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Deep Learning for Mental Illness Detection Using Brain SPECT Imaging

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Abstract

We apply deep learning to the detection of mental illness with meaningful results, using SPECT (Single Photon Emission Computed Tomography) images of the brain. The data consists in scans from patients with attention deficit hyperactivity disorder (ADHD), major depressive disorder (MDD) and obsessive compulsive disorder (OCD), plus scans of healthy brains. We focus here on the application of a deep convolutional neural network (CNN). The main challenge in using CNN models for medical diagnosis is often the number of samples not being sufficiently large to ensure high accuracy. We propose a soft classifier for using the machine. Instead of a binary output “yes/no” for each condition, we add an intermediate outcome, which says that the machine yields a weak result. The “Red Zone” corresponds to a positive result (condition is present) and the “Green Zone” corresponds to a negative, each with a preassigned statistical confidence level; the “Amber Zone” is an ambiguous outcome, where the scan is assigned a likelihood of having the condition. This information is then passed to the doctors for further analysis of patients.

Daniel Amen and Thomas Ward are co-last authors.

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Notes

  1. 1.

    Watson is a system developed by International Business Machines Corporation.

References

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Acknowledgement

This work was partially supported by the CUNY Institute for Computer Simulation, Stochastic Modeling and Optimization.

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Authors and Affiliations

  1. Department of Computer Science, Hunter College CUNY, New York City, USA

    Felisa J. Vázquez-Abad & Silvano Bernabel

  2. School of Computing and Information Systems, University of Melbourne, Melbourne, Australia

    Felisa J. Vázquez-Abad & Silvano Bernabel

  3. Department of Mathematics and Statistics, Concordia University, Montreal, Canada

    Daniel Dufresne

  4. Amen Clinics, New York, NY, USA

    Rishi Sood & Thomas Ward

  5. Amen Clinics, Costa Mesa, CA, USA

    Daniel Amen

Authors
  1. Felisa J. Vázquez-Abad

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  2. Silvano Bernabel

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  3. Daniel Dufresne

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  4. Rishi Sood

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  5. Thomas Ward

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  6. Daniel Amen

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Corresponding author

Correspondence toDaniel Dufresne.

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Editors and Affiliations

  1. Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, China

    Ruidan Su

  2. Cardiff University, Cardiff, UK

    Han Liu

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© 2020 Springer Nature Singapore Pte Ltd.

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Vázquez-Abad, F.J., Bernabel, S., Dufresne, D., Sood, R., Ward, T., Amen, D. (2020). Deep Learning for Mental Illness Detection Using Brain SPECT Imaging. In: Su, R., Liu, H. (eds) Medical Imaging and Computer-Aided Diagnosis. MICAD 2020. Lecture Notes in Electrical Engineering, vol 633. Springer, Singapore. https://doi.org/10.1007/978-981-15-5199-4_3

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eBook
JPY 22879
Price includes VAT (Japan)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
JPY 28599
Price includes VAT (Japan)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
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Hardcover Book
JPY 28599
Price includes VAT (Japan)
  • Durable hardcover edition
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Purchases are for personal use only


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