CN100585426C - A method for calibrating the precision closed case of a relay comprehensive parameter tester - Google Patents
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Abstract
Translated fromChinese
Description
Translated fromChinese技术领域technical field
本发明涉及继电器测试仪，特别是涉及一种继电器综合参数测试仪的精度闭壳校准的方法。The invention relates to a relay tester, in particular to a precision closed-case calibration method for a relay comprehensive parameter tester.
背景技术Background technique
继电器是一种具有隔离功能的自动开关元件，被广泛应用于遥控、遥测、通讯、自动控制、机电一体化及电力电子设备中，是最重要的控制元件之一。为了保证继电器的使用效果，通常需要采用继电器综合参数测试仪对继电器的一些参数进行检测，比如对线圈电阻的测试、接触电阻的测试、吸合/释放电压的测试、吸合/释放时间的测试等等，因此，在继电器综合参数测试仪中就设有对线圈电阻、接触电阻、电压、时间参数、电流、温度等的测试功能。由于受环境及元器件特性的影响，继电器综合参数测试仪经过一段时间的使用后，精度一般会引起一定的偏差，使得对线圈电阻、接触电阻、电压、时间参数、电流、温度等的测试会产生误差，为了保证仪器的精度，通常必须对仪器的精度进行调整，生产线上的继电器综合参数测试仪正常每六个月都必须对其精度进行一次校准。现有技术的继电器综合参数测试仪的精度校准的方式，通常是靠调整元器件的参数来实现的，比如对测试电阻的调整，是在测试接口接入标准的电阻箱，通过比较测试仪显示的电阻值与标准电阻箱的电阻值之间的差异，然后调节仪器中测试电阻电路的电位器，使测试仪显示的电阻值与标准电阻箱的电阻值相一致；再比如，对测试电压的调整，是在测试接口接入精确电压表，通过比较测试仪显示的电压值与精确电压表的电压值读数之间的差异，然后调节仪器中测试电压电路的电位器，使测试仪显示的电压值与精确电压表的电压读数相一致。现有技术的这种精度校准方法存在着如下弊端：一是，校准时必须拆开机箱，调整起来非常不便，造成校准过程的烦琐；二是，校准时要不断地调整对应测试参数电路的电位器，校准速度慢，对校准人员的要求较高；三是，对于测试值与实际值为非线性关系的参数，采用这种方式难以达到各测试点精度的一致。Relay is an automatic switching element with isolation function, which is widely used in remote control, telemetry, communication, automatic control, mechatronics and power electronic equipment, and is one of the most important control elements. In order to ensure the use effect of the relay, it is usually necessary to use a relay comprehensive parameter tester to test some parameters of the relay, such as the test of coil resistance, contact resistance test, pull-in/release voltage test, pull-in/release time test Etc. Therefore, the test function for coil resistance, contact resistance, voltage, time parameter, current, temperature, etc. is set in the relay comprehensive parameter tester. Due to the influence of the environment and the characteristics of components, the accuracy of the relay comprehensive parameter tester will generally cause a certain deviation after a period of use, making the test of coil resistance, contact resistance, voltage, time parameters, current, temperature, etc. In order to ensure the accuracy of the instrument, the accuracy of the instrument must usually be adjusted. The relay comprehensive parameter tester on the production line must be calibrated every six months. The accuracy calibration method of the relay comprehensive parameter tester in the prior art is usually realized by adjusting the parameters of the components. For example, the adjustment of the test resistance is to connect a standard resistance box at the test interface, and the tester shows The difference between the resistance value of the tester and the resistance value of the standard resistance box, and then adjust the potentiometer of the test resistance circuit in the instrument, so that the resistance value displayed by the tester is consistent with the resistance value of the standard resistance box; Adjustment is to connect an accurate voltmeter to the test interface, compare the difference between the voltage value displayed by the tester and the voltage reading of the accurate voltmeter, and then adjust the potentiometer of the test voltage circuit in the instrument to make the voltage displayed by the tester The value agrees with the voltage reading from an accurate voltmeter. This precision calibration method in the prior art has the following disadvantages: first, the chassis must be disassembled during calibration, which is very inconvenient to adjust, resulting in cumbersome calibration process; second, the potential of the corresponding test parameter circuit must be constantly adjusted during calibration The calibration speed is slow, and the requirements for the calibration personnel are high; third, for the parameters with a nonlinear relationship between the test value and the actual value, it is difficult to achieve the consistency of the accuracy of each test point in this way.
发明内容Contents of the invention
本发明的目的在于克服现有技术之不足，提供一种继电器综合参数测试仪的精度闭壳校准的方法，是通过将计算机程序内置在继电器综合参数测试仪的主芯片中运行，可以在不拆开机箱的情况下即可对继电器综合参数测试仪的所有测试参数的精度进行校准，具有免拆机箱，节约工时，使仪器精度的校准更简单，方便，且对校准人员的要求很低，只需按步骤操作即可的特点，同时还可减少因人为因素造成的误判。The purpose of the present invention is to overcome the deficiencies of the prior art, and provide a method for calibrating the accuracy of the relay comprehensive parameter tester, which is to run the computer program in the main chip of the relay comprehensive parameter tester without dismantling it. The accuracy of all test parameters of the relay comprehensive parameter tester can be calibrated when the case is turned on. It does not need to disassemble the case, saves man-hours, makes the calibration of instrument accuracy simpler and more convenient, and has very low requirements for calibration personnel. It only needs to be operated according to the steps, and at the same time, it can reduce misjudgment caused by human factors.
本发明解决其技术问题所采用的技术方案是：一种继电器综合参数测试仪的精度闭壳校准的方法，包括如下步骤：The technical solution adopted by the present invention to solve its technical problems is: a method for the precision closed-case calibration of a relay comprehensive parameter tester, comprising the following steps:
a1.预先选定被测参数的若干个校准点数值，并将所选定的校准点数值存储在继电器综合参数测试仪内的存储器中；所述校准点至少包括0数值点和最大量程值点；a1. Pre-select several calibration point values of the measured parameters, and store the selected calibration point values in the memory in the relay comprehensive parameter tester; the calibration points include at least 0 value points and maximum range value points ;
a2.在继电器综合参数测试仪的参数测试接口中接入标准的所述参数的测试仪表或仪器；a2. In the parameter test interface of the relay comprehensive parameter tester, connect the standard test instruments or instruments of the parameters;
a3.进入校准；a3. Enter calibration;
a4.在继电器综合参数测试仪的校准显示界面中，显示由继电器综合参数测试仪内主芯片根据预先选定的第n个校准点所设定的作为实际值的所述参数的数值；所述n的初始值置为0；a4. In the calibration display interface of the relay comprehensive parameter tester, display the numerical value of the parameter as the actual value set by the main chip in the relay comprehensive parameter tester according to the pre-selected nth calibration point; The initial value of n is set to 0;
a5.调节继电器综合参数测试仪的测试接口的数值，使所述测试接口的数值与上述第n个校准点所设定的作为实际值的所述参数的数值相一致；a5. adjust the numerical value of the test interface of the relay comprehensive parameter tester, make the numerical value of described test interface consistent with the numerical value of the described parameter that above-mentioned nth calibration point is set as actual value;
a6.继电器综合参数测试仪的主芯片采集测试电路中在第n个校准点对所述参数测试过程所产生的测量值；a6. The main chip of the relay comprehensive parameter tester collects the measured value produced by the parameter test process at the nth calibration point in the test circuit;
a7.继电器综合参数测试仪的主芯片将第n个校准点所设定的作为实际值的所述参数的数值记为Yn，将测试仪在第n个校准点所产生的测量值记为Xn，由Xn、Yn通过下列公式可获得第一系数kn和第二系数bn：a7. The main chip of the relay comprehensive parameter tester records the numerical value of the parameter as the actual value set by the nth calibration point as Yn, and records the measured value produced by the tester at the nth calibration point as Xn , the first coefficient kn and the second coefficient bn can be obtained from Xn, Yn through the following formula:
当n＝0时，When n=0,
k0＝Y0/X0k0 =Y0 /X0
b0＝0b0 =0
当n≠0时，When n≠0,
kn＝(Yn-Yn-1)/(Xn-Xn-1)kn=(Yn-Yn-1)/(Xn-Xn-1)
bn＝Yn-kn Xnbn=Yn-kn Xn
继电器综合参数测试仪的主芯片将计算后获得kn、bn和Xn的值存入EEPROM存储器中；The main chip of the relay comprehensive parameter tester stores the values of kn, bn and Xn obtained after calculation into the EEPROM memory;
a8.进入下一个校准点n＝n+1；所述校准点的前后顺序由所述参数的数值由小到大顺次排列；a8. Enter the next calibration point n=n+1; the sequence of the calibration points is arranged sequentially from small to large by the value of the parameters;
a9.继电器综合参数测试仪的主芯片对校准点n值进行比较判断，当n值不大于最大量程值点的排列位的值时，重复步骤a4；当n值大于最大量程值点的排列位的值时，退出校准。a9. The main chip of the relay comprehensive parameter tester compares and judges the n value of the calibration point. When the n value is not greater than the value of the arrangement position of the maximum range value point, repeat step a4; when the n value is greater than the arrangement position of the maximum range value point value, exit the calibration.
本发明的一种继电器综合参数测试仪的精度闭壳校准的方法，适用于对继电器综合参数测试仪中所有测试参数的精度校准，包括对线圈电阻、接触电阻、电压、时间、电流、温度等测试参数的精度校准。The method for precision closed-case calibration of a relay comprehensive parameter tester of the present invention is suitable for precision calibration of all test parameters in the relay comprehensive parameter tester, including coil resistance, contact resistance, voltage, time, current, temperature, etc. Accuracy calibration of test parameters.
本发明的一种继电器综合参数测试仪的精度闭壳校准的方法，经过上述校准后，在继电器综合参数测试仪的EEPROM存储器中就对应存储有对应于各参数的kn、bn和Xn的值，这样，在实测过程中，就可以利用kn、bn和Xn的值来实现精确测量所述参数。The method for the closed-case calibration of the accuracy of a relay comprehensive parameter tester of the present invention, after the above-mentioned calibration, in the EEPROM memory of the relay comprehensive parameter tester, the values of kn, bn and Xn corresponding to each parameter are correspondingly stored, In this way, during the actual measurement process, the values of kn, bn and Xn can be used to realize accurate measurement of the parameters.
在参数校准后的实测过程，包括如下步骤：The actual measurement process after parameter calibration includes the following steps:
c1.将继电器综合参数测试仪的测试接口与继电器相连接，并选择对应的参数测试；c1. Connect the test interface of the relay comprehensive parameter tester to the relay, and select the corresponding parameter test;
c2.进入所述参数的测量；c2. Enter the measurement of said parameter;
c3.继电器综合参数测试仪的主芯片采集测试电路中对所述参数测试过程所产生的测量值X；c3. The main chip of the relay comprehensive parameter tester collects the measured value X produced by the parameter test process in the test circuit;
c4.继电器综合参数测试仪的主芯片从EEPROM存储器中读出Xn的值，其中n为0至最大量程值点的排列位的值；c4. The main chip of the relay comprehensive parameter tester reads the value of Xn from the EEPROM memory, where n is the value of the arrangement bit from 0 to the maximum range value point;
c5.继电器综合参数测试仪的主芯片将测量值X与Xn值相比较，当测量值X不大于Xn值时转至步骤c8，否则进入下一步骤；所述n的初始值置为0；c5. The main chip of the relay comprehensive parameter tester compares the measured value X with the Xn value, and when the measured value X is not greater than the Xn value, go to step c8, otherwise enter the next step; the initial value of said n is set to 0;
c6.将n值累加1；c6. Accumulate the value of n by 1;
c7.继电器综合参数测试仪的主芯片对n值进行判断，当n值不小于最大量程值点的排列位的值时，进入下一步骤，否则重复步骤c5；c7. The main chip of the relay comprehensive parameter tester judges the n value. When the n value is not less than the value of the arrangement position of the maximum range value point, enter the next step, otherwise repeat step c5;
c8.继电器综合参数测试仪的主芯片对n值是否为0进行判断，并显示实测值；c8. The main chip of the relay comprehensive parameter tester judges whether the n value is 0 or not, and displays the measured value;
当n＝0时，实测值：Y＝k0XWhen n=0, measured value: Y=k0 X
当n≠0时，实测值：Y＝knX+bnWhen n≠0, measured value: Y=knX+bn
c9.退出测量。c9. Exit measurement.
本发明的有益效果是，由于采用了计算机软件对校准过程中进行控制，在校准过程中，通过各个校准点获得的设定值(即相当于实际值)、测量值，由主芯片计算出每二个校准点之间的线性变化参数，虽然有些参数的实际值与测量值并非呈线性关系，但是，在小段范围内，仍然可以假定为线性关系，只要校准点选择的足够多就可以了，有了校准点的实际值(即设定值)、测量值，就可以通过主芯片计算出实际值(即设定值)、测量值之间的线性关系值，即公式k0＝Y0/X0；b0＝0；kn＝(Yn-Yn-1)/(Xn-Xn-1)；bn＝Yn-kn Xn；有了各校准点的kn、bn和Xn的值，在实测阶段，只要判定该测量值是处在那两个校准点的测量值之间，就可以利用该两个校准点之间的线性变化参数而得到实际值与测量值之间的关系，并进而得出实际值，这种校准方法，它无须拆开机箱节约工时，无须对电位器进行调节，因此，在仪器中也无须使用电位器，对电器元件的本身精度要求也无须太高，它的另一个好处是对校准人员的要求也很低，只需按步骤操作即可，同时也减轻了校准人员的劳动工作强度，使仪器精度的校准更简单，方便，同时还减少了因人为因素造成的误判。The beneficial effects of the present invention are that, due to the use of computer software to control the calibration process, in the calibration process, the set value (that is, equivalent to the actual value) and the measured value obtained by each calibration point are calculated by the main chip. The linear change parameter between the two calibration points, although the actual value of some parameters is not in a linear relationship with the measured value, but in a small range, it can still be assumed to be a linear relationship, as long as there are enough calibration points selected, With the actual value (that is, the set value) and the measured value of the calibration point, the linear relationship value between the actual value (that is, the set value) and the measured value can be calculated through the main chip, that is, the formula k0 =Y0 / X0 ; b0 =0; kn=(Yn-Yn-1)/(Xn-Xn-1); bn=Yn-kn Xn; with the values of kn, bn and Xn of each calibration point, in the actual measurement stage , as long as it is determined that the measured value is between the measured values of the two calibration points, the relationship between the actual value and the measured value can be obtained by using the linear change parameter between the two calibration points, and then obtained The actual value, this calibration method, it does not need to disassemble the case to save man-hours, and does not need to adjust the potentiometer, therefore, there is no need to use the potentiometer in the instrument, and the accuracy requirements for the electrical components themselves do not need to be too high. Its other The advantage is that the requirements for the calibration personnel are also very low, and it is only necessary to operate according to the steps. At the same time, it also reduces the labor intensity of the calibration personnel, makes the calibration of the instrument accuracy easier and more convenient, and reduces errors caused by human factors. sentenced.
以下结合附图及实施例对本发明作进一步详细说明；但本发明的一种继电器综合参数测试仪的精度闭壳校准的方法不局限于实施例。The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments; however, the precision closed-case calibration method of a relay comprehensive parameter tester of the present invention is not limited to the embodiments.
附图说明Description of drawings
图1是本发明测量值——实际值的关系图；Fig. 1 is the measured value of the present invention-the relationship figure of actual value;
图2是本发明校准的流程图；Fig. 2 is the flowchart of calibration of the present invention;
图3是本发明实测的流程图；Fig. 3 is the flowchart of actual measurement of the present invention;
图4是实施例一本发明用于测试电阻的硬件示意图；Fig. 4 is the hardware schematic diagram that embodiment one present invention is used for testing resistance;
图5是实施例二本发明用于测试电压的硬件示意图。Fig. 5 is a schematic diagram of the hardware used for testing voltage in the second embodiment of the present invention.
具体实施方式Detailed ways
实施例一，参见图1至图4所示，本发明的一种继电器综合参数测试仪的精度闭壳校准的方法，用于对测试电阻的校准，比如线圈电阻测试、接触电阻测试，其硬件包括主芯片1、信号放大处理电路2、显示芯片3、LED显示器4、恒流源5、存储器6，实现本发明的方法时，包括如下步骤：
步骤a1.预先选定电阻参数的若干个校准点数值，并将所选定的校准点数值存储在继电器综合参数测试仪内的存储器6中；所述校准点至少包括0数值点和最大量程值点；当然，根据需要也可以对被测参数分成几个阶段量程来进行校准，此时每个校准阶段的量程的最大量程值点并不是测试该参数时的最大量程，而是对应于所述参数的最大量程范围内分成几个校准量程阶段中的每一个量程阶段的最大量程，然后，分成几个阶段量程来进行校准；Step a1. Preselect several calibration point values of resistance parameters, and store the selected calibration point values in the
步骤a2.在继电器综合参数测试仪的电阻测试接口中接入标准电阻箱7；Step a2. Insert the standard resistance box 7 in the resistance test interface of the relay comprehensive parameter tester;
步骤a3.进入校准，如流程图的框201所示；Step a3. Enter calibration, as shown in
步骤a4.在继电器综合参数测试仪的校准显示界面中，显示由继电器综合参数测试仪内主芯片1根据预先选定的第n个校准点所设定的作为实际值的电阻值；本实施例的校准点设为5个，当然，也可以多于5个或少于5个，这主要根据精度要求来定；所述n的初始值置为0；Step a4. In the calibration display interface of the relay comprehensive parameter tester, display the resistance value as the actual value set by the
步骤a5.调节继电器综合参数测试仪的测试接口所接标准电阻箱7的阻值R，使标准电阻箱的阻值R与上述第n个校准点所设定的作为实际值的电阻值相一致；完成上述动作后，按下校准确认键如流程图的框202所示；Step a5. Adjust the resistance R of the standard resistance box 7 connected to the test interface of the relay comprehensive parameter tester, so that the resistance R of the standard resistance box is consistent with the resistance value set at the nth calibration point above as the actual value ; After completing the above actions, press the calibration confirmation key as shown in
步骤a6.继电器综合参数测试仪的主芯片1采集测试电路中在第n个校准点对上述电阻测试过程所产生的测量值；Step a6. The
步骤a7.继电器综合参数测试仪的主芯片1将第n个校准点所设定的作为实际值的电阻值的数值记为Yn，本实施例共有5个校准点，则对应于5个校准点的实际值分别为Y0、Y1、Y2、Y3、Y4；将测试仪在第n个校准点所产生的测量值记为Xn，同样对应于5个校准点的测量值分别为X0、X1、X2、X3、X4；由Xn、Yn通过下列公式可获得第一系数kn和第二系数bn；此时，主芯片1要对校准点n是否为0进行判断，如流程图的框203所示；Step a7. The
当n＝0时，则第一系数、第二系数分别为：When n=0, the first coefficient and the second coefficient are respectively:
k0＝Y0/X0k0 =Y0 /X0
b0＝0b0 =0
如流程图的框204所示；As shown in
当n≠0时，则第一系数kn和第二系数bn分别为：When n≠0, the first coefficient kn and the second coefficient bn are respectively:
kn＝(Yn-Yn-1)/(Xn-Xn-1)kn=(Yn-Yn-1)/(Xn-Xn-1)
bn＝Yn-kn Xnbn=Yn-kn Xn
如流程图的框205所示；As shown in
比如n＝1的校准点，则For example, the calibration point of n=1, then
k1＝(Y1-Y0)/(X1-X0)k1 =(Y1 -Y0 )/(X1 -X0 )
b1＝Y1-k1 X1b1 =Y1 -k1 X1
依此类推；So on and so forth;
继电器综合参数测试仪的主芯片1将kn、bn和Xn的值存入EEPROM存储器6中，如流程图的框206所示；The
步骤a8.进入下一个校准点n＝n+1，如流程图的框207所示；所述校准点的前后顺序由电阻的数值从小到大顺次排列；所述校准点至少包括0值点和最大量程值点，本实施例的最大量程值点为n＝4；Step a8. Enter the next calibration point n=n+1, as shown in
步骤a9.继电器综合参数测试仪的主芯片1对校准点n值进行比较判断，如流程图的框208所示，当n值不大于最大量程值点的排列位的值时，即n≯4，重复步骤a4；当n值大于最大量程值点的排列位的值时，即n＞4，退出校准，如流程图的框209所示。Step a9. The
这样，通过上述校准，在继电器综合参数测试仪的EEPROM存储器6中就对应存储有对应于电阻测试参数的kn、bn和Xn的值，这样，在实测过程中，就可以利用kn、bn和Xn的值来实现精确测量电阻。Like this, through above-mentioned calibration, in the
在电阻校准后的实测过程，包括如下步骤：The actual measurement process after resistance calibration includes the following steps:
步骤c1.将继电器综合参数测试仪的测试接口与继电器相连接，并选择对应的电阻测试；Step c1. Connect the test interface of the relay comprehensive parameter tester to the relay, and select the corresponding resistance test;
步骤c2.进入电阻的测量，如流程图的框301所示；Step c2. Enter the measurement of resistance, as shown in frame 301 of the flow chart;
步骤c3.继电器综合参数测试仪的主芯片1采集测试电路中对上述电阻测试过程所产生的测量值X；Step c3. The
步骤c4.继电器综合参数测试仪的主芯片1从EEPROM存储器6中读出Xn的值，如流程图的框302所示；其中n为0至最大量程值点的排列位的值；本实施例中，n值分别为0、1、2、3、4；Step c4. The
步骤c5.继电器综合参数测试仪的主芯片1将测量值X与Xn值相比较，如流程图的框303所示；当测量值X不大于Xn值时转至步骤c8，否则进入下一步骤；所述n的初始值置为0；Step c5. The
步骤c6.将n值累加1，如流程图的框304所示；Step c6. Accumulate the value of n by 1, as shown in
步骤c7.继电器综合参数测试仪的主芯片1对n值进行判断，如流程图的框305所示，当n值不小于最大量程值点的排列位的值时，进入下一步骤，否则重复步骤c5；Step c7. The
步骤c8.继电器综合参数测试仪的主芯片1对n值是否为0进行判断，如流程图的框306所示，并显示实测值；Step c8. The
当n＝0时，实测值：Y＝k0XWhen n=0, measured value: Y=k0 X
当n≠0时，实测值：Y＝knX+bnWhen n≠0, measured value: Y=knX+bn
如流程图的框307、框308所示；As shown in
步骤c9.退出测量，如流程图的框309所示。Step c9. Exit measurement, as shown in
实施例二，参见图1至图3、图5所示，本发明的一种继电器综合参数测试仪的精度闭壳校准的方法，用于电压的校准，其硬件包括主芯片1、显示芯片3、LED显示器4、存储器6、DAC芯片81、电压放大及稳压电路82，实现本发明的方法时，与实施例一的不同之处在于，Embodiment 2, referring to Fig. 1 to Fig. 3, shown in Fig. 5, the method for the precision close-case calibration of a kind of relay comprehensive parameter tester of the present invention, is used for the calibration of voltage, and its hardware includes
在步骤a1中是预先选定电压参数的若干个校准点数值；所述校准点至少包括0数值点和最大量程值点；当然，根据需要也可以对被测参数分成几个阶段量程来进行校准，此时每个校准阶段的量程的最大量程值点并不是测试该参数时的最大量程，而是对应于所述参数的最大量程范围内分成几个校准量程阶段中的每一个量程阶段的最大量程，然后，分成几个阶段量程来进行校准；In step a1, several calibration point values of voltage parameters are pre-selected; the calibration points include at least 0 value points and maximum range value points; of course, the measured parameters can also be calibrated by dividing them into several stages of ranges as required , at this time, the maximum range value point of the range of each calibration stage is not the maximum range when testing this parameter, but corresponds to the maximum range of each range stage divided into several calibration range stages within the maximum range of the parameter. The range, then, is calibrated in several phase ranges;
在步骤a2中是在继电器综合参数测试仪的电阻测试接口中接入精确电压表9；In step a2, insert the precise voltmeter 9 in the resistance test interface of the relay comprehensive parameter tester;
在步骤a4中是显示由继电器综合参数测试仪内主芯片1根据预先选定的第n个校准点所设定的作为实际值的电压值；In step a4, the voltage value as the actual value set by the
在步骤a5中是调节测试仪的电压测试接口的电压输出，使精确电压表9读出的电压读数与上述第n个校准点所设定的作为实际值的电压值相一致；比如，上述的第n个校准点的设定电压值为3V，由于仪器的精度差，精确电压表9读出的电压读数并不为3V，可能超过3V，也可能小于3V，此时，就要通过调节仪器使精确电压表9读出的电压读数为3V，这个精确电压表9的读数就是Yn值，而此时测试仪的测量值为调节后的值，它比3V大或小，由此获得Xn。In step a5, be to adjust the voltage output of the voltage test interface of the tester, so that the voltage reading read by the precision voltmeter 9 is consistent with the voltage value set as the actual value set by the above-mentioned nth calibration point; for example, the above-mentioned The set voltage value of the nth calibration point is 3V. Due to the poor accuracy of the instrument, the voltage reading read by the accurate voltmeter 9 is not 3V, may exceed 3V, or may be less than 3V. At this time, it is necessary to adjust the instrument Make the voltage reading read by the precision voltmeter 9 be 3V, the reading of the precision voltmeter 9 is the Yn value, and the measured value of the tester is the adjusted value, which is larger or smaller than 3V, thus obtaining Xn.
本发明的一种继电器综合参数测试仪的精度闭壳校准的方法，适用于对继电器综合参数测试仪中所有测试参数的精度校准，包括对线圈电阻、接触电阻、电压、时间、电流、温度等测试参数的精度校准。The method for precision closed-case calibration of a relay comprehensive parameter tester of the present invention is suitable for precision calibration of all test parameters in the relay comprehensive parameter tester, including coil resistance, contact resistance, voltage, time, current, temperature, etc. Accuracy calibration of test parameters.
上述实施例仅用来进一步说明本发明的一种继电器综合参数测试仪的精度闭壳校准的方法，但本发明并不局限于实施例，凡是依据本发明的技术实质对以上实施例所作的任何简单修改、等同变化与修饰，均落入本发明技术方案的保护范围内。Above-mentioned embodiment is only used for further illustrating the method for the accuracy close-case calibration of a kind of relay comprehensive parameter tester of the present invention, but the present invention is not limited to embodiment, any technical essence of the present invention is done to any above embodiment Simple modifications, equivalent changes and modifications all fall within the protection scope of the technical solutions of the present invention.
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