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• Title Page
• Chapter 1 Introduction
• Chapter 2 Specimen Interactions
• Chapter 3 Nature of X-rays
• Chapter 4 Electron Optics
• Chapter 5 Wavelength Dispersive Spectrometry
• Chapter 6 Energy Dispersive Spectrometry
• Chapter 7 Statistics
• Chapter 8 Mapping and Imaging
• Chapter 9 Matrix Corrections

• 1 Introduction to the EPMA/SEM laboratory: An introduction to the technique followed by a short tour of the facilities and including discussion of lecture notes, suggested reading materials, grading methods, exams and current research projects followed by a short history of the instrument and related techniques.
• 2 Electron beam instrumentation and electron solid interactions: A brief description of the major system components for both the electron microprobe and scanning electron microscope followed by an introduction to elastic and inelastic scattering of electrons and associated principles. (chapters 1 and 2)
• 3 X-ray productions: The generation and emission of characteristic and continuum x-rays and their absorption and fluorescence interactions within the sample. (chapter 3)
• 4 Electron Beam Columns: Formation, alignment, and choices for parameterization with regards to application and specimen interaction. (chapter 4)
• 5 Lab: Demonstration of electron beam parameters and sample interactions.
• 6 WDS (wavelength dispersive spectrometery): A description of the Bragg spectrometer and associated principles. (chapter 5)
• 7 Lab: Demonstration of wavelength dispersive spectrometry technique and analysis.
• 8 EDS (energy dispersive spectrometery): Spectral analysis using the EDS detector. (chapter 6)
• 9 Lab: Demonstration of energy dispersive spectrometry technique and analysis.
• 10 Statistics: The essential key to scientific analysis. (chapter 7)
• 11 Lab: Examples of the application of statistical calculations to quantitative analysis.
• 12 Quantitative matrix corrections: What goes on in the computer? An introduction to the corrections being applied to the intensity data in order to obtain elemental concentrations. Take home mid-term exam given out at the end of the lecture and due next class meeting. (chapter 9). See also this PPT onstandard accuracy by John Fournelle.
• 13 Digital Imaging (Lecture and Lab): Imaging and mapping: An overview of electron and x-ray imaging and mapping techniques and the principles involved along with a demonstration of the analog and digital mapping capabilities on the electron microprobe. Mid-term exams are due at the beginning of class. (chapter 8)
• 14 Discussion of Mid-Term: Graded mid-terms will be returned and there will be a detailed discussion of questions from the mid-term exam.
• Lectures 15, 16, 17, 18, 19, 20 (last 3 weeks of class): Reserved as instrument time for individual projects.