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Schloss Dagstuhl - Leibniz Center for Informatics
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43rd DAC 2006: San Francisco, CA, USA

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    Session 1:Panel

    Session 2:special session:why doesn't my system work?

    Session 3:hierarchical synthesis for mixed-signal designs

    Session 4:processor and communication centric SOC design

    Session 5:practical applications of DFM

    DAC technologist panel

    Session 7:special session:bridging the system to RTL verification gap

    Session 8:leakage, power analysis and optimization

    Session 9:MPSOC design methodologies and applications

    Session 10:statistical timing analysis

    Panel

    Session 12:Special Session:reliability challenges for 65NM and beyond

    Session 13:power grid analysis and design

    Session 14:advances in formal solvers

    Session 15:gate modeling and model order reduction

    Session 16:special session:MPSOC design tools

    Session 17:special session - highlights of ISSCC:multimedia

    Session 18:buffer insertion

    Session 19:testing and validation for timing defects

    Session 20:advanced topics in processor and system verification

    Session 21:software for real-time applications

    Session 22:panel

    Session 23:invited session

    Session 24:routing

    Session 25:the test bin

    Session 26:panel

    Session 27:low power and ultra-low voltage design

    Session 28:high-level exploration and optimization

    Session 29:panel design challenges for next-generation multimedia, game and entertainment platforms

    Session 30:CAD for FPGAS

    Session 31:secure systems

    Session 32:logic synthesis I

    Session 33:low-power, thermal-aware architectures

    Session 34:low power system level design

    Session 35:power-constrained design for multimedia

    Session 36:electrical and thermal issues in FPGAS

    Session 37:special session:beyond low-power design:environmental energy harvesting

    Session 38:communication-driven synthesis

    Session 39:parallelism and memory optimizations

    Session 40:panel

    Session 41:nanotubes and nanowires

    Session 42:simulation assisted formal verification

    Session 43:yield analysis and improvement

    Session 44:approaches to soft error mitigation

    Session 45:design/technology interaction

    Session 46:panel

    Session 47:special session:more Moore's law and more than Moore's law

    Session 48:formal specification and verification testbench generation

    Session 49:analysis and optimization issues in NoC design

    Session 50:special session:key technologies for beyond the die

    Session 51:analog design and design assistance

    Session 52:high-performance simulation of transaction level and dataflow models

    Session 53:nano- and bio-chip design

    Session 54:logic and sequential synthesis

    Session 55:low power circuit design

    Session 56:beyond-the-die circuit and system integration

    Session 57:new ideas in analog/RF modeling and simulation

    Session 58:advanced methods for interconnect extraction, clocks and reliability

    Session 59:panel

    Session 60:bounded model checking and equivalence verification

    Session 61:test response compaction and ATPG

    Session 62:placement

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