- Kilian Hett ORCID:orcid.org/0000-0001-8831-424716,
- Rémi Giraud17,
- Hans Johnson18,
- Jane S. Paulsen19,
- Jeffrey D. Long20,21 &
- …
- Ipek Oguz16
Part of the book series:Lecture Notes in Computer Science ((LNIP,volume 12267))
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Abstract
Deep learning techniques have demonstrated state-of-the-art performances in many medical imaging applications. These methods can efficiently learn specific patterns. An alternative approach to deep learning is patch-based grading methods, which aim to detect local similarities and differences between groups of subjects. This latter approach usually requires less training data compared to deep learning techniques. In this work, we propose two major contributions: first, we combine patch-based and deep learning methods. Second, we propose to extend the patch-based grading method to a new patch-based abnormality metric. Our method enables us to detect localized structural abnormalities in a test image by comparison to a template library consisting of images from a variety of healthy controls. We evaluate our method by comparing classification performance using different sets of features and models. Our experiments show that our novel patch-based abnormality metric increases deep learning performance from 91.3% to 95.8% of accuracy compared to standard deep learning approaches based on the MRI intensity.
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Acknowledgements
This work was supported, in part, by the NIH grants R01–NS094456 and U01–NS106845. The PREDICT-HD study was funded by the NCATS, the NIH (NIH; R01–NS040068, U01–NS105509, U01–NS103475), and CHDI.org. Vanderbilt University Institutional Review Board has approved this study.
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Authors and Affiliations
Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA
Kilian Hett & Ipek Oguz
Bordeaux INP, University of Bordeaux, CNRS, IMS, UMR 5218, Talence, France
Rémi Giraud
Department of Electrical and Computer Engineering, University of Iowa, Iowa City, IA, USA
Hans Johnson
Department of Neurology, University of Wisconsin, Madison, WI, USA
Jane S. Paulsen
Department of Psychiatry, University of Iowa, Iowa City, IA, USA
Jeffrey D. Long
Department of Biostatistics, University of Iowa, Iowa City, IA, USA
Jeffrey D. Long
- Kilian Hett
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Corresponding author
Correspondence toKilian Hett.
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Editors and Affiliations
University of Toronto, Toronto, ON, Canada
Anne L. Martel
The University of British Columbia, Vancouver, BC, Canada
Purang Abolmaesumi
University College London, London, UK
Danail Stoyanov
École Centrale de Nantes, Nantes, France
Diana Mateus
EURECOM, Biot, France
Maria A. Zuluaga
Chinese Academy of Sciences, Beijing, China
S. Kevin Zhou
Sorbonne University, Paris, France
Daniel Racoceanu
The Hebrew University of Jerusalem, Jerusalem, Israel
Leo Joskowicz
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Hett, K., Giraud, R., Johnson, H., Paulsen, J.S., Long, J.D., Oguz, I. (2020). Patch-Based Abnormality Maps for Improved Deep Learning-Based Classification of Huntington’s Disease. In: Martel, A.L.,et al. Medical Image Computing and Computer Assisted Intervention – MICCAI 2020. MICCAI 2020. Lecture Notes in Computer Science(), vol 12267. Springer, Cham. https://doi.org/10.1007/978-3-030-59728-3_62
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