to be measured is a transparent object, the light emitted by the projection device passes through the second light path turning assembly.
进一步地，所述微透镜阵列与所述主透镜之间距离为主透镜焦距，所述微透镜阵列到所述CCD的距离为单个微透镜的焦距。Further, the distance between the microlens array and the main lens is the focal length of the main lens, and the distance between the microlens array and the CCD is the focal length of a single microlens.
本发明还提供了一种显微三维测量系统，所述系统包括：上述显微三维测量装置和图像处理单元，所述图像处理单元包括图像处理模块、等相位点查找模块、连接模块和求解模块；The present invention also provides a microscopic three-dimensional measurement system, the system includes: the above-mentioned microscopic three-dimensional measurement device and an image processing unit, the image processing unit includes an image processing module, an isophase point search module, a connection module and a solution module ;
所述图像处理模块，用于对记录的图像进行处理得到绝对相位图；The image processing module is used to process the recorded image to obtain an absolute phase map;
所述等相位点查找模块，用于在所述绝对相位图中，通过等相位查找得到相位值相等的等相位点；The equiphase point search module is used to obtain equiphase points with equal phase values through equiphase search in the absolute phase diagram;
所述连接模块，用于通过标定确定所述微透镜阵列中的微透镜中心点的坐标，连接微透镜中心点到其相对应的宏像素中的等相位点，来构建多条三维空间直线；The connection module is used to determine the coordinates of the center point of the microlens in the microlens array by calibration, and connect the center point of the microlens to the equiphase point in its corresponding macro pixel to construct a plurality of three-dimensional space straight lines;
所述求解模块，用于求解所述多条三维空间直线的交点，得到具有深度信息的三维空间点坐标，即求得待测量物三维点云数据。The solving module is used to solve the intersection points of the plurality of three-dimensional space straight lines to obtain the three-dimensional space point coordinates with depth information, that is, to obtain the three-dimensional point cloud data of the object to be measured.
本发明与现有技术相比，有益效果在于：本发明提供的一种显微三维测量装置及系统，将光场成像技术和结构光三维测量相结合，可以对透明物体或者非透明物体进行测量，得到图像，并对所述图像进行处理，得到连续的绝对相位图，再进行相位点匹配重建三维面型；该装置及系统解决了结构光三维测量中存在的阴影遮挡的问题；同时，将光场相机和结构光三维测量相结合，极大的提高了光场相机的像素利用率，处理数据达到了亚像素级别，具有更高的灵敏度和精确度。Compared with the prior art, the present invention has the beneficial effect that: a microscopic three-dimensional measurement device and system provided by the present invention combines light field imaging technology and structured light three-dimensional measurement, and can measure transparent objects or non-transparent objects , to obtain the image, and process the image to obtain a continuous absolute phase map, and then perform phase point matching to reconstruct the three-dimensional surface shape; the device and system solve the problem of shadow occlusion in the structured light three-dimensional measurement; at the same time, the The combination of light field camera and structured light three-dimensional measurement greatly improves the pixel utilization rate of light field camera, and the processing data reaches the sub-pixel level, with higher sensitivity and accuracy.
附图说明Description of drawings
图1是本发明实施例提供的一种显微三维测量装置的示意图；Fig. 1 is a schematic diagram of a microscopic three-dimensional measuring device provided by an embodiment of the present invention;
图2是本发明实施例提供的一种显微三维测量系统的示意图；Fig. 2 is a schematic diagram of a microscopic three-dimensional measurement system provided by an embodiment of the present invention;
图3是图2提供的显微三维测量系统中的图像处理单元的模块示意图；Fig. 3 is a block diagram of an image processing unit in the microscopic three-dimensional measurement system provided in Fig. 2;
图4是本发明实施例提供的由等相位点求解像点的模块示意图。Fig. 4 is a schematic diagram of a module for solving image points from equiphase points provided by an embodiment of the present invention.
具体实施方式detailed description
为了使本发明的目的、技术方案及优点更加清楚明白，以下结合附图及实施例，对本发明进行进一步详细说明。应当理解，此处所描述的具体实施例仅仅用以解释本发明，并不用于限定本发明。In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
本发明的主要实现思想为：本发明提供的一种显微三维测量装置及系统，物空间单个三维坐标点发射的光线经过第一透镜组、半透半反镜和主透镜后成像，光线继续向前传播，会被多个微透镜后的CCD捕获，得到记录的图像。每个微透镜后对应一个N*N的宏像素，一个物空间点最终会对应多个记录的图像上像点，通过连续拍摄多张相移图像结合差频相位展开算法，得到绝对相位图；通过在若干相邻宏像素中等相位查找，找出所有具有相同相位的像素点，将微透镜阵列用小孔模型代替，通过标定确定微透镜的中心坐标，连接微透镜中心点到其相对应的宏像素中的等相位的像素点，构建多条三维空间直线；并求解多条三维空间直线的交点，得到具有深度信息三维空间点坐标，即求取了三维点云数据。The main realization idea of the present invention is: a microscopic three-dimensional measuring device and system provided by the present invention, the light emitted by a single three-dimensional coordinate point in the object space is imaged after passing through the first lens group, the half mirror and the main lens, and the light continues to The forward propagation will be captured by the CCD behind multiple microlenses to obtain recorded images. Each microlens corresponds to an N*N macro pixel, and one object space point will eventually correspond to multiple recorded image points, and the absolute phase map is obtained by continuously shooting multiple phase-shifted images combined with the difference frequency phase expansion algorithm; Find all the pixels with the same phase by searching for the same phase in several adjacent macro pixels, replace the microlens array with a small hole model, determine the center coordinates of the microlens through calibration, and connect the center point of the microlens to its corresponding The pixel points in the same phase in the macro pixel construct multiple three-dimensional space straight lines; and solve the intersection points of multiple three-dimensional space straight lines to obtain the coordinates of three-dimensional space points with depth information, that is, obtain the three-dimensional point cloud data.
下面具体介绍这种显微三维测量装置，如图1所示，包括：结构光生成装置(本发明实施例中涉及的结构光生成装置为投影装置1)、光路转向组件2、成像透镜组3、CCD4；This microscopic three-dimensional measurement device is specifically introduced below, as shown in Figure 1, including: a structured light generation device (the structured light generation device involved in the embodiment of the present invention is a projection device 1), an optical path steering assembly 2, and an imaging lens group 3 , CCD4;
所述结构光生成装置用于产生结构光。The structured light generating device is used for generating structured light.
所述投影装置1沿光路方向依次包括：光源11、第一透镜12、光栅13和第二透镜14，用于投射光栅图像，其中所述光栅13可以用DMD或LCD替换。The projection device 1 sequentially includes along the optical path direction: a light source 11, a first lens 12, a grating 13 and a second lens 14 for projecting a grating image, wherein the grating 13 can be replaced by a DMD or an LCD.
所述光路转向组件2用于将所述结构光引导至待测量物上，并在经过所述待测量物后，将携带有物体图像信息的光线引导至所述成像透镜组。The light path turning assembly 2 is used to guide the structured light onto the object to be measured, and after passing through the object to be measured, guide the light carrying the image information of the object to the imaging lens group.
本发明实施例中，所述光路转向组件2用于将所述投影装置投射的光栅图像引导至待测量物上，并在经过所述待测量物后，将投影物体表面条纹图引导至所述成像透镜组3。In the embodiment of the present invention, the optical path turning assembly 2 is used to guide the grating image projected by the projection device onto the object to be measured, and guide the surface fringe pattern of the projected object to the object to be measured after passing through the object to be measured. Imaging lens group 3.
所述成像透镜组3包括主透镜31、微透镜阵列32即光场相机，用于透射所述光线。The imaging lens group 3 includes a main lens 31 and a microlens array 32 ie a light field camera for transmitting the light.
所述CCD4用于记录从所述微透镜阵列32中相邻的微透镜透射的光线，得到记录的图像。The CCD 4 is used to record light transmitted from adjacent microlenses in the microlens array 32 to obtain recorded images.
具体地，所述微透镜阵列32与所述主透镜31之间距离为主透镜焦距，所述微透镜阵列32到所述CCD4的距离为单个微透镜的焦距。Specifically, the distance between the microlens array 32 and the main lens 31 is the focal length of the main lens, and the distance between the microlens array 32 and the CCD 4 is the focal length of a single microlens.
具体地，所述光路转向组件2包括器件:可调平面镜21、第一光路转向组件、第二光路转向组件和毛玻璃28。Specifically, the optical path steering assembly 2 includes devices: an adjustable plane mirror 21 , a first optical path steering assembly, a second optical path steering assembly, and ground glass 28 .
更具体地，所述第一光路转向组件沿光路方向包括第一平面镜22、半透半反镜23、第一透镜组25；所述第二光路转向组件沿光路方向包括第二平面镜26、第三平面镜26、第二透镜组27和毛玻璃28；所述待测量物置于所述第一透镜组25和所述毛玻璃28之间并贴合于所述毛玻璃28。More specifically, the first optical path turning assembly includes a first plane mirror 22, a half-mirror 23, and a first lens group 25 along the optical path direction; the second optical path turning assembly includes a second flat mirror 26, a first Three plane mirrors 26 , a second lens group 27 and ground glass 28 ; the object to be measured is placed between the first lens group 25 and the ground glass 28 and bonded to the ground glass 28 .
当所述可调平面镜用于将光路引导至所述第一光路转向组件时，所述可调平面镜21与所述结构光的传播方向呈第一角度放置，所述可调平面镜21和所述第一平面镜22平行，并和所述半透半反镜23互补；当所述可调平面镜用于将光路引导至所述第二光路转向组件时，所述可调平面镜21与所述结构光的传播方向呈第二角度放置，所述可调平面镜21和所述第二平面镜26平行，并和所述第三平面镜26互补。When the adjustable plane mirror is used to guide the light path to the first light path turning assembly, the adjustable plane mirror 21 is placed at a first angle with the propagation direction of the structured light, and the adjustable plane mirror 21 and the The first plane mirror 22 is parallel and complementary to the half mirror 23; when the adjustable plane mirror is used to guide the light path to the second light path turning assembly, the adjustable plane mirror 21 and the structured light The propagating direction of the adjustable plane mirror 21 is placed at a second angle, the adjustable plane mirror 21 is parallel to the second plane mirror 26 and is complementary to the third plane mirror 26 .
进一步地，所述第一角度和第二角度互补。Further, the first angle and the second angle are complementary.
本发明实施例中，所述第一角度为45度，所述第二角度为135度。In the embodiment of the present invention, the first angle is 45 degrees, and the second angle is 135 degrees.
若所述待测量物为非透明物体，则实现对非透明的显微物体表面面形的高精度测量。具体地，当所述待测量物为非透明物体时，所述投影装置1出射的光线经过所述第一光路转向组件；所述投影装置1上方的可调平面镜21置于①的位置，投影装置1投射光栅图像，光线经过所述可调平面镜21、第一平面镜22、半透半反镜23和第一透镜组24后，投射到待测量物表面，光线在待测量物表面经过漫反射，产生投影物体表面条纹图，再经过所述第一透镜组24和半透半反镜23，并传播到主透镜31，所述待测量物表面一点通过所述主透镜31会在多个微透镜后面成像，最终被所述成像透镜组3后的CCD4记录，得到记录的图像。If the object to be measured is a non-transparent object, high-precision measurement of the surface shape of the non-transparent microscopic object is realized. Specifically, when the object to be measured is a non-transparent object, the light emitted by the projection device 1 passes through the first optical path turning assembly; the adjustable plane mirror 21 above the projection device 1 is placed at the position ①, and the projection The device 1 projects a grating image. After the light passes through the adjustable plane mirror 21, the first plane mirror 22, the half mirror 23 and the first lens group 24, it is projected onto the surface of the object to be measured, and the light is diffusely reflected on the surface of the object to be measured. , produce the projected object surface fringe pattern, then pass through the first lens group 24 and the half mirror 23, and propagate to the main lens 31, the surface of the object to be measured will pass through the main lens 31 in a plurality of micro The imaging behind the lens is finally recorded by the CCD4 behind the imaging lens group 3 to obtain the recorded image.
若所述待测量物为透明物体，则实现对透明的显微物体表面面形的高精度测量。具体地，当待测量物体为透明时，所述投影装置1出射的光线经过所述第二光路转向组件；所述投影装置1上方的可调平面镜21置于②的位置，投影装置1投射光栅图像，光线经过所述可调平面镜21，再通过所述第二平面镜25、第三平面镜26反射，并穿过第二透镜组27后打在毛玻璃28上，条纹图像在毛玻璃28上经过漫反射，而后光线透过待测量物产生投影物体表面条纹图，再经过第一透镜组24和半透半反镜23，并传播到主透镜31，所述待测量物表面一点通过所述主透镜31会在多个微透镜后面成像，最终被所述成像透镜组3后的CCD4记录。If the object to be measured is a transparent object, high-precision measurement of the surface shape of the transparent microscopic object is realized. Specifically, when the object to be measured is transparent, the light emitted by the projection device 1 passes through the second optical path turning assembly; the adjustable plane mirror 21 above the projection device 1 is placed at the position ②, and the projection device 1 projects the grating Image, the light passes through the adjustable plane mirror 21, then is reflected by the second plane mirror 25 and the third plane mirror 26, and passes through the second lens group 27 and hits on the frosted glass 28, and the fringe image is diffusely reflected on the ground glass 28 , then the light passes through the object to be measured to generate the projected object surface fringe pattern, then passes through the first lens group 24 and the half mirror 23, and propagates to the main lens 31, and the surface of the object to be measured passes through the main lens 31 at one point It will be imaged behind a plurality of microlenses, and finally recorded by the CCD4 behind the imaging lens group 3 .
本发明提供的这种显微三维测量装置，将光场成像技术和结构光三维测量相结合，可以对透明物体或者非透明物体进行测量，得到图像。The microscopic three-dimensional measurement device provided by the present invention combines light field imaging technology and structured light three-dimensional measurement, and can measure transparent objects or non-transparent objects to obtain images.
下面具体介绍一种显微三维测量系统，如图2所示，包括上述显微三维测量装置1，还包括图像处理单元2；所述图像处理单元2包括图像处理模块21、等相位点查找模块22、连接模块23和求解模块24，具体如图3所示；A kind of microscopic three-dimensional measuring system is specifically introduced below, as shown in Figure 2, comprises above-mentioned microscopic three-dimensional measuring device 1, also comprises image processing unit 2; Described image processing unit 2 comprises image processing module 21, equiphase point search module 22. The connection module 23 and the solution module 24, specifically as shown in FIG. 3 ;
所述图像处理模块21，用于对记录的图像进行处理得到绝对相位图；The image processing module 21 is configured to process the recorded image to obtain an absolute phase map;
具体地，利用所述显微三维测量装置得到双频相移图像，并对获取的所述双频相移图像通过差频相位展开算法处理得到绝对相位图。Specifically, using the microscopic three-dimensional measuring device to obtain a dual-frequency phase-shifted image, and processing the acquired dual-frequency phase-shifted image through a difference-frequency phase expansion algorithm to obtain an absolute phase map.
更具体地，所述差频相位展开算法的思想为：分别投影两组不同周期的相移条纹图，求解得到两幅不同周期的截断相位图，由于两幅条纹图像的周期不同，因此，由两幅相位图差生成的相位差图像与周期窄的条纹图的级次有关，根据此，我们就可以计算得到窄条纹图的周期编码，并根据该编码进行绝对相位展开。More specifically, the idea of the difference frequency phase unwrapping algorithm is: respectively project two groups of phase-shifted fringe images of different periods, and obtain two truncated phase images of different periods by solving. Since the periods of the two fringe images are different, therefore, by The phase difference image generated by the difference between the two phase images is related to the order of the fringe pattern with a narrow period. Based on this, we can calculate the period code of the narrow fringe pattern, and perform absolute phase expansion according to the code.
所述等相位查找模块22，用于在所述绝对相位图中，通过等相位查找得到相位值相等的等相位点；The equiphase search module 22 is configured to obtain equiphase points with equal phase values through equiphase search in the absolute phase diagram;
具体地，由于受到主透镜截断频率限制，物空间点发出光线透过主透镜，汇聚成像点后继续向前传播，打到微透镜阵列上为圆形区域(锥形切面)，光线通过微透镜中心(小孔)的光线最终会在微透镜后的CCD上成像，来自同一个物点的光线就会在若干相邻的微透镜后面的CCD上成像，这些像点具有相同的绝对相位值；给定某个特征点像素坐标以及水平和竖直方向绝对相位值，通过水平方向和竖直方向插值，确定其它具有相同相位值点的像素坐标。Specifically, due to the limitation of the truncation frequency of the main lens, the light emitted from the object space point passes through the main lens, converges to the imaging point and continues to propagate forward, and hits the microlens array as a circular area (conical section), and the light passes through the microlens The light in the center (small hole) will eventually be imaged on the CCD behind the microlens, and the light from the same object point will be imaged on the CCD behind several adjacent microlenses, and these image points have the same absolute phase value; Given the pixel coordinates of a certain feature point and the absolute phase values in the horizontal and vertical directions, determine the pixel coordinates of other points with the same phase value through interpolation in the horizontal and vertical directions.
更具体地，确定相同相位值点的过程为：对于得到的连续的绝对相位图，设定合适的窗口大小在相邻的宏像素中查找相位相等的点，通过插值的方法查找水平相位和竖直相位均相等的点，最终确定等相位点；像素坐标图3中P1、P2、P3表示查找到具有相同水平和竖直相位的像素点。More specifically, the process of determining points with the same phase value is as follows: for the obtained continuous absolute phase image, set an appropriate window size to find points with equal phases in adjacent macro pixels, and find out the horizontal phase and vertical phase by interpolation. The points with equal vertical phases are finally determined as equal phase points; P1, P2, and P3 in the pixel coordinate diagram 3 indicate that the pixel points with the same horizontal and vertical phases are found.
具体地，关于宏像素，一个微透镜后面会成NxN像素大小的像(例如：20x20大小)，每个微透镜后面对应的NxN大小的图像就叫一个宏像素，一个微透镜就会对应一个宏像素，算法的思想基于光线追迹连接像素坐标点和微透镜中心坐标点(小孔模型中心点)，从而构造出光线路径。Specifically, with regard to macro pixels, an image of NxN pixel size (for example: 20x20 size) will be formed behind a microlens, and the corresponding NxN size image behind each microlens is called a macro pixel, and a microlens will correspond to a macro pixel. Pixel, the idea of the algorithm is based on ray tracing to connect the pixel coordinate point and the microlens center coordinate point (the center point of the small hole model), so as to construct the ray path.
所述连接模块23，用于通过标定确定所述微透镜阵列中的微透镜中心点的坐标，连接微透镜中心点到其相对应的宏像素中的等相位点，来构建多条三维空间直线；The connection module 23 is used to determine the coordinates of the microlens center point in the microlens array by calibration, and connect the microlens center point to the equiphase point in its corresponding macro pixel to construct a plurality of three-dimensional space straight lines ;
具体地，将微透镜用小孔模型代替，通过标定确定微透镜的中心坐标，连接微透镜中心点到其相对应的宏像素中的等相位点，来构建多条三维空间直线。Specifically, the microlens is replaced by a pinhole model, the center coordinates of the microlens are determined by calibration, and multiple three-dimensional space lines are constructed by connecting the center point of the microlens to the equiphase point in its corresponding macro pixel.
具体地，关于小孔模型，满足近光轴条件近似下，即物距远大于像距时，微透镜可以用小孔来代替，小孔坐标就是微透镜的几何中心。Specifically, regarding the pinhole model, under the approximation of the near optical axis condition, that is, when the object distance is far greater than the image distance, the microlens can be replaced by a pinhole, and the pinhole coordinates are the geometric center of the microlens.
所述求解模块24，用于求解所述多条三维空间直线的交点，得到具有深度信息的三维空间点坐标P(X,Y,Z)，即求得待测量物三维点云数据。The solving module 24 is used to solve the intersection points of the plurality of three-dimensional space straight lines to obtain the three-dimensional space point coordinates P(X, Y, Z) with depth information, that is, to obtain the three-dimensional point cloud data of the object to be measured.
具体地，图4中坐标P(X,Y,Z)为得到的具有深度信息三维空间点的坐标，即像点的坐标。Specifically, the coordinates P(X, Y, Z) in FIG. 4 are the obtained coordinates of the three-dimensional space point with depth information, that is, the coordinates of the image point.
本发明提供了一种基于光场相机和结构光的显微三维测量装置及系统，将结构光三维测量和光场相机相结合，一方面，提高了光场相机的像素利用率，处理的像素达到了亚像素级别，提高了重建采样率，也提高了精度；另一方面，构建了同轴测量系统，消除了遮挡和阴影的影响。The present invention provides a microscopic three-dimensional measurement device and system based on a light field camera and structured light, which combines the structured light three-dimensional measurement with the light field camera. On the one hand, the pixel utilization rate of the light field camera is improved, and the processed pixels reach The sub-pixel level is improved, the reconstruction sampling rate is improved, and the accuracy is also improved; on the other hand, a coaxial measurement system is constructed to eliminate the influence of occlusion and shadow.
以上所述仅为本发明的较佳实施例而已，并不用以限制本发明，凡在本发明的精神和原则之内所作的任何修改、等同替换和改进等，均应包含在本发明的保护范围之内。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention should be included in the protection of the present invention. within range.
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| CN201611076078.7ACN106500629B (en) | 2016-11-29 | 2016-11-29 | A microscopic three-dimensional measuring device and system |
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| CN201611076078.7ACN106500629B (en) | 2016-11-29 | 2016-11-29 | A microscopic three-dimensional measuring device and system |
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| CN201611076078.7AActiveCN106500629B (en) | 2016-11-29 | 2016-11-29 | A microscopic three-dimensional measuring device and system |
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