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Abstract
The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric versions. This approach allows to skip the signature prediction phase inherent to conventional transparent memory testing and therefore to significantly reduce test time. The hardware overhead and fault coverage of the new BIST scheme are comparable to the conventional transparent BIST structures. Experimental results show that in many cases the proposed test techniques achieve a higher fault coverage in shorter test time.
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Authors and Affiliations
Computer Systems Department, Belarussian State University of Informatics and Radioelectronics, P.Brovki 6, Minsk, 220027, Belarus
V. N. Yarmolik & I. V. Bykov
Department of Computer Science, Bialystok University of Technology, Poland
V. N. Yarmolik
Division of Computer Architecture, University of Stuttgart, Breitwiesenstr. 20/22, 70656, Stuttgart, Germany
S. Hellebrand & H.-J. Wunderlich
- V. N. Yarmolik
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- I. V. Bykov
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- S. Hellebrand
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- H.-J. Wunderlich
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Editors and Affiliations
Department of Computer Science and Engineering, Czech Technical University in Prague, Karlovo nam 13, CZ-12135, Prague 2, Czech Republic
Jan Hlavička
Institut für Technische Informatik, Medizinische Universität zu Lübeck, Ratzeburger Allee 160, 23538, Lübeck, Germany
Erik Maehle
Department of Measurement and Information Systems, Technical University of Budapest, Pázmány P. sétány 1/d, H-1521, Budapest, Hungary
András Pataricza
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© 1999 Springer-Verlag Berlin Heidelberg
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Yarmolik, V.N., Bykov, I.V., Hellebrand, S., Wunderlich, HJ. (1999). Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms. In: Hlavička, J., Maehle, E., Pataricza, A. (eds) Dependable Computing — EDCC-3. EDCC 1999. Lecture Notes in Computer Science, vol 1667. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-48254-7_23
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