Description of Change

This pull request introduces significant improvements to peripheral resource management and validation testing in the ESP32 codebase. The main focus is on ensuring that both automatic and manual deinitialization (deinit) of peripherals is robustly tested and that resource cleanup, especially for DMA buffers and ADC drivers, is handled correctly. The changes also enhance test coverage for manual deinit paths and update test infrastructure to reflect these improvements.

Peripheral Resource Management Improvements:

• Added cache line alignment for DMA buffers and conversion frame sizes on ESP32-P4 targets to ensure compatibility with DMA and cache requirements, usingheap_caps_aligned_alloc for buffer allocation.[1][2]
• Improved cleanup logic in ADC continuous mode: added guards against double cleanup, ensured calibration handles are properly released, and clarified responsibilities between the ADC driver and the peripheral manager.[1][2]
• Ensured all dynamically allocated DMA buffers are freed after use or on error, preventing memory leaks in ADC continuous read routines.[1][2]
• UpdatedanalogContinuousDeinit to always clear used pins through the peripheral manager and to free the result buffer, improving robustness of deinitialization.

Validation Test Enhancements:

• Extended validation tests (periman.ino) to include explicit manual deinit tests for SigmaDelta, LEDC, RMT, I2S, I2C, SPI, and ADC Continuous peripherals. Each test now verifies that Serial1 can be restored after manual deinit, ensuring that the peripheral manager and driver cleanup are reliable.[1][2][3][4][5][6][7]
• Refactored test setup and teardown to better distinguish between auto-detach (viapinMode) and manual deinit test paths.[1][2]

Test Infrastructure Updates:

• Updated the Python validation script (test_periman.py) to dynamically track which peripherals have manual deinit tests, parse and match test output accordingly, and provide clearer logging and error messages. This ensures all expected tests are executed and validated.[1][2]
• Minor cleanup in test configuration files (ci.yml) for platform and target definitions.[1][2]

Miscellaneous:

• Added a Wokwi diagram for the ESP32-H2 SD card test setup.

These changes collectively improve the reliability and maintainability of peripheral resource management, and provide stronger guarantees through comprehensive automated testing.

References:
[1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21]

Test Scenarios

Tested locally