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Schloss Dagstuhl - Leibniz Center for Informatics
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Joint Declaration:The freedom of science is at the heart of liberal, democratic societies. Without this freedom, it is impossible for scientific efforts to be geared toward gaining knowledge and facts. It is therefore extremely worrying that the scientific freedom is coming under increasing pressure in various regions of the world.(read more)
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ITC 1991: Nashville, TN, USA

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    Session 1:Plenary

    Keynote Address

    Session 2:Practical BIST Implementation Case Studies

    Session 3:Sequential ATPG

    Session 4:Boundary Scan:Test and Diagnostics of the Infrastructure

    Session 5:Case Studies in VLSI Chip Testing

    Session 6:DFT:New Algorithms for Automation Tools

    Session 7:Test Generation and Compaction

    Session 8:Using Test Results for Process Improvement

    Session 9:Contactless Probing

    Session 10:DFT:Advanced Design and Analysis Techniques

    Session 11:Physical Defects and Analysis 1

    Session 12:Computer Assisted Diagnosis and Repair

    Session 13:Specialized Quality Topics

    Session 14:Scan Design:Innovations and Enhancements

    Session 15:Delay Faults and Bridging Faults

    Session 16:ATE Architecture and Methods

    Session 17:Statistics and Test - Working Together

    Session 18:BIST Issues in Logic Synthesis

    Session 19:Physical Defects and Analysis 2

    Session 20:Diagnosis and Repair of Complex Custom Circuits

    Session 21:Test Techniques as Applied to Memory Devices

    Session 22:Mixed Signal Test Generation Based on Fault Modeling

    Session 23:CAE for IDDq Testing

    Session 24:Board Test:The Future Is Arriving

    Session 25:Algorithms and Fault Modeling for Testing Memory Devices

    Session 26:Test Pattern Generation Issues in BIST

    Session 27:Hierarchical Test Generation

    Session 28:System Testing

    Session 29:ATE Implementation and Application

    Session 30:Response Compaction Issues in BIST

    Session 31:Testing a Higher Level of Integration

    Session 32:Boundary Scan - Dealing with Chip Implementation

    Session 33:Synthesis for Test

    Session 34:Concurrent BIST Design and Verification

    Session 35:Fast Fault Simulation and Multiple Faults

    Session 36:AC Test Calibration and Accuracy

    Session 37:Software Techniques Improve Use of Test Resources 1

    Session 38:DFT Applications and Experience

    Session 39:Innovations in Mixed Signal Test Equipment

    Session 40:A Potpourri of Test

    Session 41:Software Techniques Improve Use of Test Resources 2

    Panel 1:Open Meeting:Languages to Support Boundary-Scan Test

    Panel 2:Software Testing - State of the Practice

    Panel 4:Acceptance Barriers Confronting DFT and BIST

    Panel 5:Is Burn-In Burned Out?

    Panel 6:Quality in Test Education?

    International Test Conference 1990 Best Paper

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    dblp was originally created in 1993 at:

    University of Trier  

    since 2018, dblp has been operated and maintained by:

    Schloss Dagstuhl - Leibniz Center for Informatics  

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