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CN105486491B - A kind of LED lamplight parameter test device and test method - Google Patents

A kind of LED lamplight parameter test device and test method
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Publication number
CN105486491B
CN105486491BCN201610038213.2ACN201610038213ACN105486491BCN 105486491 BCN105486491 BCN 105486491BCN 201610038213 ACN201610038213 ACN 201610038213ACN 105486491 BCN105486491 BCN 105486491B
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heating
cooling mechanism
lamp holder
temperature
cooling
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CN105486491A (en
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刘栓庆
滕金金
阳琳
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Radio And Tv Measurement And Testing Group Co ltd
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Guangzhou GRG Metrology and Test Technology Co Ltd
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Abstract

The invention discloses a kind of LED lamplight parameter test devices, including integrating sphere, heating and cooling mechanism and lamp holder, temperature controller and temperature inductor.Holder is installed in integrating sphere.Heating and cooling mechanism is located at lamp holder in integrating sphere, and heating and cooling mechanism is connected with holder.Lamp holder is connected with heating and cooling mechanism, and heating and cooling mechanism is used to carry out heating and cooling processing to lamp holder, and lamp holder is for installing LED light to be measured.Temperature inductor is used to incude the temperature of lamp holder, and temperature controller is electrically connected with the heating and cooling mechanism, temperature inductor, and temperature controller is used to sense the temperature control heating and cooling mechanism heating and cooling of lamp holder according to temperature inductor, so that lamp holder, which is maintained at, waits for testing temperature.LED lamp holder part is locally heated to and waits for testing temperature by apparatus of the present invention so that LED light to be measured more closing to reality working condition, obtained optical parameter test data more true and accurate.Secondly, the energy consumption during LED lamplight parameter testing reduces, and working efficiency greatly improves.

Description

A kind of LED lamplight parameter test device and test method
Technical field
The present invention relates to LED lamplight parameter detecting technical field, more particularly, to a kind of LED lamplight parameter test device andTest method.
Background technology
For LED light (including LED integrated lamps and LED light engine) optical parameter (including luminous flux, light efficiency, color andService life) test, be currently that LED light is arranged in integrating sphere, then use heating and cooling device to the whole region of integrating sphereHeating and cooling processing is carried out, so that the temperature to LED light accurately controls, and is surveyed by integrating sphere under the conditions of equilibrium temperatureTry the related optical parameter of LED light.
Prior art test method there are following defects:First, use heating and cooling device to integrating sphere whole regionHeating and cooling are carried out, i.e., heating and cooling are carried out to the illuminator of LED light and lamp cap, then the optical parameter of re-test LED lamps, the partyMethod is the LED light parameter tested out under pure theory state, and the temperature of lamp holder is higher than the temperature of lamp body in LED light actual working stateDegree, i.e., the LED light parameter that not LED light tests out under actual working state;Secondly, entire integrating sphere region is heated, waveTake the energy so that testing cost is higher;Secondly, the heating and cooling when test of optical parameter are carried out in different temperatures for LED light to imitateRate is low so that the testing time is longer.
Invention content
Based on this, the invention reside in overcoming the deficiencies of existing technologies, a kind of LED lamplight parameter test device and test are providedMethod, it can obtain optical parameter of the LED light under actual working state, and test energy consumption is relatively low, and testing efficiency is high.
Its technical solution is as follows:
A kind of LED lamplight parameter test device, including:Integrating sphere is installed with holder in the integrating sphere;Heating and cooling mechanismWith lamp holder, the heating and cooling mechanism is located at the lamp holder in the integrating sphere, and the heating and cooling mechanism is connected with the holder,The lamp holder is connected with the heating and cooling mechanism, and the heating and cooling mechanism is used to carry out heating and cooling processing to the lamp holder, describedLamp holder is for installing LED light to be measured;And temperature inductor, the temperature inductor are used to incude the temperature of the lamp holder;Temperature controlDevice, the temperature controller are electrically connected with the heating and cooling mechanism, the temperature inductor, and the temperature controller is used for according to the temperatureDegree inductor senses that the temperature of the lamp holder controls heating and cooling mechanism heating and cooling action.
The present invention also provides a kind of LED lamplight parameter test methods, it uses above-mentioned LED lamplight parameter testing dressIt sets, includes the following steps:LED light to be measured is installed up in the lamp holder of integrating sphere;The lamp holder is heated up by heating and cooling mechanismOr it is cooled to and waits for testing temperature;The actual temperature of lamp holder is obtained by temperature inductor, and the actual temperature is fed back into temperature controlDevice, the temperature controller controls the heating and cooling mechanism heating according to actual temperature or cooling is handled, to realize the reality of the lamp holderBorder temperature waits for that testing temperature is identical with described.
The heating and cooling mechanism includes heating-up mechanism and cooling mechanism, the heating-up mechanism in one of the embodiments,Be connected with the cooling mechanism, the heating-up mechanism be used for the lamp holder carry out heating treatment, the cooling mechanism for pairThe lamp holder cooling processing.
The heating-up mechanism includes heating cylinder in one of the embodiments, and the heating cylinder both ends are separately connectedThere are first end cover and second end cover, the lamp holder to be installed in the first end cover and in the heating cylinder;The dropWarm mechanism includes interior cooling mechanism and outer cooling mechanism, and the interior cooling mechanism is located inside the heating cylinder, described outer scatteredHeat engine structure is located at outside the heating cylinder, and the interior cooling mechanism, the outer cooling mechanism are connect with the second end cover.
The interior cooling mechanism includes inner radiator and internal fan in one of the embodiments, the internal fan and instituteIt states inner radiator to be connected, the inner radiator is connect with second end cover;The outer cooling mechanism includes outer radiator and external fan,The external fan is connected with the outer radiator, and the outer radiator is connect with second end cover.
The inner radiator and/or the outer radiator include several silicon-controlled heat dissipations in one of the embodiments,Piece is stacked to be formed.
In one of the embodiments, cooling piece is provided between the outer radiator and the second end cover.
The outer radiator includes radiating outside the first outer radiator being set up in parallel and second in one of the embodiments,Device, the external fan are arranged between the described first outer radiator and the second outer radiator.
The described first outer radiator and the described second outer radiator include that several are silicon-controlled in one of the embodiments,Cooling fin is stacked to be formed, and the first outer radiator, the second outer radiator are respectively connected with heat-conducting copper pipe, the heat-conducting copper pipeThrough silicon-controlled cooling fin described in several, the heat-conducting copper pipe is connected with silicon-controlled cooling fin described in several.
The described first outer radiator, the second outer radiator are all connected with there are two heat conduction in one of the embodiments,Copper pipe, two heat-conducting copper pipes are set up in parallel, and the heat-conducting copper pipe takes the shape of the letter U shape.
The principle of the present invention, effect are further illustrated with reference to above-mentioned technical proposal:
1, above-mentioned LED lamplight parameter test device carries out lamp holder by heating and cooling mechanism to be heated to waiting for testing temperature, lampSitting toilet is heated to the driving of LED light and driving adjacent component to wait for testing temperature, compared with the existing technology to LED light Omnidirectional heatingMode, the present invention, when carrying out optical parameter detection, only are heated to waiting for testing temperature to LED light to be measured to LED light cap part,There is no heated for LED light light projector face part.In addition, since the optical parameter of LED light to be measured is largely by LED junction temperatureIt influences, and LED junction temperature is related to heat source, heat source is often the rectification circuit of LED light cap part or adjacent other assembliesCaused by circuit.It, can be so that LED to be measured so as it can be seen that LED lamp holder part is locally heated to by apparatus of the present invention waits for testing temperatureLamp more closing to reality working condition, the optical parameter test data more true and accurate obtained by integrating sphere.Secondly as thisInvention comprehensive mode of heating compared with the existing technology, local heating mode is carried out using to lamp holder, can be so that heating and cooling skyBetween become smaller, the energy consumption of such LED lamplight parameter testing reduces, and convenient for LED light rapid temperature rise and drop to be measured, working efficiency is significantlyIt improves.
2, heating-up mechanism and cooling mechanism are provided separately, and incude the temperature of lamp holder in real time by temperature sensor, are passed throughTemperature controller controls corresponding to the cooling mechanism heating and cooling of heating-up mechanism, just can fast implement and adjust the temperature of lamp holder to waiting for thermometricDegree, working efficiency are higher.
3, lamp holder is installed in first end cover and in heating cylinder, interior cooling mechanism is set in heating cylinderPortion, outer cooling mechanism is set to outside the heating cylinder, and interior cooling mechanism, outer cooling mechanism are connect with second end cover.In this way,When heating cylinder electrified regulation acts, just the lamp holder in first end cover is heated up;It radiates when cooling mechanism is poweredWhen, interior cooling mechanism and outer cooling mechanism just synchronization action reduce the temperature of lamp holder.As it can be seen that the present invention will heat up machineStructure is combined with cooling mechanism, and structure is relatively simple, and can facilitate the heating and cooling processing for realizing lamp holder.
Description of the drawings
Fig. 1 is LED lamplight parameter test device structural schematic diagram described in the embodiment of the present invention;
Fig. 2 is the connection circuit of LED lamplight parameter test device temperature controller and heating and cooling mechanism described in the embodiment of the present inventionFigure;
Fig. 3 is the structural schematic diagram of the heating and cooling mechanism of LED lamplight parameter test device described in the embodiment of the present invention;
Fig. 4 is the axial, cross-sectional view of the heating and cooling mechanism of LED lamplight parameter test device described in the embodiment of the present invention;
Fig. 5 is the flow chart of LED lamplight parameter test method described in the embodiment of the present invention.
Reference sign:
10, integrating sphere, 11, holder, 20, heating and cooling mechanism, 21, heating-up mechanism, 211, heating cylinder, 22, coolerStructure, 221, interior cooling mechanism, 2211, inner radiator, 2212, internal fan, 222, outer cooling mechanism, 2221, outer radiator,2221a, the first outer radiator, 2221b, the second outer radiator, 2222, external fan, 2223, heat-conducting copper pipe, 23, first end cover,24, second end cover, 25, cooling piece, 26,12V input terminals, 27,220V input terminals, 28, connecting rod, 281, mounting hole, 30, lampSeat, 40, temperature controller, 41, mains electricity input end, 42,12V output ends, 43,220V output ends, 44, K-type incoming end, 50, temperature senseAnswer device.
Specific implementation mode
The embodiment of the present invention is described in detail below:
As shown in Figure 1, LED lamplight parameter test device of the present invention, including integrating sphere 10, heating and cooling mechanism 20 withLamp holder 30, temperature controller 40 and temperature inductor 50.
Holder 11 is installed in the integrating sphere 10.The heating and cooling mechanism 20 is located at the integrating sphere with the lamp holder 30In 10, the heating and cooling mechanism 20 is connected with the holder 11.The lamp holder 30 is connected with the heating and cooling mechanism 20, the literCooling mechanism 20 is used to carry out heating and cooling processing to the lamp holder 30, and the lamp holder 30 is for installing LED light to be measured.The temperatureInductor 50 is used to incude the temperature of the lamp holder 30.The temperature controller 40 and the heating and cooling mechanism 20, the temperature senseDevice 50 is electrically connected, and temperature controller 40 is used to sense that the temperature of the lamp holder 30 controls the liter according to the temperature inductor 5020 heating and cooling of cooling mechanism, so that the lamp holder 30 is maintained at and waits for testing temperature.
Above-mentioned LED lamplight parameter test device carries out being heated to waiting for testing temperature by heating and cooling mechanism 20 to lamp holder 30,Lamp holder 30 just is heated to the driving of LED light and driving adjacent component to wait for testing temperature, comprehensive to LED light compared with the existing technologyPortion of LED light lamp head branch office, when carrying out optical parameter detection, only is heated to waiting for by mode of heating, the present invention to LED light to be measuredTesting temperature, there is no heated for LED light light projector face part.In addition, due to LED light to be measured optical parameter largely byThe influence of LED junction temperature, and LED junction temperature is related to heat source, heat source is often the rectification circuit or adjacent of LED light cap partCaused by other assemblies circuit.It, can be so that waiting for so as it can be seen that apparatus of the present invention are heated to LED lamp holder part to wait for testing temperatureSurvey LED light more closing to reality working condition, the optical parameter test data more true and accurate obtained by integrating sphere 10.ItsIt is secondary, due to the present invention comprehensive mode of heating compared with the existing technology, local heating mode is carried out using to lamp holder 30, is madeIt obtains heating and cooling space to become smaller, the energy consumption of such LED lamplight parameter testing reduces, and convenient for LED light rapid temperature rise and drop to be measured, workIt is greatly improved as efficiency.
Referring to Fig. 2, the heating and cooling mechanism 20 includes heating-up mechanism 21 and cooling mechanism 22.The heating-up mechanism 21 withThe cooling mechanism 22 is connected, and the heating-up mechanism 21 is used to carry out heating treatment, the cooling mechanism to the lamp holder 3022 for handling 30 cooling of the lamp holder.Cooling mechanism 22 is equipped with 12V input terminals 26, and heating-up mechanism 21 is inputted equipped with 220VEnd 27 is correspondingly provided with mains electricity input end 41,12V output ends 42,220V output ends 43 on temperature controller 40 and is used for and temperature senseThe K-type incoming end 44 for answering device 50 connected.12V output ends 42 and 12 input terminals are electrical connected respectively by conducting wire, 220V outputsEnd 43 is electrical connected with 220V input terminals 27, and K-type incoming end 44 is connected with temperature inductor 50, and temperature controller 40 just can be given respectivelyHeating-up mechanism 21, cooling mechanism 22 are powered, and 30 temperature of lamp holder sensed according to temperature inductor 50, accordingly control warming machine21 heating treatment of structure or control 22 cooling of cooling mechanism processing.As it can be seen that heating-up mechanism 21 is provided separately with cooling mechanism 22, andThe temperature for incuding lamp holder 30 in real time by temperature sensor controls heating-up mechanism 21 and 22 phase of cooling mechanism by temperature controller 40Heating and cooling are answered, just can fast implement and adjust the temperature of lamp holder 30 to waiting for that testing temperature, working efficiency are higher.
Fig. 3 and 4 is please referred to, the heating-up mechanism 21 includes heating cylinder 211.211 both ends of the heating cylinder connect respectivelyIt is connected to first end cover 23 and second end cover 24.It is connected with connecting rod 28 on 211 side wall of heating cylinder, is provided in connecting rod 28Mounting hole 281 for being connected with holder 11.The lamp holder 30 is installed in the first end cover 23 and is located at the cartridge heaterIn body 211.The cooling mechanism 22 includes interior cooling mechanism 221 and outer cooling mechanism 222.The interior cooling mechanism 221 is located atInside the heating cylinder 211, the outer cooling mechanism 222 is located at outside the heating cylinder 211, the interior cooling mechanism221, the outer cooling mechanism 222 is connect with the second end cover 24.When 211 electrified regulation of heating cylinder acts, just canLamp holder 30 in first end cover 23 is heated up;When cooling mechanism 22, which is powered, to radiate, interior cooling mechanism 221 with it is outerThe just synchronization action of cooling mechanism 222 reduces the temperature of lamp holder 30.As it can be seen that the present invention will heat up mechanism 21 and cooling mechanism22 combine, and structure is relatively simple, and can facilitate the heating and cooling processing for realizing lamp holder 30.
Wherein, the interior cooling mechanism 221 includes inner radiator 2211 and internal fan 2212.The internal fan 2212 withThe inner radiator 2211 is connected, and the inner radiator 2211 is connect with second end cover 24.If the inner radiator 2211 includesDry silicon-controlled cooling fin is stacked to be formed.The outer cooling mechanism 222 includes outer radiator 2221 and external fan 2222, described outerFan 2222 is connected with the outer radiator 2221, and the outer radiator 2221 is connect with second end cover 24.The outer radiator2221 include the first outer outer radiator 2221b of radiator 2221a and second being set up in parallel.The external fan 2222 is arranged in instituteIt states between the first outer radiator 2221a and the second outer radiator 2221b.The first outer radiator 2221a and described theTwo outer radiator 2221b, which include that several silicon-controlled cooling fins are stacked, to be formed.
In addition, the first outer radiator 2221a, the second outer radiator 2221b are respectively connected with heat-conducting copper pipe 2223.The heat-conducting copper pipe 2223 runs through several described silicon-controlled cooling fins, and the heat-conducting copper pipe 2223 is described controllable with severalSilicon cooling fin is connected.The first outer radiator 2221a, the second outer radiator 2221b are all connected with there are two heat-conducting copper pipe2223, two heat-conducting copper pipes 2223 are set up in parallel, and the heat-conducting copper pipe 2223 takes the shape of the letter U shape.The outer radiator 2221Cooling piece 25 is provided between the second end cover 24.In this way, being easy to implement heat by inside heating cylinder 211Cooling mechanism 221 is transmitted to the outer cooling mechanism 222 outside heating cylinder 211, can be by the heat Quick diffusing of lamp holder 30.
Referring to Fig. 5, the present invention also provides a kind of LED lamplight parameter test method, it uses above-mentioned LED lamplightParameter test device includes the following steps:
Step S101, LED light to be measured is installed up in the lamp holder 30 of integrating sphere 10;
Step S102, it heats up or cools down by heating and cooling mechanism 20, the lamp holder 30 is heated up or is cooled to and waits for thermometricDegree;
Step S103, the actual temperature of lamp holder 30 is obtained by temperature inductor 50, and the actual temperature is fed back toTemperature controller 40;
Step S104, the temperature controller 40 judges whether actual temperature is identical as testing temperature is waited for, if it is different, then entering stepS102 enters step S105 if identical;
Step S105, the optical parameter of the LED light in the case where covering temperature to be measured is obtained by integrating sphere 10.
Above-mentioned LED lamplight parameter test method carries out being heated to waiting for testing temperature by heating and cooling mechanism 20 to lamp holder 30,Lamp holder 30 just is heated to the driving of LED light and driving adjacent component to wait for testing temperature, comprehensive to LED light compared with the existing technologyMode of heating, when carrying out optical parameter detection, only portion of LED light lamp head branch office is heated to waiting for thermometric present invention LED light to be measuredDegree, LED light light projector face part is not heated so that LED light to be measured more closing to reality working condition, passes through integrating sphere 10The optical parameter test data more true and accurate of acquisition.Secondly, the present invention is used carries out local heating mode to lamp holder 30 so thatHeating and cooling space becomes smaller, and the energy consumption of such LED lamplight parameter testing reduces, and convenient for LED light rapid temperature rise and drop to be measured, workEfficiency greatly improves.
Each technical characteristic of embodiment described above can be combined arbitrarily, to keep description succinct, not to above-mentioned realityIt applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not depositedIn contradiction, it is all considered to be the range of this specification record.
Several embodiments of the invention above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneouslyIt cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the artIt says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the protection of the present inventionRange.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.

Claims (8)

Temperature controller, the temperature controller are electrically connected with the heating and cooling mechanism, the temperature inductor, and the temperature controller is used for rootSense that the temperature of the lamp holder controls heating and cooling mechanism heating and cooling action according to the temperature inductor;The heating and cooling machineStructure includes heating-up mechanism and cooling mechanism, and the heating-up mechanism is connected with the cooling mechanism, and the heating-up mechanism is used for instituteIt states lamp holder and carries out heating treatment, the cooling mechanism is used to handle the lamp holder cooling;The heating-up mechanism includes cartridge heaterBody, the heating cylinder both ends are connected separately with first end cover and second end cover, the lamp holder is installed in the first end cover,And in the heating cylinder;The cooling mechanism includes interior cooling mechanism and outer cooling mechanism, the interior cooling mechanism positionInside the heating cylinder, the outer cooling mechanism is located at outside the heating cylinder, the interior cooling mechanism, it is described it is outer dissipateHeat engine structure is connect with the second end cover.
CN201610038213.2A2016-01-202016-01-20A kind of LED lamplight parameter test device and test methodActiveCN105486491B (en)

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Citations (6)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JP2004309323A (en)*2003-04-082004-11-04Oputeru:Kk Method and apparatus for measuring absolute quantum efficiency of light emitting device
CN200959025Y (en)*2006-10-092007-10-10深圳市量子光电子有限公司LED testing operation platform
CN201016843Y (en)*2006-11-302008-02-06复旦大学 Measuring device for LED luminous flux using narrow beam standard light source
CN201218832Y (en)*2008-06-032009-04-08张九六LED test device
CN101571451A (en)*2008-04-282009-11-04广州市光机电技术研究院Device for continuously detecting integrative luminescence properties of light emitting diode (LED) light source
CN205538160U (en)*2016-01-202016-08-31广州广电计量检测股份有限公司LED light parameter testing device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN203115595U (en)*2013-02-052013-08-07江苏浩格节能科技有限公司Light-emitting diode (LED) indoor illumination lamp
CN103267588B (en)*2013-06-052015-04-01常州工学院Junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JP2004309323A (en)*2003-04-082004-11-04Oputeru:Kk Method and apparatus for measuring absolute quantum efficiency of light emitting device
CN200959025Y (en)*2006-10-092007-10-10深圳市量子光电子有限公司LED testing operation platform
CN201016843Y (en)*2006-11-302008-02-06复旦大学 Measuring device for LED luminous flux using narrow beam standard light source
CN101571451A (en)*2008-04-282009-11-04广州市光机电技术研究院Device for continuously detecting integrative luminescence properties of light emitting diode (LED) light source
CN201218832Y (en)*2008-06-032009-04-08张九六LED test device
CN205538160U (en)*2016-01-202016-08-31广州广电计量检测股份有限公司LED light parameter testing device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
《积分球通用LED光源灯座的优化设计》;刘鹏等;《武汉工程大学学报》;20150131;第37卷(第1期);49-53*

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Address after:No. 8 Qishan Road, Shiqi Town, Panyu District, Guangzhou City, Guangdong Province, 510000, 150

Patentee after:Radio and TV Measurement and Testing Group Co.,Ltd.

Address before:510656 Guangdong city of Guangzhou province Whampoa Avenue Tianhe District Xiping Yun Road No. 163

Patentee before:GUANGZHOU GRG METROLOGY & TEST Co.,Ltd.


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