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Abstract
In a previous paper, it was proposed to see the deformations of a common pattern as the action of an infinite dimensional group. We show in this paper that this approac h can be applied numerically for pattern matching in image analysis of digital images. Using Lie group ideas, we construct a distance between deformations defined through a metric given the cost of infinitesimal deformations. Then we propose a numerical scheme to solve a variational problem involving this distance and leading to a sub-optimal gradient pattern matching. Its links with fluid models are established.
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LAGA, Institut Galilée, Université, Paris13, Av J-B Clément, 93430, Villetaneuse, France. E-mail
Alain Trouvé
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Trouvé, A. Diffeomorphisms Groups and Pattern Matching in Image Analysis.International Journal of Computer Vision28, 213–221 (1998). https://doi.org/10.1023/A:1008001603737
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