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CN103455228B - Automatically induction point and the method for capacitance touch screen driving voltage load time are calculated - Google Patents

Automatically induction point and the method for capacitance touch screen driving voltage load time are calculated
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CN103455228B
CN103455228BCN201310391054.0ACN201310391054ACN103455228BCN 103455228 BCN103455228 BCN 103455228BCN 201310391054 ACN201310391054 ACN 201310391054ACN 103455228 BCN103455228 BCN 103455228B
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time
value
driving voltage
sensing points
load time
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CN103455228A (en
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向铭
朱定飞
谭岳德
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ZHUHAI ZHONGHUI MICROELECTRONICS CO Ltd
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ZHUHAI ZHONGHUI MICROELECTRONICS CO Ltd
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Abstract

The present invention relates to a kind of automatic calculating induction point and the method for capacitance touch screen driving voltage load time, wherein, automatically calculate the method for induction point driving voltage load time and include: 1) choose sensing points to be measured;2) carry out binary chop with number of bits for partitioning standards and draw suitable district, find out lock-in regime in suitable district by incremental manner;3) the position decline ratio of binary number is pressed relatively at lock-in regime.The present invention program avoids each time value of use and participates in comparing, efficient and simple.

Description

Automatically induction point and the method for capacitance touch screen driving voltage load time are calculated
[technical field]
The present invention relates to a kind of from automatically calculating induction point and the method for capacitance touch screen driving voltage load time,The method can be widely applied to all kinds of capacitance touching control chip.
[background technology]
Current most of capacitance touching control chip is all poor by checking the change in electrical charge of the sensing element on touch screenValue judges its touch area.
As a rule it is dispersed with multiple sensing element on capacitive touch panel, and each sensing element has relevantThe driving element of connection, has a certain distance to be sufficient for when sensing element detects driving voltage between bothIt is applied in.When going to touch with hands or other conductive bodies, the quantity of electric charge of some driving voltage will be byGalvanic circle is taken away, so that the quantity of electric charge detected diminishes.
When not having touch event to occur, the Charged Couple amount that sensing element detects, it is referred to as reference value(Qbase).By scanning Charged Couple amount which sensing element detects relative to reference value (Qbase)Diminish, it is judged that have touch to occur for this region.
Owing to the charge-coupled time is different required for each sensing element on capacitance plate, if thisThe driving voltage load time, (T) was too small, then cause Partial charge not couple, and reference value (Qbase) partiallyLittle, impact touches and judges.If this driving voltage load time (T) is excessive, then cause whole touch screenThe sensing points detection time too big, affect touch event response speed.
Therefore, when the different capacitance plate of touch chip collocation, or during the great change of surrounding, need to measureCalculate the driving voltage load time (T), ensure to obtain correct reference value.
[summary of the invention]
The technical problem that the invention solves the problems that is to provide a kind of calculating induction point efficiently and simply automatically and swashsThe method encouraging the voltage-drop loading time.
Two technical problems that the invention solves the problems that are to provide a kind of efficient and simply automatically calculate capacitance touchThe method of screen driving voltage load time.
Above-mentioned first technical problem solves by the following technical programs:
The method of the driving voltage load time of a kind of automatic calculating sensing points, it is characterised in that include followingStep:
1) sensing points to be measured is chosen;
2) Optimum Excitation voltage time value is searched in the range of zero to driving voltage load time maximumLock-in regime, specifically:
201) time T is set1, time T2, time T3, time T4, time T5, time TIn 1, time TIn 2,Reference value K, parameter t, figure place w, figure place R, driving voltage load time maximum of Tmax;Wherein, baseQuasi-value K is concrete preset value (number for more than zero), TmaxFor natural number, TmaxBinary form be MPosition complete 1, M is natural number (generally >=4);
202) Tmax is given to TIn 1(TIn 1=Tmax);
203) R=TIn 1The figure place of binary form, the intermediate integer of E=R;Definition T1And T2,T1TwoBinary form is that E position is all 1, T2=2T1+1;With T1It is Q that test sensing points obtains corresponding Charged Couple value1,With T2It is Q that test sensing points obtains corresponding Charged Couple value2
204) if Q2-Q1> reference value K, skips to 205);If Q2-Q1≤ reference value K, then by T now1ValueIt is given to TIn 1,TIn 1=T1, skip to step 203);
205) T3=T2, T4=2T3+1;
206) with T3It is Q that test sensing points obtains corresponding Charged Couple value3, with T4Test sensing points obtains correspondingCharged Couple value is Q4
207) if Q4-Q3> reference value K, then by T now4It is given to T3(T3=T4),T4=2T3+ 1, skip to206);If Q4-Q3≤ reference value K, obtains lock-in regime (T3', T3],T3′=(T3-1)/2, skip to step 3);
3) at lock-in regime (T3', T3] find out Optimum Excitation voltage time value TGood, specifically:
301) TIn 2=T3, w=T3The figure place of binary form;
302) T5=TIn 2-2w-2
303) with T5The Charged Couple value testing corresponding is Q5, t=w, w=t-1;
304) if Q3-Q5> reference value K, skips to step 305);If Q3-Q5≤ reference value K, skips to step306);
305) if w non-1, TIn 2=T5+2w-1, skip to step 302);If w is 1, TGood=T3, skip toStep 307);
306) if w non-1, TIn 2=T5, skip to step 302);If w is 1, TGood=T5, skip to step 307);
307) terminate.
Wherein, E isTake the integer value rounded up after arithmetic point or E isThe integer value of zero is taken after arithmetic point.
Above-mentioned second technical problem solves by the following technical programs:
A kind of method of automatic calculating capacitance touch screen driving voltage load time, it is characterised in that include withLower step:
1) all sensing points are chosen;
2) respectively each sensing points is calculated by the technical scheme solving above-mentioned first technical problemThe good driving voltage load time;
3) compare the Optimum Excitation voltage-drop loading time of all sensing points, select maximum Optimum Excitation voltage to addThe load time is as the driving voltage load time of capacitance touch screen.
As seen from the above technical solution, the technical scheme of above-mentioned first technical problem of solution uses with binary systemFigure place is that partitioning standards carries out binary chop and draws suitable district, finds out lock room in suitable district by incremental mannerBetween, press the position decline ratio of binary number relatively at lock-in regime, when drawing the Optimum Excitation voltage-drop loading of sensing pointsBetween.The present invention program avoids each time value of use and participates in comparing, efficient and simple.Above-mentioned solutionThe technical scheme of two technical problems utilizes the technical scheme of above-mentioned first technical problem of solution to capacitance touchEach sensing points of screen calculates the Optimum Excitation voltage-drop loading time respectively, then selects the Optimum Excitation electricity of maximumThe pressure load time is as the Optimum Excitation voltage-drop loading time of capacitance touch screen.The present invention solves production processMiddle capacitance plate difference, or during the great change of surrounding, calculate asking of Optimum Excitation voltage-drop loading time valueTopic.
[accompanying drawing explanation]
Fig. 1 is the flow chart that embodiment one calculates the method for sensing points driving voltage load time automatically;
Fig. 2 is the flow chart that embodiment two calculates the method for capacitance touch screen driving voltage load time automatically.
[detailed description of the invention]
Embodiment one
As it is shown in figure 1, a kind of method of automatic calculating sensing points driving voltage load time, including following stepRapid:
1) sensing points to be measured is chosen;
2) Optimum Excitation voltage time value is searched in the range of zero to driving voltage load time maximumLock-in regime, specifically:
201) time T is set1, time T2, time T3, time T4, time TIn 1, time TIn 2, reference value K,Figure place w, driving voltage load time maximum of Tmax;Wherein, reference value K is concrete preset value, Tmax'sBinary form is M position complete 1, and M is natural number;
202) by TmaxIt is given to TIn 1, TIn 1=Tmax;This step is in order to first to the driving voltage load timeMaximum of TmaxBinary chop is carried out to determine mediant by its binary figure place;
203) R=TIn 1The figure place of binary form,The integer value rounded up is taken after arithmetic point;FixedJustice T1And T2, T1Binary form be that E position is all 1, T2=2T1+1;With T1Test sensing points obtains correspondingCharged Couple value is Q1, with T2It is Q that test sensing points obtains corresponding Charged Couple value2
This step is the concrete of binary chop, with TIn 1The interposition of number of bits finds out mediant T1And in inciting somebody to actionBetween number T1And on number of bits, compare T1The T of big one2Carry out Charged Couple test realization to compare;
204) if Q2-Q1> reference value K, Charged Couple value difference value is big, illustrates that Optimum Excitation voltage time existsSuitable district (T1, TIn 1], the most also the explanation time is inadequate, T the most now1The least cannot meet, continue to existSuitable district (T1, TIn 1In], the increase driving voltage load time compares, and skips to 205);If Q2-Q1≤ baseQuasi-value K, the change of Charged Couple value is little, then the Optimum Excitation voltage-drop loading time should be (0, T1] in intervalCertain point, then by T now1Value is given to TIn 1, reduce the scope to come again, skip to step 203);
205) T3=T2, T4=2T3+1;This step is to have carried out detection ratio since increasing the driving voltage load timeRelatively, wherein the increase driving voltage load time is with binary numeral as foundation, uses an increase high position to increaseTime;
206) with T3It is Q that test sensing points obtains corresponding Charged Couple value3, with T4Test sensing points obtains correspondingCharged Couple value is Q4
207) if Q4-Q3> reference value K, Charged Couple value difference value the most then illustrates that the time inadequate, needs to continue to increaseThe big driving voltage load time, then by T now4It is given to T3, T3=T4,T4=2T3+ 1, with binary numeralFor increasing the time according to an increase high position, skip to 206);If Q4-Q3≤ reference value K, this is to increase excitation electricitySince the pressure load time, the situation less than or equal to K, then explanation Optimum Excitation voltage-drop loading occur firstTime is at lock-in regime (T3', T3],T3′=(T3-1)/2, skip to step 3);
3) at lock-in regime (T3', T3] make a look up out Optimum Excitation voltage time value TGood, specifically:
301) TIn 2=T3, w=T3The figure place of binary form;
302) T5=TIn 2-2w-2;This step is gradually to carry out toward low level change by binary digit at lock-in regimeRelatively test;
303) with T5The Charged Couple value testing corresponding is Q5, t=w, w=t-1;
304) if Q3-Q5> reference value K, illustrates T now5It is the least, it is impossible to obtain Charged Couple amount completely,Need to increase T5Value, skips to step 305);If Q3-Q5≤ reference value K, illustrates T now5Meet requirement,T can be reduced further5Value, skips to step 306);
305) if w non-1, TIn 2=T5+2w-1, skip to step 302);If w is 1, the most complete, TGood=T3,Skip to step 307);
306) if w non-1, TIn 2=T5, skip to step 302);If w is 1, the most complete, TGood=T5, jumpTo step 307);
307) terminate.
At this so that " the driving voltage load time, maximum was as Tmax=63, unit microsecond, sensing points (P0) surveyThe Optimum Excitation voltage-drop loading time of pilot is 12 microseconds " as a example by, the idiographic flow of the statement present invention:
S1) sensing points (P to be measured is chosen0);
2) in the range of zero to driving voltage load time maximum, find out the lock of Optimum Excitation voltage time valueFixed interval, specifically:
S201) time T is set1, time T2, time T3, time T4, time TIn 1, time TIn 2, reference valueK, driving voltage load time maximum of Tmax;Wherein, reference value K is concrete preset value, Tmax=31, Tmax'sBinary form is 5 full 1=11111(2)
S202) by TmaxIt is given to TIn 1, TIn 1=Tmax=31=11111(2)
S203) R=TIn 1The figure place=5(of binary form due to TIn 1Be entered as T firstmax, it two entersThe figure place of form processed is 5), E isInteger value=3 rounded up are taken after arithmetic point;Definition T1And T2, T1Binary form be that E position is all 1=111(2), T2=2T1+ 1=15, with T1=7 microsecond test sensing pointsObtaining corresponding Charged Couple value is Q1, with T2It is Q that=15 microsecond test sensing points obtain corresponding Charged Couple value2
This step is, first with TmaxThe interposition (the 3rd) of number of bits takes mediant T1=7=111(2),Carry out being incremented by and compare, i.e. binary form to be three be all 1 T1It is four with binary form and is all 1T2=1111(2)Relatively;
S204) now, Q2-Q1> reference value K, T3=T2=15, T4=2T3+1=31;
Charged Couple value difference value the most then illustrates that the time inadequate, T the most now1The least cannot meet, continue to increaseThe driving voltage load time compares, binary form is three be all 1 T3=1111(2)And binary systemForm is four be all 1 T4=11111(2)Relatively;
S205) with T3It is Q that=15 microsecond test sensing points obtain corresponding Charged Couple value3, with T4=31 microseconds are surveyedIt is Q that examination sensing points obtains corresponding Charged Couple value4
S206) now, Q4-Q3≤ reference value K, since this is the increase driving voltage load time, has gone out firstThe now situation less than or equal to K, then the explanation Optimum Excitation voltage-drop loading time is (T in locking time3′=(15-1)/2=7, T3=15];
Then need at (T locking time3'=7, T3=15] carry out reducing the lookup Optimum Excitation voltage-drop loading timeTGood:
301) now, TIn 2=T3=15=1111(2), w=T3Figure place=4 of binary form,
302) T5=TIn 2-2w-2=11=1011(2), by T3Second high position of binary numeral become 0 instituteThe numerical value formed is as T5(pass through TIn 2Convert), to reduce contrast, it is by T first3=15 and T5=11 doTest and comparison;
303) with T5The Charged Couple value that=11 microseconds are tested corresponding is Q5, t=w=4, w=t-1=3;
304) now, Q3-Q5> reference value K, Charged Couple value difference value the most then illustrates that the time is inadequate, i.e. thisTime T5The least cannot meet, continue to increase driving voltage load time T5Compare, need T3Two enter3rd high position of numerical value processed becomes 0 numerical value 1101 formed(2)As T5Come and T3Do test and comparison;ByIn w non-1, TIn 2=T5+2w-1=15;
305) T5=TIn 2-2w-2=13=1101(2), with T5The Charged Couple value that=13 microseconds are tested corresponding isQ5, t=w=3, w=t-1=2;
306) now, Q3-Q5≤ reference value K, illustrates T now5=13 meet requirement, can contract furtherLittle T now5Value, needs T3Binary numeral the 3rd high-order and the 4th high position all becomes 0 and formedNumerical value 1100(2)As T5Come and T3Do test and comparison, w non-1, TIn 2=T5=13;
307) T5=TIn 2-2w-2=13-1=12, with T5The Charged Couple value that=12 microseconds are tested corresponding is Q5,T=w=2, w=t-1=1;
308) now, Q3-Q5≤ reference value K, illustrates T now5=12 meet requirement, and w is 1, compares surveyExamination terminates, by upper analysis understand 12 microseconds to 15 microseconds test difference arbitrarily the most between the two all≤reference value K,Therefore, use 12 minimum microseconds as the Optimum Excitation voltage-drop loading time, it is determined that TGood=T5=12 microseconds.
Embodiment two
As in figure 2 it is shown, as a example by the capacitance touch screen with 100 sensing points, its touch screen driving voltageThe automatic calculating method of load time, comprises the following steps:,
1) 100 sensing points P are chosen1、P2、……、P100
2) by " method automatically calculating the sensing points driving voltage load time " implemented in respectively to this 100In individual, each sensing points carries out calculating Optimum Excitation voltage-drop loading time TGood 1、TGood 2、……、TGood 100
3) compare the Optimum Excitation voltage-drop loading time of 100 sensing points, select maximum Optimum Excitation voltageLoad time is as the driving voltage load time of capacitance touch screen.

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CN201310391054.0A2013-08-302013-08-30Automatically induction point and the method for capacitance touch screen driving voltage load time are calculatedActiveCN103455228B (en)

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CN102722297A (en)*2011-03-302012-10-10中兴通讯股份有限公司Touch screen equipment and method for realizing proximity induction thereof
CN102902427A (en)*2011-07-262013-01-30比亚迪股份有限公司Touch detection method and touch device

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Publication numberPriority datePublication dateAssigneeTitle
US8481873B2 (en)*2009-09-302013-07-09Freescale Semiconductor, Inc.Capacitive touch sensor device configuration systems and methods
WO2011138530A1 (en)*2010-05-072011-11-10Stmicroelectronics (Rousset) SasMethod and device for characterizing or measuring a floating capacitor
KR101191145B1 (en)*2010-05-132012-10-15주식회사 이노링크Touch film for capacitive type touchscreen, touchscreen comprising and mobile device comprising the same

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN101980123A (en)*2009-08-252011-02-23友达光电股份有限公司 Touch panel device with high touch sensitivity and touch positioning method thereof
CN102722297A (en)*2011-03-302012-10-10中兴通讯股份有限公司Touch screen equipment and method for realizing proximity induction thereof
CN102902427A (en)*2011-07-262013-01-30比亚迪股份有限公司Touch detection method and touch device

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