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Strategies for Nonvolatile Memory Reliability
This class covers how EEPROM and NOR Flash memory operate, wear out, and fail, as well as several strategies for maximizing performance and reliability of memory devices in applications. (Sept 2021)
About this course
This class will explain how EEPROM and NOR Flash memory operate, wear out, and fail, several effective strategies for reducing wear, as well as detecting and responding to failures. Techniques explained include write reduction, write caching, wear leveling, error detection, and error correction. Familiarity with these techniques will enable you to maximize the performance and reliability of your applications.
Curriculum25 min
- Syllabus
- Introduction1 min
- EEPROM Memory Cells3 min
- Flash Memory Cells1 min
- Memory Cell Wear and Failure2 min
- Write Reduction2 min
- Write Caching3 min
- Wear Leveling5 min
- Error Mitigation7 min
- Summary1 min
- Your Feedback
- We need your Feedback!
This class will explain how EEPROM and NOR Flash memory operate, wear out, and fail, several effective strategies for reducing wear, as well as detecting and responding to failures. Techniques explained include write reduction, write caching, wear leveling, error detection, and error correction. Familiarity with these techniques will enable you to maximize the performance and reliability of your applications.
- Syllabus
- Introduction1 min
- EEPROM Memory Cells3 min
- Flash Memory Cells1 min
- Memory Cell Wear and Failure2 min
- Write Reduction2 min
- Write Caching3 min
- Wear Leveling5 min
- Error Mitigation7 min
- Summary1 min
- Your Feedback
- We need your Feedback!